公开(公告)号：US20180356359A1

公开(公告)日：2018-12-13

申请号：US16107544

申请日：2018-08-21

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： Fen CHEN ,  Jeffrey P. GAMBINO ,  Carole D. GRAAS ,  Wen LIU ,  Prakash PERIASAMY

IPC: G01N27/22 ,  G01R27/26 ,  G01D5/24 ,  H03K17/955

CPC classification number: G01N27/223 ,  G01D5/24 ,  G01R27/2605 ,  H03K17/955

Abstract: Moisture detection and ingression monitoring systems and methods of manufacture are provided. The moisture detection structure includes chip edge sealing structures including at least one electrode forming a capacitor structured to detect moisture ingress within an integrated circuit. The at least one electrode and a second electrode of the capacitor is biased to ground and to a moisture detection circuit or vice versa, respectively.

公开(公告)号：US20200049651A1

公开(公告)日：2020-02-13

申请号：US16655827

申请日：2019-10-17

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： Fen CHEN ,  Jeffrey P. GAMBINO ,  Carole D. GRAAS ,  Wen LIU ,  Prakash PERIASAMY

IPC: G01N27/22 ,  G01R27/26

Abstract: Moisture detection and ingression monitoring systems and methods of manufacture are provided. The moisture detection structure includes chip edge sealing structures including at least one electrode forming a capacitor structured to detect moisture ingress within an integrated circuit. The at least one electrode and a second electrode of the capacitor is biased to ground and to a moisture detection circuit or vice versa, respectively.

公开(公告)号：US20180356358A1

公开(公告)日：2018-12-13

申请号：US16107449

申请日：2018-08-21

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： Fen CHEN ,  Jeffrey P. GAMBINO ,  Carole D. GRAAS ,  Wen LIU ,  Prakash PERIASAMY

IPC: G01N27/22 ,  G01R27/26 ,  G01D5/24 ,  H03K17/955

CPC classification number: G01N27/223 ,  G01D5/24 ,  G01R27/2605 ,  H03K17/955

Abstract: Moisture detection and ingression monitoring systems and methods of manufacture are provided. The moisture detection structure includes chip edge sealing structures including at least one electrode forming a capacitor structured to detect moisture ingress within an integrated circuit. The at least one electrode and a second electrode of the capacitor is biased to ground and to a moisture detection circuit or vice versa, respectively.

公开(公告)号：US20190250116A1

公开(公告)日：2019-08-15

申请号：US16392055

申请日：2019-04-23

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： Fen CHEN ,  Jeffrey P. GAMBINO ,  Carole D. GRAAS ,  Wen LIU ,  Prakash PERIASAMY

IPC: G01N27/22 ,  G01R27/26

CPC classification number: G01N27/223 ,  G01D5/24 ,  G01R27/2605 ,  H03K17/955

Abstract: Moisture detection and ingression monitoring systems and methods of manufacture are provided. The moisture detection structure includes chip edge sealing structures including at least one electrode forming a capacitor structured to detect moisture ingress within an integrated circuit. The at least one electrode and a second electrode of the capacitor is biased to ground and to a moisture detection circuit or vice versa, respectively.

公开(公告)号：US20160327502A1

公开(公告)日：2016-11-10

申请号：US14706322

申请日：2015-05-07

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： Fen CHEN ,  Jeffrey P. GAMBINO ,  Carole D. GRAAS ,  Wen LIU ,  Prakash PERIASAMY

IPC: G01N27/22

CPC classification number: G01N27/223 ,  G01D5/24 ,  G01R27/2605 ,  H03K17/955

Abstract: Moisture detection and ingression monitoring systems and methods of manufacture are provided. The moisture detection structure includes chip edge sealing structures including at least one electrode forming a capacitor structured to detect moisture ingress within an integrated circuit. The at least one electrode and a second electrode of the capacitor is biased to ground and to a moisture detection circuit.

Abstract translation: 提供了水分检测和入侵监测系统及其制造方法。 水分检测结构包括芯片边缘密封结构，其包括形成电容器的至少一个电极，其被构造成检测集成电路内的湿气进入。 电容器的至少一个电极和第二电极被偏压到地和湿度检测电路。