Abstract:
A method includes forming an integrated circuit device having device circuitry disposed in a device circuitry area on a substrate and a destroyable circuit formed in a destroyable circuitry area on the substrate; testing at least one operational aspect of the device circuitry using the destroyable circuit; and destroying the destroyable circuit subsequent to testing the at least one operational aspect of the device circuitry.
Abstract:
A circuit with a sampling network may include a pair of capacitors, where each of the capacitors has a first node and a second node; a first pair of switches communicatively coupling corresponding differential input voltage signals to the first node of each of the capacitors; and a second pair of switches communicatively coupling the second node of each of the capacitors to a common mode voltage source. Corresponding differential output voltage signals at the second node of each of the capacitors may be communicatively coupled using a differential switch. The second pair of switches may be coupled in parallel with the differential switch. A clock signal of the differential switch may be de-asserted prior to de-asserting corresponding clock signals for each of the second pair of switches.
Abstract:
A modulated signal based on a low-precision, fast startup oscillator is provided to a circuit with a high-precision, slow startup oscillator. The frequency of the modulated signal ranges around the characteristic or resonant frequency of the high precision oscillator without using feedback from the high precision oscillator circuit. An implementation can include one or more variable gain circuits that can be adjusted based on an amplitude threshold in relation to the output signal of the high precision oscillator circuit.
Abstract:
A modulated signal based on a low-precision, fast startup oscillator is provided to a circuit with a high-precision, slow startup oscillator. The frequency of the modulated signal ranges around the characteristic or resonant frequency of the high precision oscillator without using feedback from the high precision oscillator circuit. An implementation can include one or more variable gain circuits that can be adjusted based on an amplitude threshold in relation to the output signal of the high precision oscillator circuit.
Abstract:
A method and device for testing a digital-to-analog converter is provided. The method may include configuring a decoder to address an individual unit cell of a plurality of unit cells of a digital-to-analog converter. The configured decoder may select a particular unit cell of the plurality of unit cells for testing. The selected unit cell may have digital and analog circuitry. A bias current of the selected unit cell may be increased. The increased bias current of the selected unit cell may be greater during the testing than during normal operation. A test logic signal may be applied to the selected unit cell. In response to the test logic signal, an output signal may be output from the selected unit cell logic circuitry of the digital-to-analog converter. A device may include logic circuitry configured to select an individual unit cell for testing and a current generating circuitry.
Abstract:
An image processor unit is described. The image processor unit includes a plurality of inputs to receive at least one input image. The image processor unit includes a plurality of outputs to provide at least one output image. The image processor unit includes a network coupled to the plurality of inputs and the plurality of outputs. The network is to couple at least one of the inputs to at least one of the outputs. The image processor unit includes an image processor circuit coupled to the network. The network to route an input image that is received at one of the inputs to the image processor circuit. The image processor circuit is to execute image signal processing program code to generate a processed output image from the input image. The network is to route the processed output image to at least one of the outputs.
Abstract:
A circuit with a sampling network may include a pair of capacitors, where each of the capacitors has a first node and a second node; a first pair of switches communicatively coupling corresponding differential input voltage signals to the first node of each of the capacitors; and a second pair of switches communicatively coupling the second node of each of the capacitors to a common mode voltage source. Corresponding differential output voltage signals at the second node of each of the capacitors may be communicatively coupled using a differential switch. The second pair of switches may be coupled in parallel with the differential switch. A clock signal of the differential switch may be de-asserted prior to de-asserting corresponding clock signals for each of the second pair of switches.