Disabling poorly testing RFID ICs
    2.
    发明申请
    Disabling poorly testing RFID ICs 审中-公开
    禁用RFID芯片测试不良

    公开(公告)号:US20070218571A1

    公开(公告)日:2007-09-20

    申请号:US11519507

    申请日:2006-09-11

    IPC分类号: G01R31/26 H01L21/66

    摘要: Manufacturing methods, testing, and RFID integrated circuit wafers that have been so prepared. A function of an integrated circuit can be tested. If the test fails, a control function of the tested circuit is disabled.

    摘要翻译: 制造方法,测试和已经如此准备的RFID集成电路晶圆。 可以测试集成电路的功能。 如果测试失败,则禁用测试电路的控制功能。

    METHOD OF DISCHARGING STATIC ELECTRICITY FROM WATER SLIDERS
    3.
    发明申请
    METHOD OF DISCHARGING STATIC ELECTRICITY FROM WATER SLIDERS 审中-公开
    从滑水器中排放静电的方法

    公开(公告)号:US20130335876A1

    公开(公告)日:2013-12-19

    申请号:US13858303

    申请日:2013-04-08

    申请人: Anthony Stoughton

    发明人: Anthony Stoughton

    IPC分类号: H05F3/00

    摘要: The present invention provides a water slider that features a method of discharging static electricity from a water slider by providing an electrically insulative body extending along a longitudinal axis and having opposed surface with a perimeter edge extending therebetween; and conducting static electricity accumulated on one of the opposed surfaces to the perimeter edge.

    摘要翻译: 本发明提供了一种水滑块,其具有通过提供沿着纵向轴线延伸的电绝缘体并且具有在其间延伸的周边边缘的相对表面从水滑块排出静电的方法; 并且在与所述周边边缘相对的表面中的一个上积累的静电。