-
公开(公告)号：US09229065B2
公开(公告)日：2016-01-05
申请号：US13836181
申请日：2013-03-15
Applicant: GENESIS PHOTONICS INC
Inventor： Tai-Wei Wu , Tai-Cheng Tsai , Hsin-Hung Lin , Ping-Tsung Tsai , Pei-Yi Huang , Gwo-Jiun Sheu , Shou-Wen Hsu , Yun-Li Li
CPC classification number: G01R31/44 , G01J2001/4252 , G01R31/2635
Abstract: A detection apparatus for light-emitting diode chip comprising a substrate with the function of photoelectric conversion and a probing device is disclosed. The substrate is designed to bear at least one light-emitting diode chip. The probing device comprises a power supply and at least two conductive elements. The two ends of the conductive elements are respectively electrically connected to the light-emitting diode chip and the power supply to enable the light-emitting diode chip to emit light beams. Some of the light beams are emitted from the light-emitting diode chip toward the substrate such that the light beams emitted by the light-emitting diode chip are converted into an electric signal by the substrate.
Abstract translation: 公开了一种包括具有光电转换功能的基板和探测装置的发光二极管芯片的检测装置。 基板被设计成承载至少一个发光二极管芯片。 探测装置包括电源和至少两个导电元件。 导电元件的两端分别电连接到发光二极管芯片和电源，以使得发光二极管芯片能够发射光束。 一些光束从发光二极管芯片朝向基板发射，使得由发光二极管芯片发射的光束被基板转换成电信号。
-
公开(公告)号：US20150036129A1
公开(公告)日：2015-02-05
申请号：US14311364
申请日：2014-06-23
Applicant: Genesis Photonics Inc.
Inventor： Cheng-Pin Chen , Yun-Li Li , Shou-Wen Hsu , Chih-Hung Tseng , Pei-Yi Huang , Ching-Cheng Sun , Tsung-Syun Huang , Yung-Tsung Lin , Ping-Tsung Tsai
CPC classification number: G01N21/63 , G01N21/6489 , G01N21/8806 , G01N21/95 , G01N21/9501 , G01N2021/646 , G01N2201/061 , G01N2201/0636
Abstract: An inspection apparatus is capable for inspecting at least one light-emitting device. The inspection apparatus includes a working machine and an inspection light source. The inspection light source is disposed on the working machine and located above the light-emitting device. A dominant wavelength of the inspection light source is smaller than a dominant wavelength of the light-emitting device so as to excite the light-emitting device and get an optical property of the light-emitting device.
Abstract translation: 检查装置能够检查至少一个发光装置。 检查装置包括作业机和检查光源。 检查光源设置在工作机上并位于发光装置的上方。 检查光源的主波长小于发光装置的主波长，从而激发发光装置并获得发光装置的光学特性。
-
公开(公告)号：US20140159732A1
公开(公告)日：2014-06-12
申请号：US13836181
申请日：2013-03-15
Applicant: GENESIS PHOTONICS INC
Inventor： TAI-WEI WU , TAI-CHENG TSAI , Hsin-Hung Lin , Ping-Tsung Tsai , Pei-Yi Huang , Gwo-Jiun Sheu , Shou-Wen Hsu , YUN-LI LI
IPC: G01R31/44
CPC classification number: G01R31/44 , G01J2001/4252 , G01R31/2635
Abstract: A detection apparatus for light-emitting diode chip comprising a substrate with the function of photoelectric conversion and a probing device is disclosed. The substrate is designed to bear at least one light-emitting diode chip. The probing device comprises a power supply and at least two conductive elements. The two ends of the conductive elements are respectively electrically connected to the light-emitting diode chip and the power supply to enable the light-emitting diode chip to emit light beams. Some of the light beams are emitted from the light-emitting diode chip toward the substrate such that the light beams emitted by the light-emitting diode chip are converted into an electric signal by the substrate.
Abstract translation: 公开了一种包括具有光电转换功能的基板和探测装置的发光二极管芯片的检测装置。 基板被设计成承载至少一个发光二极管芯片。 探测装置包括电源和至少两个导电元件。 导电元件的两端分别电连接到发光二极管芯片和电源，以使得发光二极管芯片能够发射光束。 一些光束从发光二极管芯片朝向基板发射，使得由发光二极管芯片发射的光束被基板转换成电信号。
-
公开(公告)号：US20160153909A1
公开(公告)日：2016-06-02
申请号：US15016301
申请日：2016-02-05
Applicant: Genesis Photonics Inc.
Inventor： Cheng-Pin Chen , Yun-Li Li , Shou-Wen Hsu , Chih-Hung Tseng , Pei-Yi Huang , Ching-Cheng Sun , Tsung-Syun Huang , Yung-Tsung Lin , Ping-Tsung Tsai
CPC classification number: G01N21/63 , G01N21/6489 , G01N21/8806 , G01N21/95 , G01N21/9501 , G01N2021/646 , G01N2201/061 , G01N2201/0636
Abstract: An inspection apparatus is capable for inspecting at least one light-emitting device. The inspection apparatus includes a working machine and an inspection light source. The inspection light source is disposed on the working machine and located above the light-emitting device. A dominant wavelength of the inspection light source is smaller than a dominant wavelength of the light-emitting device so as to excite the light-emitting device and get an optical property of the light-emitting device.
Abstract translation: 检查装置能够检查至少一个发光装置。 检查装置包括作业机和检查光源。 检查光源设置在工作机上并位于发光装置的上方。 检查光源的主波长小于发光装置的主波长，从而激发发光装置并获得发光装置的光学特性。
-
-
-
Search Results
4
records
(took 0.01 seconds)
