Probe
    3.
    发明授权
    Probe 有权
    探测

    公开(公告)号:US08456156B2

    公开(公告)日:2013-06-04

    申请号:US12770990

    申请日:2010-04-30

    IPC分类号: G01R1/06

    CPC分类号: H04R25/30

    摘要: A probe includes a circuit board, an electric field detecting probe, and a magnetic field detecting probe. The electric field detecting probe and the magnetic field detecting probe are located on the circuit board. An anti-jamming distance between the two detecting probes is a multiple of 5 millimeters and is greater than or equal to 10 millimeters.

    摘要翻译: 探针包括电路板,电场检测探针和磁场检测探针。 电场检测探头和磁场检测探头位于电路板上。 两个检测探头之间的抗干扰距离是5毫米的倍数,大于或等于10毫米。

    PROBE
    7.
    发明申请
    PROBE 有权
    探测

    公开(公告)号:US20110101962A1

    公开(公告)日:2011-05-05

    申请号:US12770990

    申请日:2010-04-30

    IPC分类号: G01R1/06

    CPC分类号: H04R25/30

    摘要: A probe includes a circuit board, an electric field detecting probe, and a magnetic field detecting probe. The electric field detecting probe and the magnetic field detecting probe are located on the circuit board. An anti-jamming distance between the two detecting probes is a multiple of 5 millimeters and is greater than or equal to 10 millimeters.

    摘要翻译: 探针包括电路板,电场检测探针和磁场检测探针。 电场检测探头和磁场检测探头位于电路板上。 两个检测探头之间的抗干扰距离是5毫米的倍数,大于或等于10毫米。