REREGISTRATION SYSTEM FOR A CHARGED PARTICLE BEAM EXPOSURE SYSTEM.
    1.
    发明公开
    REREGISTRATION SYSTEM FOR A CHARGED PARTICLE BEAM EXPOSURE SYSTEM. 失效
    重新调整SYSTEM FOR曝光装置使用带电粒子。

    公开(公告)号:EP0073235A4

    公开(公告)日:1983-07-04

    申请号:EP82901055

    申请日:1982-02-12

    CPC classification number: G03F9/00 H01J37/3045

    Abstract: Reregistration system for determining and positioning the location of a wafer substrate target surface (275) with respect to a plurality of charged particle beams used to directly write an integrated circuit pattern simultaneously at a plurality of locations on the substrate. Reregistration is accomplished by scanning two or more of the charged particle beams (100, 150) over a corresponding number of reregistration fiducial marks (200, 250) on the substrate (275). The reregistration marks (200, 250) may consist of a material having a high atomic number or predefined topographical features. Electrons scattered from these marks (200, 250) are detected and converted to electrical signals. The temporal relationship between the scanning beams (100, 150) and the resultant electrical signals may then be used to determine substrate location.

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