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公开(公告)号：EP2715766B1
公开(公告)日：2016-10-26
申请号：EP12726603.9
申请日：2012-05-25
发明人： VAN DYCK, Dirk , CHEN, Fu-Rong
CPC分类号： H01J37/265 , G01N23/046 , G01N23/225 , G01N2223/064 , G01N2223/414 , G01N2223/419 , G01N2223/61 , G01N2223/611 , H01J37/222 , H01J37/26 , H01J2237/226 , H01J2237/2614
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公开(公告)号：EP2715766A2
公开(公告)日：2014-04-09
申请号：EP12726603.9
申请日：2012-05-25
发明人： VAN DYCK, Dirk , CHEN, Fu-Rong
CPC分类号： H01J37/265 , G01N23/046 , G01N23/225 , G01N2223/064 , G01N2223/414 , G01N2223/419 , G01N2223/61 , G01N2223/611 , H01J37/222 , H01J37/26 , H01J2237/226 , H01J2237/2614
摘要： The present invention pertains to methods and systems for material characterization. A method (100) is disclosed for determining information regarding an object comprising particles. The method (100) comprises obtaining (110) a wave function representative of the object detected at a detection surface of a detection system for detecting the wave function, deriving (120) at least two spatial frequencies of the detected wave function and deriving (130) for each of said at least two spatial frequencies at least a phase based on the obtained wave function. Furthermore, a functional relationship between the spatial frequency and the phase is analyzed (140) for the spatial frequencies. At least one parameter indicative of a property of the object is derived therefrom. A corresponding system (200) is also disclosed as well as corresponding computer-related products.
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公开(公告)号：EP4423543A1
公开(公告)日：2024-09-04
申请号：EP22805878.0
申请日：2022-10-24
CPC分类号： G02B3/10 , A61F2/16 , G02C7/042 , G02C2202/2020130101 , A61F2002/16920150401 , A61F2/1618 , A61F2/1654
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公开(公告)号：EP4174535A1
公开(公告)日：2023-05-03
申请号：EP21204739.3
申请日：2021-10-26
摘要： The application pertains to an intraocular lens (100) for contributing to the focusing of incident light onto a retina (70) of a user, the intraocular lens (100) comprising: a first surface (110), and a second surface (120), wherein said first surface (110) is an aspheric surface configured to refractively focus said incident light, said first surface (110) exhibiting a non-uniform refractive power; wherein said second surface (120) is provided with a diffraction generating profile in the form of zero order Bessel function configured to spatially separate said incident light into at least a first portion having a first spatial frequency characteristic and a second portion having a second spatial frequency characteristic; and wherein said spatial separation and said non-uniform refractive power of said first surface (110) cause said first portion to be refracted by said first surface (110) at a first level of refractive power and said second portion to be refracted by said first surface (110) at a second level of refractive power, said first level of refractive power and said second level of refractive power being different.
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公开(公告)号：EP2956761A1
公开(公告)日：2015-12-23
申请号：EP14711164.5
申请日：2014-02-14
发明人： VAN DYCK, Dirk , LUCKEN, Uwe , STARK, Holger , BALS, Sara
CPC分类号： H01J37/265 , G01N23/04 , G01N2223/0565 , G01N2223/612 , H01J37/06 , H01J37/244 , H01J37/26 , H01J2237/063 , H01J2237/1534 , H01J2237/2602 , H01J2237/2614
摘要： A method for performing high resolution electron microscopy of a soft matter object is described. The method comprises irradiating a soft matter object using an electron microscope having a spherical aberration correction with a substantially constant transfer function in a frequency band of thermal diffuse scattered electrons scattered at the soft matter object. The method comprises detecting the thermal diffuse scattered (TDS) electrons scattered at the soft matter, and using the detected thermal diffuse scattered electrons for deriving therefrom an image of the soft matter object.
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