摘要:
A polishing apparatus is used for polishing a workpiece such as a semiconductor wafer to a flat mirror finish. The polishing apparatus having interlock function comprises a turntable having a polishing surface thereon, a top ring for holding a workpiece to be polished and pressing the workpiece against the polishing surface on the turntable, a first motor for rotating the turntable, and a second motor for rotating the top ring. The polishing apparatus further comprises a first actuator for lifting and lowering the top ring, a second actuator for moving the top ring in a horizontal direction, and a control unit for controlling the motors and the actuators . The control unit controls the motors and the actuators in such a manner that when an abnormality is detected in at least one of the motors and the actuators, at least one of the motors and the actuators other than that of abnormality performs a predetermined operation.
摘要:
A polishing apparatus is used for polishing a workpiece such as a semiconductor wafer to a flat mirror finish. The polishing apparatus having interlock function comprises a turntable having a polishing surface thereon, a top ring for holding a workpiece to be polished and pressing the workpiece against the polishing surface on the turntable, a first motor for rotating the turntable, and a second motor for rotating the top ring. The polishing apparatus further comprises a first actuator for lifting and lowering the top ring, a second actuator for moving the top ring in a horizontal direction, and a control unit for controlling the motors and the actuators. The control unit controls the motors and the actuators in such a manner that when an abnormality is detected in at least one of the motors and the actuators, at least one of the motors and the actuators other than that of abnormality performs a predetermined operation.
摘要:
A polishing apparatus for polishing a surface of a workpiece, comprising: a turntable (1) having a polishing surface thereon; a top ring (2) for holding a workpiece to be polished and pressing the workpiece against said polishing surface on said turntable; a dressing tool (21) for dressing said polishing surface of said turntable; a motor (22) for rotating said dressing tool; an actuator (23) for lifting and lowering said dressing tool; a control unit (10) for controlling said motors and said actuator; wherein said control unit controls said motor (22) and said actuator (23) in such a manner that when an abnormality is detected in said polishing apparatus, said dressing tool is lifted and rotation of said dressing tool is stopped.
摘要:
A polishing apparatus is used for polishing a workpiece such as a semiconductor wafer to a flat mirror finish. The polishing apparatus having interlock function comprises a turntable having a polishing surface thereon, a top ring for holding a workpiece to be polished and pressing the workpiece against the polishing surface on the turntable, a first motor for rotating the turntable, and a second motor for rotating the top ring. The polishing apparatus further comprises a first actuator for lifting and lowering the top ring, a second actuator for moving the top ring in a horizontal direction, and a control unit for controlling the motors and the actuators. The control unit controls the motors and the actuators in such a manner that when an abnormality is detected in at least one of the motors and the actuators, at least one of the motors and the actuators other than that of abnormality performs a predetermined operation.
摘要:
A minimum five-axis machine tool (11) has first to third linear feed axes orthogonal to each other as well as first and second rotational feed axes orthogonal to each other, wherein a rotational axis line of the first rotational feed axis C is parallel to the first linear feed axis Z. While a tool T and a work W are moved relatively through the second and third linear feed axes X, Y to perform machining of the work W by means of the tool T, the machine tool controls the first rotational feed axis C such that a rotational axis line of the second rotational feed axis A is perpendicular to the direction of relative movement of the perpendicular to the direction of relative movement of the tool T to the work W, and controls a power supplied to a motor for the second rotational feed axis A when a torque around the second rotational feed axis A exceeds a specified threshold.
摘要:
The invention relates to a method for monitoring a machining tool which is used for machining primarily metal materials, having a cutting tool, wherein the cutting force, the feed force and the passive force during machining are set, and having sensors for measuring forces. In order that machining can be stopped 2 to 60 seconds, preferably 2 to 10 seconds, prior to failure of the cutting body, the invention proposes that the sensors continuously sense at least one of said forces during machining and machining is stopped if a sudden reduction in the sensed force occurs.
摘要:
A polishing apparatus is used for polishing a workpiece such as a semiconductor wafer to a flat mirror finish. The polishing apparatus having interlock function comprises a turntable having a polishing surface thereon, a top ring for holding a workpiece to be polished and pressing the workpiece against the polishing surface on the turntable, a first motor for rotating the turntable, and a second motor for rotating the top ring. The polishing apparatus further comprises a first actuator for lifting and lowering the top ring, a second actuator for moving the top ring in a horizontal direction, and a control unit for controlling the motors and the actuators. The control unit controls the motors and the actuators in such a manner that when an abnormality is detected in at least one of the motors and the actuators, at least one of the motors and the actuators other than that of abnormality performs a predetermined operation.
摘要:
A tool breakage detecting system adapted to detect the breakage of a tool with a high accuracy which occurs in some cases even when a load is not substantially imparted to a rotary shaft and a tool feed shaft. The disturbance load torque of a main shaft and a shaft for relatively moving a work and a tool is monitored by a rotary shaft disturbance load torque estimating means (1) and a moving shaft disturbance load torque estimating means (2), and also the disturbance load torque of a shaft which does not relatively move a work and a tool by stationary shaft disturbance load torque estimating means (3, 4). The breakage of the tool is judged by a comparison means (5) on the basis of the estimated disturbance load torque from these estimating means, and, when the breakage of the tool is detected, the machine is stopped by a machine stoppage command means (6).