PROCÉDÉ ÉLECTRONIQUE D'EXTRACTION DE L'AMPLITUDE ET DE LA PHASE D'UN SIGNAL DANS UNE DÉTECTION SYNCHRONE ET MONTAGE INTERFÉROMÉTRIQUE POUR LA MISE EN OEUVRE DU PROCÉDÉ
    3.
    发明公开
    PROCÉDÉ ÉLECTRONIQUE D'EXTRACTION DE L'AMPLITUDE ET DE LA PHASE D'UN SIGNAL DANS UNE DÉTECTION SYNCHRONE ET MONTAGE INTERFÉROMÉTRIQUE POUR LA MISE EN OEUVRE DU PROCÉDÉ 审中-公开
    振幅提取和相位的信号的在实现方法同步检测和干涉测量安排电子方法

    公开(公告)号:EP3044697A1

    公开(公告)日:2016-07-20

    申请号:EP14784277.7

    申请日:2014-09-10

    IPC分类号: G06F17/10 G01J9/02 G01B9/02

    摘要: The invention concerns an electronic method for extracting the amplitude Es and the phase φε of an electrical signal in synchronous detection, the signal containing a modulated part lmod of the form lmod ∝ Es f(t)*cos(ϕs -ϕR(t)),, in which ϕR(t) and f(t) are two known temporal modulation functions. The method comprises the following steps: -multiplying the signal with two reference signals C(t) and S(t) constructed from ϕR(t) and f(t); -integrating the resulting signals during a period tint; -determining the amplitude and the phase of said signal from quantities X and Y resulting from the preceding integration operations. The method is characterised in that: -said signal is multiplied by two orthogonal signals C and S that can be decomposed on the same set of frequencies as those present in lmod; f(t) is periodic or constant during integration period tint; ϕR(t) is periodic during integration period tint; and X and Y are linked to Es*cos(ϕs) and Es*sin(ϕs) by two calculated proportionality coefficients. The invention concerns the interferometric assemblies for implementing the above method, and the execution of same using analogue components, circuit boards or software solutions.

    PROCEDE ET SYSTEME D ' IMAGERIE PAR FONCTIONNALISATION DU SUBSTRAT
    5.
    发明公开
    PROCEDE ET SYSTEME D ' IMAGERIE PAR FONCTIONNALISATION DU SUBSTRAT 有权
    成像系统和方法,使用SUBSTRATFUNKTIONALISIERUNG

    公开(公告)号:EP2488854A1

    公开(公告)日:2012-08-22

    申请号:EP10782659.6

    申请日:2010-10-13

    IPC分类号: G01N21/64

    摘要: The present invention relates to an imaging system for analysing fluorescent molecules in a sample (2), including a confocal microscope device (1) comprising a support (3) in contact with at least a portion of said sample (2). In said system, the support surface (3) in contact with the sample (2) is functionalised so as to reduce the observation volume (6) of the microscope on the surface in the axial direction. The present invention also relates to various uses of such a system as well as to a method for analysing fluorescent molecules in a sample, said method being implemented by such a system.