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公开(公告)号：US20230163573A1
公开(公告)日：2023-05-25
申请号：US18094797
申请日：2023-01-09
申请人： Apple Inc.
IPC分类号： H01S5/40 , H01S5/024 , G01J3/10 , H01S5/02 , H01S5/125 , H01S5/068 , H01S5/026 , H01S5/0625 , H01S5/02325
CPC分类号： H01S5/4087 , H01S5/02453 , G01J3/10 , H01S5/0206 , H01S5/125 , H01S5/06804 , H01S5/021 , H01S5/0261 , H01S5/06256 , H01S5/02325
摘要： Integrated laser sources emitting multi-wavelengths of light with reduced thermal transients and crosstalk and methods for operating thereof are disclosed. The integrated laser sources can include one or more heaters and a temperature control system to maintain a total thermal load of the gain segment, the heater(s), or both of a given laser to be within a range based on a predetermined target value. The system can include electrical circuitry configured to distribute current to the gain segment, the heater(s), or both. The heater(s) can be located proximate to the gain segment, and the distribution of current can be based on the relative locations. In some examples, the central laser can be heated prior to being activated. In some examples, one or more of the plurality of lasers can operate in a subthreshold operation mode when the laser is not lasing to minimize thermal perturbations to proximate lasers.
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公开(公告)号：US11552454B1
公开(公告)日：2023-01-10
申请号：US16142676
申请日：2018-09-26
申请人： Apple Inc.
IPC分类号： H01S5/024 , H01S5/40 , G01J3/10 , H01S5/02 , H01S5/125 , H01S5/068 , H01S5/026 , H01S5/0625 , H01S5/02325
摘要： Integrated laser sources emitting multi-wavelengths of light with reduced thermal transients and crosstalk and methods for operating thereof are disclosed. The integrated laser sources can include one or more heaters and a temperature control system to maintain a total thermal load of the gain segment, the heater(s), or both of a given laser to be within a range based on a predetermined target value. The system can include electrical circuitry configured to distribute current to the gain segment, the heater(s), or both. The heater(s) can be located proximate to the gain segment, and the distribution of current can be based on the relative locations. In some examples, the central laser can be heated prior to being activated. In some examples, one or more of the plurality of lasers can operate in a subthreshold operation mode when the laser is not lasing to minimize thermal perturbations to proximate lasers.
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公开(公告)号：US10788366B2
公开(公告)日：2020-09-29
申请号：US16095311
申请日：2017-04-13
申请人： Apple Inc.
摘要： Systems and methods for determining one or more properties of a sample are disclosed. The systems and methods disclosed can be capable of measuring along multiple locations and can reimage and resolve multiple optical paths within the sample. The system can be configured with one-layer or two-layers of optics suitable for a compact system. The optics can be simplified to reduce the number and complexity of the coated optical surfaces, etalon effects, manufacturing tolerance stack-up problems, and interference-based spectroscopic errors. The size, number, and placement of the optics can enable multiple simultaneous or non-simultanous measurements at various locations across and within the sample. Moreover, the systems can be configured with an optical spacer window located between the sample and the optics, and methods to account for changes in optical paths due to inclusion of the optical spacer window are disclosed.
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公开(公告)号：US20210310867A1
公开(公告)日：2021-10-07
申请号：US17351067
申请日：2021-06-17
申请人： Apple Inc.
发明人： Trent D. Ridder , Mark Alan Arbore , Gary Shambat , Robert Chen , David I. Simon , Miikka M. Kangas
摘要： Methods and systems for measuring one or more properties of a sample are disclosed. The methods and systems can include multiplexing measurements of signals associated with a plurality of wavelengths without adding any signal independent noise and without increasing the total measurement time. One or more levels of encoding, where, in some examples, a level of encoding can be nested within one or more other levels of encoding. Multiplexing can include wavelength, position, and detector state multiplexing. In some examples, SNR can be enhanced by grouping together one or more signals based on one or more properties including, but not limited to, signal intensity, drift properties, optical power detected, wavelength, location within one or more components, material properties of the light sources, and electrical power. In some examples, the system can be configured for optimizing the conditions of each group individually based on the properties of a given group.
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公开(公告)号：US20240288306A1
公开(公告)日：2024-08-29
申请号：US18655689
申请日：2024-05-06
申请人： Apple Inc.
CPC分类号： G01J3/0229 , G01J3/0205 , G01J3/0216 , G01J3/0256 , G01J3/0294 , G01J3/10 , G01J3/108 , G01J3/36 , G01J3/42 , G01N21/25 , G01N21/49 , G01N2021/4711
摘要： Systems and methods for determining one or more properties of a sample are disclosed. The systems and methods disclosed can be capable of measuring along multiple locations and can reimage and resolve multiple optical paths within the sample. The system can be configured with one-layer or two-layers of optics suitable for a compact system. The optics can be simplified to reduce the number and complexity of the coated optical surfaces, etalon effects, manufacturing tolerance stack-up problems, and interference-based spectroscopic errors. The size, number, and placement of the optics can enable multiple simultaneous or non-simultaneous measurements at various locations across and within the sample. Moreover, the systems can be configured with an optical spacer window located between the sample and the optics, and methods to account for changes in optical paths due to inclusion of the optical spacer window are disclosed.
