Abstract:
PROBLEM TO BE SOLVED: To provide a charged particle beam lens capable of suppressing electric field concentration caused by increase in resistance and connection failures at an interface between an anode and cathode and a high-resistance film or an interface between a conductive film and the high-resistance film, and of suppressing generation of discharge.SOLUTION: A charged particle beam lens comprises a plate-like anode 1, a plate-like cathode 2, and an insulator 3 arranged between the anode 1 and the cathode 2. The insulator 3, the anode 1, and the cathode 2 have a beam passing part 5 through which a charged beam passes. A high-resistance film 4 is formed on an inner lateral face forming the beam passing part 5 of the insulator 3 or on the outermost surface of the insulator 3. The anode 1 and the cathode 2 are electrically connected via the high-resistance film 4. The anode 1 and the high-resistance film 4, and the cathode 2 and the high-resistance film 4 respectively contain the same metal or semiconductor element, and have different resistance values.
Abstract:
PROBLEM TO BE SOLVED: To provide an electrostatic lens array whose focus can be easily adjusted as a whole even when electrodes constituting the electrostatic lens array are dispersed in thickness.SOLUTION: An electrostatic lens array has plural electrode substrates arranged to be spaced from one another, each of the electrode substrates having plural openings through which a charged particle beam passes. The electrostatic lens array is configured to be adjustable in parallelism so that an outer peripheral profile line formed by any face other than the upper face of the electrode substrate of the uppermost face and the lower face of the electrode substrate of the lowermost face out of the plural electrode substrates has a portion which protrudes with respect to the outer peripheral profile line of the upper face of the electrode substrate of the uppermost face or the lower face of the electrode substrate of the lowermost face when viewed from a direction substantially vertical to the surfaces of the plural electrodes, and the face having the protruding portion is made parallel to a substrate face irradiated with a charged particle beam passing from the opening of the uppermost face of the electrode substrate of the electrostatic lens array through the opening of the lowermost face of the electrode substrate of the electrostatic lens array by regulating the position of the protruding portion with a position regulating member.
Abstract:
PROBLEM TO BE SOLVED: To provide a charged particle beam electrostatic lens and the like which can exclude notching by a dry etching to be accurately processed.SOLUTION: An electrode of a charged particle beam electrostatic lens is an electrode with a laminated structure formed by laminating a plurality of conductive substrates. The electrode with the laminated structure at least comprises: a first conductive substrate 12 including a first through hole; and a second conductive substrate 11 including a second through hole. The first conductive substrate uses a conductive substrate which is thinner than the second conductive substrate, and includes the first through hole of which diameter is smaller than that of the second through hole. The second conductive substrate uses a conductive substrate which is lower in resistivity and thicker than the first conductive substrate, and the hole arranged on the conductive substrate, of which diameter is larger than the first through hole, is filled with plating and then the conductive substrate is thinned, thereby realizing the second through hole of which diameter is larger than the first through hole. The first through hole and the second through hole are positioned to laminate the first and second conductive substrates, and therefore the electrode 10 is formed with the laminated structure.
Abstract:
PROBLEM TO BE SOLVED: To provide an electrostatic lens having an electrode protection film that allows suppression of axis deviation of a charged particle line in the electrostatic lens, or allows achievement and retention of a highly precise positioned state of a component member.SOLUTION: An electrostatic lens comprises: a plurality of electrodes 1 each having a through hole 3; and an insulating spacer 2 disposed between the electrodes and defines a distance between the electrodes. The insulating spacer 2 is integrated with the electrodes 1 opposed to each other by allowing both surfaces of the insulating spacer 2 to be respectively joined to the electrodes. An electrode protection film 4 is disposed on both surfaces of each of the electrodes 1. The electrode protection film 4 exists on an inner wall of the through hole 3 and on the surfaces of the electrode 1 in a region around the through hole 3 continuously connected from the inner wall to end parts of the electrode 1. The electrode protection film 4 does not exist at the interface between the electrode 1 and the insulating spacer 2.
Abstract:
The present invention relates to an electron column including an electron emission source and lenses, and, more particularly, to an electron column having a structure that can facilitate the alignment and assembly of an electron emission source and lenses. The electron column having an electron emission source and a lens unit according to the present invention is characterized in that the lens unit includes two or more lens layers and performs both a source lens function and a focusing function. Furthermore, the electron column is characterized in that the lens unit includes one or more deflector-type lens layers and additionally performs a deflector function.
Abstract:
PROBLEM TO BE SOLVED: To provide an electrostatic lens unit capable of suppressing the amount of deformation of a charged particle beam lens caused by being heated by a charged particle beam that returns to the charged particle beam lens by being reflected by a resist.SOLUTION: In an electrostatic lens unit in which an electrostatic lens formed by arranging a plurality of electrodes 1 each having a through-hole 5 through which a charged beam passes by separating with interval defining members 2 is fixed to a fixing member 3, a position at which the electrostatic lens is fixed to the fixing member is positioned on a side where the charged beam is emitted than a thickness center in an optical axis direction of the electrostatic lens, and part of a surface on a side where the charged beam enters the electrostatic lens is connected to the fixing member 3 through a support member 4.
Abstract:
PROBLEM TO BE SOLVED: To provide a cleaning processing method of deposit inside a lens.SOLUTION: In an electrostatic charged particle beam lens having a plurality of lens electrodes, the charged particle beam lens includes a first electrode and a second electrode to be arranged by being separated from each other by an interval regulation member in an optical axis direction and has a gap surrounded by the first electrode 1a, the second electrode 1b, and the interval regulation member. The first electrode and the second electrode have a first through hole 2 through which charged particle beams pass, and at least the second electrode has a second through hole 3 through which the charged particle beams do not pass. The charged particle beam lens has a structure in which the first through hole and the second through hole are connected to the gap, respectively, and is constituted so that the total amount of exhaust conductance of the first electrode becomes smaller than the total amount of exhaust conductance to communicate to the outside of the lens electrodes through the through hole provided to the second electrode from the gap.
Abstract:
PROBLEM TO BE SOLVED: To solve such a problem that an electrostatic type charged particle beam lens is sensitive in astigmatism to the symmetry of an opening shape, and likely to be broken in a manufacturing process.SOLUTION: The electrostatic type charged particle beam lens includes a flat plate having a first surface with an optical axis direction as a normal line and a second surface opposite to the first surface, and has an electrode having a through-hole penetrating through from the first surface to the second surface. An opening surface on the surface perpendicular to the normal line of the through-hole is formed to have an opening cross-section. When the diameter of circle obtained by regression analysis of the opening cross-section is regarded as a representative diameter, the representative diameter of the opening cross-section in a first region on the first surface side and the representative diameter of the opening cross-section in a second region on the second surface side are respectively larger than that in a third region which is a region inside the electrode sandwiched between the first surface and the second surface.