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公开(公告)号：US20230393174A1
公开(公告)日：2023-12-07
申请号：US18205735
申请日：2023-06-05
Applicant: FormFactor, Inc.
Inventor： Ernest Gammon McReynolds , Jerry Martyniuk , Tim Lesher , Tomoe Yokoyama , David Raschko , Uyen Nguyen , Pratik Bakul Ghate
CPC classification number: G01R1/07378 , G01R31/2889
Abstract: Improved performance for attenuated testing when probing a device under test with a probe array is provided. By moving the attenuation components from their conventional location on the printed circuit board of the probe head to the space transformer of the probe head, electrical path lengths can be decreased, thereby improving performance. This is particularly helpful in connection with loopback testing.
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