Abstract:
A short optical pulse generator (100) includes: an optical pulse generation portion (10) that has a quantum well structure and generates an optical pulse; a frequency chirp portion (12) that has a quantum well structure and chirps a frequency of the optical pulse; and a group velocity dispersion portion (14) that includes a plurality of optical waveguides (2 to 4) disposed in a mode coupling distance and causes a group velocity difference corresponding to a wavelength in the optical pulse of which the frequency is chirped.
Abstract:
A semiconductor light-emitting device having a construction for producing a stable optical output and a longitudinal multimode oscillation spectrum with respect to the injection current. A semiconductor light-emitting device (200) is an InGaAs edge-emission light-emitting laser having a 980-nm band and has a multilayer structure including an n-AlGaAs cladding layer (110), an active layer (120), a p-AlGaAs cladding layer (130) and a GaAs cap layer (140), which are epitaxially grown sequentially on an n-GaAs substrate (100). The active layer has a double quantum well two-layer structure composed of an InGaAs layer and a GaAs layer. The upper part of the cladding layer (130) and the cap layer (140) are formed into a mesa stripe shape having a width of 4 νm, and a passivation film (150) of an SiN film is formed all over the surface excepting the top of the mesa (the top of the cap layer). The back (100a) of the substrate of the InGaAs laser is processed into an optically irregularly reflecting face having a continuous irregularity the surface roughness (Rq: root mean square roughness) of which is 100 nm.
Abstract:
The invention concerns a superluminescent light emitting diode (SLED) comprising a semiconductor heterostructure forming a PN junction and a waveguide. The semiconductor heterostructure includes a gain region (4) with a contact means (7, 8) for biasing the PN junction so as to produce light emission including stimulated emission from an active zone of the gain region (4), and in the active zone a plurality of quantum dot layers (11.1, 11.2), each quantum dot layer (11) made up of a plurality of quantum dots and a plurality of adjoining layers (13.1, 13.2), each adjoining layer (13) adjacent to one of said quantum dot layers (11). The material composition or a deposition parameter of at least two adjoining layers (13) is different. This ensures an enhanced emission spectral width.
Abstract:
Compound semiconductor light emitting devices can be obtained which are capable of suppressing the surface state density on the facets of semiconductor light emitting devices such as semiconductor lasers for a long time, thus achieving stable operation even when the passivation layer diffuses. The compound semiconductor light emitting device has a first conduction type of clad layer, an active layer and a second conduction type of clad layer grown on a substrate, and two facets opposite to each other so as to form a cavity. This device is characterised in that the active layer is transparent to light of the emission wavelength in the vicinities of the facets and that the surfaces of the first conduction type of clad layer, active layer and second conduction type of clad layer forming the facets are each coated with a passivation layer (14).
Abstract:
A surface-emitting laser array includes a plurality of light emitting parts. Each light emitting part includes a reflection mirror including aluminum gallium arsenide (AlxGa(1-x)As) where x is greater than 0.95 but less than or equal to 1; an active layer; and an electrode surrounding an emission region, from which laser light is emitted, the electrode covering a region between adjacent light emitting parts in the plurality of light emitting parts.
Abstract:
A semiconductor optical device has a semiconductor substrate, and an active layer which is formed above the semiconductor substrate, the active layer having a plurality of quantum wells formed from a plurality of barrier layers and a plurality of well layers sandwiched among the plurality of barrier layers. At least one well layer of the plurality of well layers is formed from an In xa Ga (1-xa) As film, and a composition ratio xa of the In takes any one value within a range from approximately 0.05 to approximately 0.20. Accordingly, the semiconductor optical device is formed as a strained well layer in which lattice distortion bought about in the well layer takes any one value within a range from approximately 0.35% to approximately 1.5%, and the strained well layer is formed so as to have a bandgap wavelength different from those of the other well layers. Consequently, the semiconductor optical device is configured capable of representing, as an optical spectral characteristic, a broad optical spectral characteristic whose center wavelength is from approximately 800 nm to approximately 850 nm, and which has a spectral half bandwidth greater than or equal to a predetermined value.
Abstract:
A monolithic semiconductor laser structure (200) having plural semiconductor lasers (201,202) having different emission wavelengths from each other, including: a semiconductor substrate (1); a first double hetero-structure formed within a first area on the semiconductor substrate and having first clad layers (21,24) disposed above and below a first active layer (22); and a second double hetero-structure formed within a second area on the semiconductor substrate and having second clad layers (31,24) disposed above and below a second active layer. The first and second active layers are made of different semiconductor materials from each other. The first clad layers above the first active layer are of approximately the same semiconductor materials as the second clad layers above the second active layer.
Abstract:
A monolithic semiconductor laser having plural semiconductor lasers having different emission wavelengths from each other, including: a semiconductor substrate; a first double hetero-structure formed within a first area on the semiconductor substrate and having first clad layers disposed above and below a first active layer; and a second double hetero-structure formed within a second area on the semiconductor substrate and having second clad layers disposed above and below a second active layer. The first and second active layers are made of different semiconductor materials from each other. The first clad layers above and below the first active layer are of approximately the same semiconductor materials and the second clad layers above and below the second active layer are of approximately the same semiconductor materials.