Abstract:
A testing device for testing one more characteristics of an electronic display. The testing device includes a main body and a receiving cavity defined within the main body configured to receive at least a portion of the electronic display. The testing device also includes a plurality of sensors positioned on a first surface of the testing device and configured to be in optical communication with at least a portion of the electronic display received within the cavity. The plurality of sensors is configured to detect at least one type of non-uniformity of the electronic display by detecting light emitted from the electronic display.
Abstract:
An optical test equipment/method for display testing that features parallel testing/sensing configuration that covers spectrum and colorimetric quantities with spatial resolution is disclosed. In one embodiment, a spectra-camera, which is a hybrid system consisting of both a single-point spectrometer and an imaging colorimeter, can be configured for concurrent display artifact and parametric testing. An aperture mirror with a hole in the middle splits an image of a test display into two parts. One part of the image passes through the hole and is directed to the spectrometer for display parametric testing. The rest of the image is reflected off the aperture mirror for concurrent display artifact testing with the colorimeter. In another embodiment, a beam splitter can be used instead of an aperture mirror. In yet another embodiment, the single-point high accuracy spectrometer can be used to calibrate the low accuracy imaging colorimeter.
Abstract:
An optical test equipment/method for display testing that features parallel testing/sensing configuration that covers spectrum and colorimetric quantities with spatial resolution is disclosed. In one embodiment, a spectra-camera, which is a hybrid system consisting of both a single-point spectrometer and an imaging colorimeter, can be configured for concurrent display artifact and parametric testing. An aperture mirror with a hole in the middle splits an image of a test display into two parts. One part of the image passes through the hole and is directed to the spectrometer for display parametric testing. The rest of the image is reflected off the aperture mirror for concurrent display artifact testing with the colorimeter. In another embodiment, a beam splitter can be used instead of an aperture mirror. In yet another embodiment, the single-point high accuracy spectrometer can be used to calibrate the low accuracy imaging colorimeter.
Abstract:
A testing device for testing one more characteristics of an electronic display. The testing device includes a main body and a receiving cavity defined within the main body configured to receive at least a portion of the electronic display. The testing device also includes a plurality of sensors positioned on a first surface of the testing device and configured to be in optical communication with at least a portion of the electronic display received within the cavity. The plurality of sensors is configured to detect at least one type of non-uniformity of the electronic display by detecting light emitted from the electronic display.