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公开(公告)号：JPWO2011099137A1
公开(公告)日：2013-06-13
申请号：JP2010521236
申请日：2010-02-12
Applicant: 株式会社ユニソク
CPC classification number: G01N21/6456 , G01N21/314 , G01N21/6486 , G01N2021/174
Abstract: 本発明に係る食品の品質測定装置は、食品に対して波長域の異なる2種類の光を切り替えて照射する照明部と、前記食品からの反射光を受光して電気信号に変換することにより、前記2種類の光に対応する2種類の反射画像をそれぞれ取得する撮像部と、前記撮像部が取得した前記2種類の反射画像について、画素ごとに濃度の差分または蛍光強度を演算して濃度差画像または蛍光強度画像を取得する画像演算部と、前記濃度差画像または前記蛍光強度画像を可視像として出力する出力部と、を備えるものである。
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公开(公告)号：JP2010085397A
公开(公告)日：2010-04-15
申请号：JP2009202844
申请日：2009-09-02
Applicant: Japan Science & Technology Agency , Unisoku Co Ltd , 株式会社ユニソク , 独立行政法人科学技術振興機構
Inventor： INOUE YOSHIHISA , OKAMOTO KIDO , WADA TAKEHIKO , NAKAGAWA TATSUO
CPC classification number: G01N21/15 , G01N21/0332 , G01N21/19 , G01N2021/158
Abstract: PROBLEM TO BE SOLVED: To provide a cryostat capable of effectively preventing dew condensation on the surface of a cell. SOLUTION: The cryostat includes: a casing 1 where incidence and emission openings are formed; a cell storage chamber provided in the casing; a temperature control means for controlling cell temperature; a first optical path pipe 11 for guiding light entering from the incidence opening of the casing to the cell storage chamber; a second optical path pipe 12 for guiding light through the cell storage chamber to the emission opening of the casing; first and second optical windows 15, 18 disposed in openings exposed to the outside, respectively, in the first and second optical path pipes; and a sealing material 19 that is disposed at the periphery of the first and second optical windows, seals the first and second optical path pipes, and has a vapor permeability of 30,000 cc cm 2 mm sec cm Hg×10 10 or less. COPYRIGHT: (C)2010,JPO&INPIT
Abstract translation: 要解决的问题：提供能够有效地防止电池表面上的结露的低温恒温器。
解决方案：低温恒温器包括：形成入射和发射开口的壳体1; 设置在所述壳体中的电池存储室; 用于控制电池温度的温度控制装置; 第一光路管11，其将从壳体的入口开始的光引导到电池存储室; 第二光路管12，其将光通过电池存储室引导到壳体的发射开口; 第一和第二光学窗口15,18分别设置在第一和第二光路管道中暴露于外部的开口中; 以及密封材料19，其设置在第一和第二光学窗口的周边处，密封第一和第二光路管，并且具有30,000cc cm 3的蒸汽透过度
2 mm sec cm Hg× 10 10 以下。 版权所有（C）2010，JPO＆INPIT -
3.发明专利Method and apparatus for manufacturing probe for scanning probe microscope, and probe manufactured by the same method 有权用于扫描探针显微镜制造探针的方法和装置，以及由该方法制造的探针
公开(公告)号：JP2003287488A
公开(公告)日：2003-10-10
申请号：JP2002089394
申请日：2002-03-27
Applicant: Unisoku Co Ltd , 株式会社ユニソク
Inventor： UEDA KAZUYUKI , YOSHIMURA MASAMITSU , NAGAMURA TOSHIHIKO
Abstract: PROBLEM TO BE SOLVED: To obtain a probe with carbon nanotubes for a scanning probe microscope which can manufacture in an atmosphere in a short manufacturing time in a mass production and which does not exert an adverse influence on mechanical and electrical characteristics of the nanotubes.
SOLUTION: A method for manufacturing the probe for the scanning probe microscope comprises the steps of: opposing the probe 5 of a metal or a semiconductor sharpened at a tip end to an electrode 4 at a small interval in a container 3 for filling a solution 2 for dispersing the carbon nanotubes 7 in an organic solvent; and applying a voltage to the probe 5 and the electrode 4 to adhere the nanotubes 7 to the tip end of the probe 5.
