OPTICAL TRANSMISSION/REFLECTION MODE IN-SITU DEPOSITION RATE CONTROL FOR ICE FABRICATION
    3.
    发明公开
    OPTICAL TRANSMISSION/REFLECTION MODE IN-SITU DEPOSITION RATE CONTROL FOR ICE FABRICATION 审中-公开
    IN-SITU-ABSCHEIDUNGSRATENSTEUERUNG IM OPTISCHEN SENDE- / REFLEXIONSMODUSFÜRDIE HERSTELLUNG VON EIS

    公开(公告)号:EP3102716A4

    公开(公告)日:2017-08-16

    申请号:EP14891164

    申请日:2014-05-08

    Abstract: Systems and methods of controlling a deposition rate during thin-film fabrication are provided. A system as provided may include a chamber, a material source contained within the chamber, an electrical component to activate the material source, a substrate holder to support the multilayer stack and at least one witness sample. The system may further include a measurement device and a computational unit. The material source provides a layer of material to the multilayer stack and to the witness sample at a deposition rate controlled at least partially by the electrical component and based on a correction value obtained in real-time by the computational unit. In some embodiments, the correction value is based on a measured value provided by the measurement device and a computed value provided by the computational unit according to a model.

    Abstract translation: 提供了在薄膜制造期间控制沉积速率的系统和方法。 所提供的系统可以包括腔室,容纳在腔室内的材料源,激活材料源的电子部件,支撑多层叠堆的基板保持器以及至少一个见证样品。 该系统可以进一步包括测量装置和计算单元。 材料源以至少部分地由电气部件控制的沉积速率并且基于由计算单元实时获得的校正值向多层叠堆和证据样品提供材料层。 在一些实施例中,校正值基于由测量装置提供的测量值和由计算单元根据模型提供的计算值。

    OPTICAL COMPUTING DEVICE HAVING DETECTOR WITH NON-PLANAR SEMICONDUCTOR STRUCTURE
    9.
    发明公开
    OPTICAL COMPUTING DEVICE HAVING DETECTOR WITH NON-PLANAR SEMICONDUCTOR STRUCTURE 审中-公开
    OPTISCHE BERECHNUNGSVORRICHTUNG MIT EINEM DETEKTOR MIT NICHIPLANER HALBLEITERSTRUKTUR

    公开(公告)号:EP3058433A4

    公开(公告)日:2017-08-02

    申请号:EP13899927

    申请日:2013-12-18

    Abstract: An optical computing device including a detector having a non-planar semiconductor structure is provided. The detector may include one or more structures having structure characteristics that may be optimized to respond to and weight predetermined wavelengths of light radiated from a sample that are related to characteristics of the sample. The detector may include an array of the one or more structures, wherein each of the structure units may be individually addressable to program or tune the detector to respond to and weight a spectra of light and generate an output signal based on the weighted spectra of light that is proportional to the characteristics of the sample.

    Abstract translation: 提供了一种包括具有非平面半导体结构的检测器的光学计算装置。 检测器可以包括具有结构特征的一个或多个结构,所述结构特征可以被优化以对与样本的特征相关的样本辐射的光的预定波长做出响应并对其加权。 检测器可以包括一个或多个结构的阵列,其中每个结构单元可以是可单独编址的,以编程或调谐检测器以响应光并对光谱进行加权并基于光的加权光谱生成输出信号 这与样本的特征成正比。

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