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    DISTRIBUTED SENSOR NETWORK FOR NONDESTRUCTIVELY MONITORING AND INSPECTING INSULATED ELECTRICAL MACHINE COMPONENTS
    6.
    发明公开
    DISTRIBUTED SENSOR NETWORK FOR NONDESTRUCTIVELY MONITORING AND INSPECTING INSULATED ELECTRICAL MACHINE COMPONENTS 审中-公开
    分布式传感器网络无损监测和检查绝缘电机部件

    公开(公告)号：EP3260849A1

    公开(公告)日：2017-12-27

    申请号：EP17176924.3

    申请日：2017-06-20

    申请人： General Electric Company

    发明人： DEHGHAN NIRI, Ehsan ,  BREZNAK, Jeffrey Michael ,  MURPHY, Gene

    IPC分类号： G01N23/04 ,  H01B13/34

    CPC分类号： G01N23/00 ,  G01B15/00 ,  G01N23/04 ,  G01N2223/40 ,  G01N2223/611 ,  G01N2223/632 ,  G01N2223/646 ,  G01R31/1218 ,  G01R31/1272

    摘要： An insulated electrical component (10) of an insulated electrical machine includes a conducting element (12), a first radiographically-visible conductor sensor node (16) coupled to the conducting element (12), at least one second radiographically-visible conductor sensor node (16) coupled to the conducting element (12) a first distance in a predetermined direction from the first radiographically-visible conductor sensor node (16), and an insulating material (14) bonded to the conducting element (12). In some embodiments, the insulated electrical component (10) further includes a first radiographically-visible insulator sensor node (40) coupled to the insulating material (14) and not coupled to the conducting element (12) and at least one second radiographically-visible insulator sensor node (40) coupled to the insulating material (14) and not coupled to the conducting element (12) a second distance from the first radiographically-visible insulator sensor node (40). The radiographically-visible sensor nodes (16, 40) are distinguishable from the conducting element (12) and the insulating material (14) in a radiographic image. Methods of manufacturing and non-destructive testing of insulated electrical components (10) are also disclosed.

    摘要翻译： 绝缘电机的绝缘电气部件（10）包括导电元件（12），耦合到导电元件（12）的第一射线照相可见导体传感器节点（16），至少一个第二射线照相可见导体传感器节点 （16），其从所述第一射线照相可见导体传感器节点（16）沿预定方向与所述传导元件（12）连接第一距离，以及与所述传导元件（12）连接的绝缘材料（14）。 在一些实施例中，绝缘电气部件（10）还包括耦合到绝缘材料（14）并且不耦合到传导元件（12）的第一射线照相可见绝缘体传感器节点（40）以及至少一个第二射线照相可见 绝缘体传感器节点（40），所述绝缘体传感器节点（40）耦合到所述绝缘材料（14）并且不与所述传导元件（12）相距所述第一射线照相可见绝缘体传感器节点（40）的第二距离。 射线照相可见传感器节点（16,40）在射线照相图像中与传导元件（12）和绝缘材料（14）是可区分的。 还公开了绝缘电气元件（10）的制造和非破坏性测试的方法。

    RADIATION IMAGE ACQUISITION DEVICE
    7.
    发明公开
    RADIATION IMAGE ACQUISITION DEVICE 审中-公开
    STRAHLUNGSBILDERFASSUNGSVORRICHTUNG

    公开(公告)号：EP2669665A1

    公开(公告)日：2013-12-04

    申请号：EP11857086.0

    申请日：2011-10-21

    申请人： Hamamatsu Photonics K.K.

    发明人： SUGIYAMA Mototsugu ,  SUYAMA Toshiyasu

    IPC分类号： G01N23/04 ,  G01T1/20

    CPC分类号： G01T1/2002 ,  G01N23/04 ,  G01N2223/611 ,  G01T1/20

    摘要： A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member of a flat plate shape which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member in a direction of a normal to the entrance surface; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member in a direction of a normal to the opposite surface.

    摘要翻译： 辐射图像采集装置包括：发射辐射的辐射源; 平板形状的波长转换构件，其根据从所述辐射源发射并被物体透射的辐射的入射产生闪烁光; 第一成像装置，其将从波长转换构件中的辐射的入射面发射的闪烁光沿着与入射面的法线方向成像; 以及第二成像装置，其将与波长转换构件中与入射面相反的表面发射的闪烁光沿着相反表面的法线方向缩小并成像。

    Method for inspecting a sample
    8.
    发明公开
    Method for inspecting a sample 审中-公开
    Verfahren zur Untersuchung einer Probe

    公开(公告)号：EP2278306A1

    公开(公告)日：2011-01-26

    申请号：EP09165269.3

    申请日：2009-07-13

    申请人： FEI COMPANY

    发明人： Freitag, Bert ,  Rosenthal, Georg ,  Phifer, Daniel

    IPC分类号： G01N23/225 ,  H01J37/20

    CPC分类号： G01N23/2251 ,  G01N2223/611 ,  H01J37/20 ,  H01J37/26 ,  H01J2237/2003 ,  H01J2237/2008

    摘要： The invention describes a method for inspecting samples in an electron microscope. A sample carrier 500 shows electrodes504, 507 connecting pads 505, 508 with areas A on which the sample is to be placed.
    After placing the sample on the sample carrier, a conductive pattern is deposited on the sample, so that voltages and currents can be applied to localized parts of the sample. Applying the pattern on the sample may be done with, for example, Beam Induced Deposition or ink-jet printing.
    The invention also teaches building electronic components, such as resistors, capacitors, inductors and active elements such as FET's in the sample.

    摘要翻译： 本发明描述了一种在电子显微镜中检查样品的方法。 样品载体500显示电极504,407连接焊盘505,508与其上要放置样品的区域A. 将样品放在样品载体上后，导电图案沉积在样品上，从而可以将电压和电流施加到样品的局部部分。 将样品应用于样品可以用例如光束沉积或喷墨打印进行。 本发明还教导在样品中构建诸如电阻器，电容器，电感器和诸如FET的有源元件的电子部件。