COPYRIGHT: (C)2004,JPOAbstract translation: 要解决的问题：为了获得用于扫描探针显微镜的碳纳米管的探针，该扫描探针显微镜可以在大批量生产的制造时间短的气氛中制造，并且不会对机械和电气特性产生不利影响 纳米管 解决方案：用于制造用于扫描探针显微镜的探针的方法包括以下步骤：将金属或探针5的前端尖锐的探针5以小间隔相对于电极4在容器3中填充 用于将碳纳米管7分散在有机溶剂中的溶液2; 并向探针5和电极4施加电压以将纳米管7粘附到探针5的尖端。版权所有（C）2004，JPO
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公开(公告)号：JP2017181025A
公开(公告)日：2017-10-05
申请号：JP2014165037
申请日：2014-08-13
Applicant: 株式会社ユニソク , 国立大学法人群馬大学
IPC: G01Q60/18
Abstract: 【課題】試料に外部から磁界を印加しつつ、試料の磁区を正確に検出することができる近接場偏光顕微鏡の提供。 【解決手段】近接場偏光顕微鏡1は、探針2を有するカンチレバー3と、磁区検出レーザ光11の探針2への照射による近接場光により試料8の磁区を検出する磁区検出光学系4と、磁区検出レーザ光11の照射状態を観察する観察照明光学系5と、磁区検出光学系4と観察照明光学系5との共通の対物レンズ6と、試料8に外部から磁界を印加する磁界印加手段7とを備える。磁界印加手段7が有する上部磁極43と下部磁極44との間に、非磁性かつ非導電性材料から形成されるカンチレバー3と、磁性材料から形成される試料8とが配置される。 【選択図】図1
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Patent Agency Ranking
公开(公告)号：JP2006133089A
公开(公告)日：2006-05-25
申请号：JP2004322873
申请日：2004-11-05
Applicant: National Institute For Materials Science , Unisoku Co Ltd , 株式会社ユニソク , 独立行政法人物質・材料研究機構
Inventor： FUJITA DAISUKE , ONISHI KEIKO , NAGAMURA TOSHIHIKO , SUGIYAMA ICHIRO
Abstract: PROBLEM TO BE SOLVED: To provide an ultrahigh vacuum scanning probe microscope capable of performing in situ observation with an atomic-level resolution of a surface structure, while applying a stress to a sample in ultrahigh vacuum.
SOLUTION: This ultrahigh vacuum scanning probe microscope is characterized by being equipped with a sample holder 3 for supporting one end or both ends of a tabular sample 2 in a vacuum vessel in the ultrahigh vacuum state; stress application mechanisms 6, 7, 8 wherein deformation in the vertical direction is controlled in the nano-scale, for applying a stress to the tabular sample 2; and a probe for performing on-the-spot measurement with the atomic-level resolution of the state of the tabular sample surface where the stress is applied.
COPYRIGHT: (C)2006,JPO&NCIPIAbstract translation: 要解决的问题：提供一种超高真空扫描探针显微镜，能够在超高真空下对样品施加应力，能够以表面结构的原子级分辨率进行原位观察。 解决方案：该超高真空扫描探针显微镜的特征在于装备有用于在超高真空状态的真空容器中支撑片状样品2的一端或两端的样品架3; 应力施加机构6,7,8，其中在垂直方向上的变形被控制在纳米级中，用于向片状样品2施加应力; 以及用于以施加应力的平板状样品表面的状态的原子级分辨率进行现场测量的探针。 版权所有（C）2006，JPO＆NCIPI
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公开(公告)号：JP2006052993A
公开(公告)日：2006-02-23
申请号：JP2004233728
申请日：2004-08-10
Applicant: Nara Institute Of Science & Technology , Unisoku Co Ltd , 国立大学法人 奈良先端科学技術大学院大学 , 株式会社ユニソク
Inventor： DAIMON HIROSHI , NAGAMURA TOSHIHIKO
IPC: G01N1/00 , G01N21/01 , G01N21/63 , G01N23/225 , G01Q30/16 , G01Q60/10 , G01Q60/18 , G01Q60/24 , H01J37/20
Abstract: PROBLEM TO BE SOLVED: To provide an instrument equipped with a plurality of functions required when a sample is analyzed and/or treated under vacuum. SOLUTION: This cassette for forming a circuit is equipped with a substrate 100, which has a terminal 1 and a projection 6, and a holder 200 having a recessed part 10 for permitting the insertion of the electrode 3 and the projection 6 coming into contact with the terminal 1 and the recessed part 10 and constituted so that the substrate 100 and the holder 200 are fixed by inserting the projection 6 in the recessed part 10. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract translation: 要解决的问题：提供一种配备有在真空下分析和/或处理样品时所需的多种功能的仪器。 解决方案：用于形成电路的该盒装备有具有端子1和突起6的基板100和具有用于允许电极3和突起6的插入的凹部10的保持器200 与端子1和凹部10接触，并且通过将突起6插入到凹部10中而使基板100和保持器200固定。（C）2006年，JPO＆NCIPI
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公开(公告)号：JP2003028817A
公开(公告)日：2003-01-29
申请号：JP2001214242
申请日：2001-07-13
Applicant: Unisoku Co Ltd , 株式会社ユニソク
Inventor： DAIMON HIROSHI , HATTORI MASARU , KANEMITSU YOSHIHIKO , MIYATAKE MASARU , NAGAMURA TOSHIHIKO
Abstract: PROBLEM TO BE SOLVED: To highly accurately carry out an element analysis of a sample without adverse effects to Auger electrons emitted from the sample by an electric field formed by an electron emission electrode and observe a surface of the sample by utilizing a tunnel effect. SOLUTION: The sample is placed on a sample stage scanned in a predetermined direction. Electrons are irradiated to the sample from the electron emission electrode 33 of a probe 30. Auger electrons are emitted from the sample by electrons irradiated to the sample and are given to a cylindrical mirror spectroscope 40. An energy of the Auger electrons is measured by the cylindrical mirror spectroscope 40. A shield electrode 31 is set to the probe 30 for shielding the electric field formed by electrons irradiated from the electron emission electrode 33 to prevent effects to Auger electrons emitted from the sample.
