公开(公告)号：EP2386870A2

公开(公告)日：2011-11-16

申请号：EP11000833.1

申请日：2011-02-03

申请人： Adensis GmbH

发明人： Beck, Bernhard

IPC分类号： G01R31/26

CPC分类号： G01R31/129 ,  H02S50/10

摘要： Bei Photovoltaikgroßanlagen (1) ist der Einsatz eines herkömmlichen Isolationswächters (5) ungeeignet, da sein Testimpuls (15) durch die Anzahl und Länge der Zuleitungen zu sehr gedämpft wird. Gemäß einer ersten Ausführungsform wird hier Abhilfe geschaffen, indem die Photovoltaikanlage schaltungstechnisch in mehrere, elektrisch voneinander isolierte Teilanlagen (3) gegliedert wird, und der Testimpuls nacheinander auf die der jeweiligen Teilanlage zugeordnete Anschlussleitung (6,6') gegeben wird. Nach einer zweiten Ausführungsform wird der Stromverlauf des Testimpuls (15) durch die Anschlussleitungen (6,6') mittels Stromsensoren (10,10') erfasst und in einer Analyseeinheit (14) ausgewertet wird.

摘要翻译： 该方法包括在布置在子系统（3）中的光伏系统的连接线（6,6'）上提供测试脉冲（15）。 测试脉冲提供在彼此相邻的连接线上，其中连接线被分配给子系统。 通过电流传感器（10,10'）在连接线上检测测试脉冲的电源过程，并在分析单元（14）中进行评估。 将测试脉冲的过程与相应的时间点进行比较。

公开(公告)号：EP2056117A1

公开(公告)日：2009-05-06

申请号：EP07119668.7

申请日：2007-10-30

申请人： ISMECA Semiconductor Holding SA

发明人： Charpié, Michel ,  Cretenet, Davy

IPC分类号： G01R31/12 ,  G01R31/26 ,  G01R31/28 ,  G01R31/02

CPC分类号： G01R31/129 ,  G01R31/025 ,  G01R31/263 ,  G01R31/2642 ,  G01R31/2851 ,  G01R31/2896

摘要： A test station (6) for testing leakage current through the insulating package (42) of power electronic components (3), said test station comprising:
first contact portions (36) for applying a first test voltage on one or more pins (40) of said tested components,
second contact portions (24, 37, 370, 25, 26) for applying a second test voltage on several external faces of said insulating package of said tested components,

characterized in that said second contact portions are arranged for contacting several mutually orthogonal faces of said power electronic components (3).

摘要翻译： 的测试站（6），用于检测泄漏电流通过功率电子器件的绝缘封装（42）（3）所述测试站包括：用于在一个或多个销施加第一测试电压的第一接触部（36）（40） 的所述测试器件，第二接触部分（24，37，370，25，26），用于在所述的若干外表面施加第二测试电压施加到所述的绝缘封装测试的组件，在其特点，所述第二接触部分布置成用于接触几 所述功率电子部件的相互正交的面（3）。

公开(公告)号：EP1659415A3

公开(公告)日：2008-12-10

申请号：EP05110798.5

申请日：2005-11-16

申请人： INVENTIO AG

发明人： Grundmann, Steffen ,  Gremaud, Nicolas

IPC分类号： G01R31/28 ,  G01R31/40 ,  H02J9/06

CPC分类号： G01R31/129 ,  G01R31/40 ,  H02J9/06

摘要： The present invention provides an uninterruptible power supply (10) wherein the isolation means (14') is automatically tested during normal operation to ensure that it is capable of effectively isolating the input from an auxiliary power supply (16) during emergency operation. The uninterruptible power supply (10) comprises an input for coupling to a main power supply (1), an output for connection to an electrical load (2), an auxiliary power supply (16) and selective isolation means (14') configured to isolate the auxiliary power supply (16) from the input during emergency operation. First means (26,28) establish a reverse polarity across the isolation means (14') for a test period (ΔT 2 ) during normal operation, and second means (30,24) monitor a voltage proportional to an input voltage (U in ) to the isolation means (14) and output an error signal (DT Error ) if the monitored voltage (U in ) remains or rises above a first reference value (U ref2 ) during the test period (ΔT 2 ).

公开(公告)号：EP1530053B1

公开(公告)日：2007-02-28

申请号：EP04078027.2

申请日：2004-11-03

申请人： Solid State Measurements, Inc.

发明人： Hillard, Robert J.

