摘要:
A random code generator includes an address Y decoder, an address X decoder, a PUF entropy pool, a processing circuit and an entropy key storage circuit. The address Y decoder includes plural Y control lines. The address Y decoder selectively activates the plural Y control lines according to a first address Y signal. The address X decoder includes plural X control lines. The address X decoder selectively activates the plural X control lines according to a first address X signal. The PUF entropy pool generates an output data according to the activated Y control lines and the activated X control lines. When the random code generator is in a normal working state, the processing circuit processes the output data into a random code according to at least one entropy key from the entropy key storage circuit.
摘要:
An OTP memory cell including an antifuse unit (232) and a select transistor (234) is provided. The antifuse unit includes an antifuse layer (210) and an antifuse gate (212) disposed on a substrate in sequence, a modified extension doped region (214) disposed in the substrate below the antifuse layer, and a first doped region (216) and a second doped region (218) disposed in the substrate at two opposite sides of the antifuse gate. The doped regions, the antifuse layer and the antifuse gate form a varactor. The select transistor includes a select gate (220), a gate dielectric layer (222), the second doped region, and a third doped region (224). The thickness (D1) of the gate dielectric layer close to the second doped region is greater than the thickness (D2) of the gate dielectric layer close to the third doped region.
摘要:
An one time programming memory cell is provided. A first drain/source terminal of the first antifuse transistor is connected with a bit line, and a gate terminal of the first antifuse transistor is connected with a first antifuse control line. The first antifuse transistor comprises a gate oxide layer with a first part and a second part, and the first part is thinner than the second part. A first drain/source terminal of the second antifuse transistor is connected with a second drain/source terminal of the first antifuse transistor, a gate terminal of the second antifuse transistor is connected with a second antifuse control line, and a second drain/source terminal of the second antifuse transistor is connected with the bit line. The second antifuse transistor comprises a second gate oxide layer with a third part and a fourth part, and the third part is thinner than the fourth part.
摘要:
An entanglement and recall system includes an antifuse-type PUF cell array and a processing circuit. The antifuse-type PUF cell array generates at least one key. The processing circuit is connected with the antifuse-type PUF cell array to receive the at least one key. While an entanglement action is performed, the processing circuit receives a plain text and the at least one key and generates a cipher text according to the plain text and the at least one key. While a recall action is performed, the processing circuit receives the cipher text and the at least one key and generates the plain text according to the cipher text and the at least one key.
摘要:
An antifuse physically unclonable function (PUF) unit includes a first sub-antifuse cell, a second sub-antifuse cell, a connection circuit, a first copying circuit and a first reading circuit. The first sub-antifuse cell includes a first antifuse transistor. The second sub-antifuse cell includes a second antifuse transistor. The connection circuit is connected between a source/drain terminal of the first antifuse transistor and a source/drain terminal of the second antifuse transistor. The first copying circuit is connected with the first sub-antifuse cell, and includes a third antifuse transistor. The first reading circuit is connected with the first copying circuit. Moreover, the first reading circuit generates a random code according to a state of the third antifuse transistor.
摘要:
An antifuse-type one time programming memory cell includes a select device, a following device and an antifuse transistor. A first terminal of the select device is connected with a bit line. A second terminal of the select device is connected with a first node. A select terminal of the select device is connected with a word line. A first terminal of the following device is connected with the first node. A second terminal of the following device is connected with a second node. A control terminal of the following device is connected with a following control line. A first drain/source terminal of the antifuse transistor is connected with the second node. A gate terminal of the antifuse transistor is connected with an antifuse control line. A second drain/source terminal of the antifuse transistor is in a floating state.
摘要:
A random code generator is installed in a semiconductor chip and includes a PUF cell array, a control circuit and a verification circuit. The PUF cell array includes m×n PUF cells. The control circuit is connected with the PUF cell array. While a enroll action is performed, the control circuit enrolls the PUF cell array. The verification circuit is connected with the PUF cell array. While a verification action is performed, the verification circuit determines that p PUF cells of the PUF cell array are normal PUF cells and generates a corresponding a mapping information, wherein p is smaller than m×n. While the semiconductor chip is enabled, the control circuit reads states of the p normal PUF cells of the PUF cell array according to the mapping information and generates a random code according to the states.