Abstract translation: 要解决的问题：通过由电子发射电极形成的电场，高效准确地进行样品的元素分析，而不会对从样品发射的俄歇电子产生不利影响，并通过利用隧道效应观察样品的表面。 解决方案：将样品放置在沿预定方向扫描的样品台上。 电子从探针30的电子发射电极33照射到样品上。通过照射到样品的电子从样品发射俄歇电子，并将其给予圆柱形镜子分光仪40.俄歇电子的能量由 屏蔽电极31设置在探头30上，用于屏蔽从电子发射电极33照射的电子形成的电场，以防止对从样品发射的俄歇电子的影响。
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公开(公告)号：JP4502193B2
公开(公告)日：2010-07-14
申请号：JP2004233728
申请日：2004-08-10
Applicant: 国立大学法人 奈良先端科学技術大学院大学 , 株式会社ユニソク
IPC: G01N1/00 , G01N21/01 , G01N21/63 , G01N23/225 , G01Q30/16 , G01Q60/10 , G01Q60/18 , G01Q60/24 , H01J37/20
Abstract: PROBLEM TO BE SOLVED: To provide an instrument equipped with a plurality of functions required when a sample is analyzed and/or treated under vacuum. SOLUTION: This cassette for forming a circuit is equipped with a substrate 100, which has a terminal 1 and a projection 6, and a holder 200 having a recessed part 10 for permitting the insertion of the electrode 3 and the projection 6 coming into contact with the terminal 1 and the recessed part 10 and constituted so that the substrate 100 and the holder 200 are fixed by inserting the projection 6 in the recessed part 10. COPYRIGHT: (C)2006,JPO&NCIPI
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10.发明专利
公开(公告)号：JP2007155333A
公开(公告)日：2007-06-21
申请号：JP2005346440
申请日：2005-11-30
Applicant: Unisoku Co Ltd , 株式会社ユニソク
Inventor： YOSHIMURA MASAMITSU , UEDA KAZUYUKI , TANAKA KEI , NAGAMURA TOSHIHIKO
Abstract: PROBLEM TO BE SOLVED: To provide a method of manufacturing a probe for a probe microscope capable of growing a carbon nanotube on the tip part of a probe substrate by a plasma CVD method by reducing a damage received from plasma by electric field concentration.
SOLUTION: A holder 26 for holding a tungsten probe 10 is arranged in a container 21 with an exposed tip part 10a, and carbon-based gas introduced into the container 21 is changed into plasma, and the tip part 10a is exposed to the carbon-based gas changed into plasma, to thereby grow the carbon nanotube 31 on the tip part 10a. A catalyst metal is deposited on the tip part 10a of the tungsten probe 10.
COPYRIGHT: (C)2007,JPO&INPITAbstract translation: 解决问题的方案：提供一种能够通过等离子体CVD法在探针基板的前端部生长碳纳米管的探针显微镜的制造方法，通过减小由等离子体受到的电场浓度的损伤 。 解决方案：用于保持钨探针10的保持器26布置在具有暴露尖端部分10a的容器21中，并且引入到容器21中的碳基气体变为等离子体，并且将尖端部10a暴露于 碳基气体变为等离子体，从而使碳纳米管31在尖端部10a上生长。 催化剂金属沉积在钨探针10的尖端部分10a上。版权所有（C）2007，JPO＆INPIT
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