IPC分类号： G01R31/26

CPC分类号： G01R31/2648 ,  G01R31/129 ,  G01R31/2831

公开(公告)号：EP2718733A2

公开(公告)日：2014-04-16

申请号：EP12730409.5

申请日：2012-06-05

申请人： Fraunhofer Gesellschaft zur Förderung der angewandten Forschung e.V.

发明人： NAGEL, Henning

IPC分类号： G01R31/12 ,  G01R31/40

CPC分类号： G01R31/129 ,  H01L22/14 ,  H02S50/10

摘要： The invention relates to a method for measuring the potential induced degradation (PID) of at least one solar cell. According to the invention, a conductive plastic material is pressed upon the upper or lower face, in particular the front face of the relevant solar cell, and a direct current voltage greater than 50 V is applied between the plastic material and the relevant solar cell. Alternatively, corona discharges may be applied to solar cells or photovoltaic panels. In one embodiment, an electric characteristic of the relevant solar cell or of the photovoltaic panel is repeatedly measured at time intervals. According to the invention, the method can be carried out on individual solar cells, which, after passing the test, can immediately be further processed to make photovoltaic panels, for example, without further complex preparation. In principle, the method is also suitable for carrying out measurements on entire photovoltaic panels.

摘要翻译： 本发明涉及一种用于测量至少一个太阳能电池的高压诱导退化（PID）的方法。 根据本发明，导电塑料材料被压在各个太阳能电池的上侧或下侧，特别是在其前侧，并且在塑料材料和相应的太阳能之间施加大于50V的直流电压 细胞。 或者，可以将电晕放电施加到太阳能电池或光伏模块。 在一个实施例中，以时间间隔重复测量各个太阳能电池或光伏模块的特征电参数。 根据本发明的方法可以在单独的太阳能电池上进行，其可以在通过测试之后直接进一步处理，而不需要进一步的复杂处理，例如， 到光伏模块。 原则上，该方法也适用于完整光伏组件的测量。

公开(公告)号：EP0908944B1

公开(公告)日：2011-11-30

申请号：EP98402488.5

申请日：1998-10-07

申请人： Commissariat à l'Énergie Atomique et aux Énergies Alternatives

发明人： Henaux, Stéphane

IPC分类号： H01L21/66

CPC分类号： H01L24/05 ,  G01R31/129 ,  H01L22/14 ,  H01L22/34 ,  H01L24/48 ,  H01L2224/0401 ,  H01L2224/04042 ,  H01L2224/05556 ,  H01L2224/05599 ,  H01L2224/4807 ,  H01L2224/48453 ,  H01L2224/48463 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01011 ,  H01L2924/01014 ,  H01L2924/01023 ,  H01L2924/01058 ,  H01L2924/01074 ,  H01L2924/01079 ,  H01L2924/12032 ,  H01L2924/14 ,  H01L2924/30107 ,  H01L2924/3011 ,  H01L2224/45099 ,  H01L2924/00 ,  H01L2224/85399

公开(公告)号：EP1612570A3

公开(公告)日：2006-06-07

申请号：EP05105656.2

申请日：2005-06-24

申请人： Solid State Measurements, Inc.

发明人： Howland, Jr., William H. ,  Hillard, Robert J.

IPC分类号： G01R31/28 ,  G01R31/12

CPC分类号： G01R31/129

摘要： To detect soft breakdown of a dielectric layer of a semiconductor wafer, a DC current is caused to flow between a top surface of the dielectric layer and the semiconducting material of the semiconductor wafer. The DC current is either a constant value DC current, or a DC current that swept and/or stepped from a first value toward a second value in a manner whereupon the electric field and, hence, a DC voltage induced across the dielectric layer increases as the DC current approaches the second value. The response of the semiconductor wafer to the flow of DC current is measured for the presence of an AC voltage component superimposed on the DC voltage. The value of the DC voltage induced across the dielectric layer where the AC voltage component is detected is designated as the soft breakdown voltage of the dielectric layer.

公开(公告)号：EP1612570A2

公开(公告)日：2006-01-04

申请号：EP05105656.2

申请日：2005-06-24

申请人： Solid State Measurements, Inc.

发明人： Howland, Jr., William H. ,  Hillard, Robert J.

