公开(公告)号：US11486898B2

公开(公告)日：2022-11-01

申请号：US17345613

申请日：2021-06-11

Applicant: FormFactor, Inc.

Inventor： Tim Lesher ,  Jason William Cosman

IPC: G01R1/073 ,  G01R1/067

Abstract: Vertical transmission line probes having alternating capacitive and inductive sections are provided. These alternating sections can be designed to provide a desired transmission line impedance (e.g., between 10 and 100 Ohms, preferably 50 Ohms). Probe flexure in operation is mainly in the inductive sections, advantageously reducing flexure stresses on the dielectrics in the capacitive sections.

公开(公告)号：US20210389348A1

公开(公告)日：2021-12-16

申请号：US17345613

申请日：2021-06-11

Applicant: FormFactor, Inc.

Inventor： Tim Lesher ,  Jason William Cosman

IPC: G01R1/073 ,  G01R1/067

Abstract: Vertical transmission line probes having alternating capacitive and inductive sections are provided. These alternating sections can be designed to provide a desired transmission line impedance (e.g., between 10 and 100 Ohms, preferably 50 Ohms). Probe flexure in operation is mainly in the inductive sections, advantageously reducing flexure stresses on the dielectrics in the capacitive sections.

公开(公告)号：US20230393174A1

公开(公告)日：2023-12-07

申请号：US18205735

申请日：2023-06-05

Applicant: FormFactor, Inc.

Inventor： Ernest Gammon McReynolds ,  Jerry Martyniuk ,  Tim Lesher ,  Tomoe Yokoyama ,  David Raschko ,  Uyen Nguyen ,  Pratik Bakul Ghate

IPC: G01R1/073 ,  G01R31/28

CPC classification number: G01R1/07378 ,  G01R31/2889

Abstract: Improved performance for attenuated testing when probing a device under test with a probe array is provided. By moving the attenuation components from their conventional location on the printed circuit board of the probe head to the space transformer of the probe head, electrical path lengths can be decreased, thereby improving performance. This is particularly helpful in connection with loopback testing.