摘要:
Embodiments disclosed herein include methods and apparatuses for pre-charging bitlines in a static random access memory (SRAM) prior to data access for reducing leakage power. The memory access logic circuit receives a memory access request comprising a data entry address to be accessed in a first data access path of a SRAM data array of the SRAM. The SRAM also includes a pre-charge circuit provided in a second data access path outside the first data access path. The pre-charge circuit is configured to enable pre-charging of the SRAM data array as part of the memory access request to avoid pre-charging bitlines in the SRAM data array during idle periods to reduce leakage power. The pre-charge circuit can enable pre-charging of the SRAM data array prior to data access such that the pre-charge circuit does not add latency to the first data access path.
摘要:
Embodiments disclosed include redirecting data from a defective data entry in memory to a redundant data entry prior to data access. Related systems and methods are also disclosed. The memory is configured to receive a memory access request. The received memory access request comprises a data entry address. The memory uses the data entry address to access data stored in a data array in the memory in a first data access path. It is possible that the rows or columns in the memory may be defective as a result of a manufacturing process. In the event that a row or column at the data entry address in the data array is defective, a data entry redirection circuit redirects the memory access request to a redundant row or column in the data array prior to data access.
摘要:
A number of logic state catching circuits (200) are described which use a logic circuit (204) with a first input (210), a second input, (232) and an output. The logic circuit (204) is configured to respond to a change in state of a data value coupled to the first input (210) causing a representative value of the data „ value to be generated on the output(212). The second input (232) receives a latched version of the data value to hold the representative value on the output after the data value has returned to its original state. A latching element (206) is configured to respond to the change in state of the data value by latching the data value and to couple the latched version of the data value to the second input (232). A reset element (208) is configured to respond to a change in state of a clock input (230)by resetting the latching element. (206)
摘要:
Systems and methods for generating pulse clocks with programmable edges and pulse widths configured for varying requirements of different memory access operations. A pulse clock generation circuit (100) includes a selective delay logic (102) to provide a programmable rising edge delay of the pulse clock (114), a selective pulse width widening logic (110) to provide a programmable pulse width of the pulse clock, and a built-in level shifter for shifting a voltage level of the pulse clock. A rising edge delay for a read operation is programmed to correspond to an expected read array access delay, and the pulse width for a write operation is programmed to be wider than the pulse width for a read operation.