IPC分类号： G01R31/28

CPC分类号： G01R31/129

摘要： To detect soft breakdown of a dielectric layer of a semiconductor wafer, a DC current is caused to flow between a top surface of the dielectric layer and the semiconducting material of the semiconductor wafer. The DC current is either a constant value DC current, or a DC current that swept and/or stepped from a first value toward a second value in a manner whereupon the electric field and, hence, a DC voltage induced across the dielectric layer increases as the DC current approaches the second value. The response of the semiconductor wafer to the flow of DC current is measured for the presence of an AC voltage component superimposed on the DC voltage. The value of the DC voltage induced across the dielectric layer where the AC voltage component is detected is designated as the soft breakdown voltage of the dielectric layer.

摘要翻译： 为了检测半导体晶片的介电层的软击穿，DC电流引起的电介质层的顶表面和该半导体晶片的半导体材料之间流动。 DC电流可以是一个恒定值的直流电流，或一个直流电流并以一种方式在所述电场扫和/或阶梯状从第一值向第二值，其中，因此，在整个电介质层随着感应直流电压 直流电流接近第二值。 所述半导体晶片以DC电流的流动的响应被测量为叠加在DC电压的交流电压分量的存在。 跨在检测到的交流电压分量的电介质层引起的直流电压的值被指定为介电层的软击穿电压。

公开(公告)号：EP1530053A1

公开(公告)日：2005-05-11

申请号：EP04078027.2

申请日：2004-11-03

申请人： Solid State Measurements, Inc.

发明人： Hillard, Robert J.

IPC分类号： G01R31/26

CPC分类号： G01R31/2648 ,  G01R31/129 ,  G01R31/2831

摘要： A leakage current of a dielectric overlaying a semiconductor wafer can be determined by moving a conductive probe into contact with the dielectric and applying an electrical stimulus, in the form of a fixed amplitude, fixed frequency AC voltage superimposed on a DC voltage which is swept from a starting voltage towards an ending voltage, between the probe tip and the semiconductor wafer. Conductance values associated with the dielectric and the semiconductor wafer can be determined from phase angles between the AC voltage and an AC current resulting from the applied AC voltage during the sweep of the DC voltage. The leakage current of the dielectric can then be determined from the thus determined changes in conductance values as a function of changes in the voltage of the swept DC voltage.

摘要翻译： 覆盖半导体晶片的电介质的漏电流可以通过将导电探针移动与电介质接触并施加电激励来确定，该电刺激以固定振幅固定频率交流电压的形式叠加在直流电压上 在探针尖端和半导体晶片之间的朝着终止电压的起始电压。 与电介质和半导体晶片相关联的电导值可以由在直流电压扫描期间由所施加的AC电压产生的交流电压和交流电流之间的相位角确定。 然后可以根据所确定的电导值的变化作为扫描直流电压的电压变化的函数来确定电介质的漏电流。

公开(公告)号：EP0679898A3

公开(公告)日：1996-07-31

申请号：EP95302930.3

申请日：1995-04-28

申请人： CANON KABUSHIKI KAISHA

发明人： Tamechika, Masanari, c/o Canon Kabushiki Kaisha ,  Fukae, Kimitoshi, c/o Canon Kabushiki Kaisha

IPC分类号： G01R31/02

CPC分类号： G01R31/129 ,  H02S50/10

摘要： An object of the present invention is to provide an insulation state measurement method and a judgement apparatus for a power conversion system, which can monitor the insulation state of an electric path with one end to which a power source is connected, or the power source itself in a non-use state of the power source, and can prevent an unexpected failure. A solar cell array connected to one end of an electric path is set in a non-grounded state upon operation of a change-over switch, and a measurement switch which receives an operation command from an operating circuit temporarily applies a high voltage to the electric path. A current detector detects a weak current flowing through connection lines, and supplies detection data to an insulation judgement unit. The insulation judgement unit calculates the insulator resistance on the basis of the magnitude of the applied voltage, and the magnitude of the weak current detected by the current detector. If an abnormality is detected, information indicating the abnormality is displayed on a display unit. In this manner, an unexpected failure can be avoided.

摘要翻译： 本发明的目的是提供一种用于电力转换系统的绝缘状态测量方法和判断装置，其可以监视与连接电源的一端或电源本身的电气路径的绝缘状态 在电源的不使用状态下，可以防止意外的故障。 连接到电路的一端的太阳能电池阵列在切换开关操作时被设置为非接地状态，并且从操作电路接收操作命令的测量开关暂时向电气施加高电压 路径。 电流检测器检测流过连接线的弱电流，并将检测数据提供给绝缘判断单元。 绝缘判断单元基于施加电压的大小和由电流检测器检测到的弱电流的大小来计算绝缘体电阻。 如果检测到异常，则在显示单元上显示表示异常的信息。 以这种方式，可以避免意外的故障。