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公开(公告)号：US11740126B2
公开(公告)日：2023-08-29
申请号：US17351067
申请日：2021-06-17
申请人： Apple Inc.
发明人： Trent D. Ridder , Mark Alan Arbore , Gary Shambat , Robert Chen , David I. Simon , Miikka M. Kangas
CPC分类号： G01J3/427 , G01J3/06 , G01J3/10 , G01J3/108 , G01J3/2803 , G01J3/2846 , G01J3/42 , G01N21/25 , G01N21/35
摘要： Methods and systems for measuring one or more properties of a sample are disclosed. The methods and systems can include multiplexing measurements of signals associated with a plurality of wavelengths without adding any signal independent noise and without increasing the total measurement time. One or more levels of encoding, where, in some examples, a level of encoding can be nested within one or more other levels of encoding. Multiplexing can include wavelength, position, and detector state multiplexing. In some examples, SNR can be enhanced by grouping together one or more signals based on one or more properties including, but not limited to, signal intensity, drift properties, optical power detected, wavelength, location within one or more components, material properties of the light sources, and electrical power. In some examples, the system can be configured for optimizing the conditions of each group individually based on the properties of a given group.
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公开(公告)号：US11041758B2
公开(公告)日：2021-06-22
申请号：US16095323
申请日：2017-04-13
申请人： Apple Inc.
发明人： Trent D. Ridder , Mark Alan Arbore , Gary Shambat , Robert Chen , David I. Simon , Miikka M. Kangas
摘要： Methods and systems for measuring one or more properties of a sample are disclosed. The methods and systems can include multiplexing measurements of signals associated with a plurality of wavelengths without adding any signal independent noise and without increasing the total measurement time. One or more levels of encoding, where, in some examples, a level of encoding can be nested within one or more other levels of encoding. Multiplexing can include wavelength, position, and detector state multiplexing. In some examples, SNR can be enhanced by grouping together one or more signals based on one or more properties including, but not limited to, signal intensity, drift properties, optical power detected, wavelength, location within one or more components, material properties of the light sources, and electrical power. In some examples, the system can be configured for optimizing the conditions of each group individually based on the properties of a given group.
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公开(公告)号：US12007275B2
公开(公告)日：2024-06-11
申请号：US17576117
申请日：2022-01-14
申请人： Apple Inc.
CPC分类号： G01J3/0229 , G01J3/0205 , G01J3/0216 , G01J3/0256 , G01J3/0294 , G01J3/10 , G01J3/108 , G01J3/36 , G01J3/42 , G01N21/25 , G01N21/49 , G01N2021/4711
摘要： Systems and methods for determining one or more properties of a sample are disclosed. The systems and methods disclosed can be capable of measuring along multiple locations and can reimage and resolve multiple optical paths within the sample. The system can be configured with one-layer or two-layers of optics suitable for a compact system. The optics can be simplified to reduce the number and complexity of the coated optical surfaces, et al. on effects, manufacturing tolerance stack-up problems, and interference-based spectroscopic errors. The size, number, and placement of the optics can enable multiple simultaneous or non-simultaneous measurements at various locations across and within the sample. Moreover, the systems can be configured with an optical spacer window located between the sample and the optics, and methods to account for changes in optical paths due to inclusion of the optical spacer window are disclosed.
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公开(公告)号：US11243115B2
公开(公告)日：2022-02-08
申请号：US17030328
申请日：2020-09-23
申请人： Apple Inc.
摘要： Systems and methods for determining one or more properties of a sample are disclosed. The systems and methods disclosed can be capable of measuring along multiple locations and can reimage and resolve multiple optical paths within the sample. The system can be configured with one-layer or two-layers of optics suitable for a compact system. The optics can be simplified to reduce the number and complexity of the coated optical surfaces, et al. on effects, manufacturing tolerance stack-up problems, and interference-based spectroscopic errors. The size, number, and placement of the optics can enable multiple simultaneous or non-simultaneous measurements at various locations across and within the sample. Moreover, the systems can be configured with an optical spacer window located between the sample and the optics, and methods to account for changes in optical paths due to inclusion of the optical spacer window are disclosed.
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公开(公告)号：US20220136899A1
公开(公告)日：2022-05-05
申请号：US17576117
申请日：2022-01-14
申请人： Apple Inc.
摘要： Systems and methods for determining one or more properties of a sample are disclosed. The systems and methods disclosed can be capable of measuring along multiple locations and can reimage and resolve multiple optical paths within the sample. The system can be configured with one-layer or two-layers of optics suitable for a compact system. The optics can be simplified to reduce the number and complexity of the coated optical surfaces, et al. on effects, manufacturing tolerance stack-up problems, and interference-based spectroscopic errors. The size, number, and placement of the optics can enable multiple simultaneous or non-simultaneous measurements at various locations across and within the sample. Moreover, the systems can be configured with an optical spacer window located between the sample and the optics, and methods to account for changes in optical paths due to inclusion of the optical spacer window are disclosed.
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