公开(公告)号：US20240312819A1

公开(公告)日：2024-09-19

申请号：US18185427

申请日：2023-03-17

Applicant: Intel Corporation

Inventor： Hong Seung YEON ,  Mariano PHIELIPP ,  Yi LI ,  Minglu LIU ,  Robin McREE ,  Yosuke KANAOKA ,  Gang DUAN

IPC: H01L21/68 ,  H01L21/67

CPC classification number: H01L21/68 ,  H01L21/67259

Abstract: A method for real-time offset adjustment of a semiconductor die placement comprising: obtaining or receiving operational parameters of a die mounting tool in real-time, wherein the die mounting tool is configured for placing the semiconductor die on a panel; predicting an offset adjustment of the semiconductor die placement based on the operational parameters; and determining semiconductor die placement coordinates based on an original die placement and the offset adjustment.

公开(公告)号：US20240078702A1

公开(公告)日：2024-03-07

申请号：US17902907

申请日：2022-09-05

Applicant: Intel Corporation

Inventor： Yi LI ,  Hong Seung YEON ,  Nicholas HAEHN ,  Wei LI ,  Raquel DE SOUZA BORGES FERREIRA ,  Minglu LIU ,  Robin McREE ,  Yosuke KANAOKA ,  Gang DUAN ,  Arnab ROY

IPC: G06T7/73 ,  H01L21/68 ,  H01L23/544

CPC classification number: G06T7/74 ,  H01L21/681 ,  H01L23/544 ,  G06T2207/20081 ,  G06T2207/30204 ,  H01L2223/54426

Abstract: A method for recognizing a reference point associated with a fiducial marker including the steps of: obtaining or receiving image data of the fiducial marker; determining the degree of which the image data of the fiducial marker is aligned with one or more reference images; of which if the degree of alignment is determined to be less than an acceptable threshold predicting a set of coordinates of the reference point associated with the fiducial marker; incorporating the set of coordinates with the image data to form a modified image data; and determining the degree of which the modified image data of the fiducial marker is aligned with one or more reference images.