Abstract:
Apparatus, systems, and methods autonomously detect a chemical plume. The system includes an apparatus for splitting a beam of electromagnetic radiation and feeding the split beam to at least two detectors, which are operably connected to a first bandpass filter and a second bandpass filter that passes a wavelength of electromagnetic radiation that is similar in magnitude but offset from the wavelengths passed by the first bandpass filter. The system further comprises an analysis system configured to analyze images from the at least two detectors, a processor, and a non-transitory, computer-readable medium comprising code configured to direct the processor to perform functions. Exemplary functions include comparing a plurality of deterministic features, a plurality of probabilistic features of objects, or both, from the at least two detectors and determining if a difference between the compared images represents a chemical plume.
Abstract:
Systems and methods for autonomously detecting a chemical plume are described. In a method for autonomously detecting a chemical plume, a plurality of images are obtained from a detection camera at least at a wavelength of light selected to be absorbed or emitted by a chemical species. The plurality of images is analyzed to identify changes in a deterministic feature, changes in a statistical feature, or both, between sequential images. A chemical plume is recognized based, at least in part, on the changes.
Abstract:
A word line driver circuit for a semiconductor memory device. One or more transistors in the driver circuit are fabricated such that they are susceptible, under certain conditions, to gate-induced diode leakage (GIDL). One terminal of the transistors are coupled to a local supply node, which during standby conditions when the word line driver circuit is not driving a word line, is maintained at a voltage less than that of a global power supply node. In one embodiment, the local power supply node is coupled to the global power supply node by means of at least one decoupling transistor receiving a control signal at its gate and by a vt-connected transistor, such that the voltage on the local power supply node is maintained at a level not exceeding one transistor threshold voltage less than the global power supply node voltage when the decoupling transistor is off. When the decoupling transistor(s) is/are switched on prior to word line driving operation, the voltage on the local power supply node rises to the voltage of the global power supply node. Preferably, the control signal(s) controlling the decoupling transistor(s) are, or are derived from, control signals generated for purposes other than controlling the decoupling transistor.
Abstract:
A method for emotional profiling comprises: obtaining, from plural respondents, non-verbal emotional response data, along with verbal responses; grouping the verbal responses according to the non-verbal emotional response data; and reporting the verbal and/or text-based responses by group. An apparatus for emotional profiling comprises: means for obtaining quantitative and/or qualitative emotional response data, along with verbal and/or text-based responses from participants; means for grouping response data and responses according to the quantitative and/or qualitative data; and means for reporting the verbal and/or text-based responses by group.
Abstract:
The subject invention relates to enabling device drivers that support additional functionality that can be enabled to an operating system. A hardware manufacture can claim support for additional functionality in their device drivers, and such functionality can be verified and tagged during driver signing. When a device driver passes a corresponding test, the driver is digitally signed and the signature can include attributes indicating support for that functionality (e.g., features and applications). The systems and methods employ a querying mechanism that can search a device driver package for attributes and expose such attributes. The search can expose both trusted attributes and untrusted device driver properties. Exposed trusted attributes can be selectively enabled to provide corresponding features and/or applications. This can facilitate enabling aspects of hardware when corresponding drivers support such functionality and mitigate enabling an unsupported feature and/or an application. Untrusted properties can be manually enabled, for example, for testing purposes.
Abstract:
A word line driver circuit for a semiconductor memory device. One or more transistors in the driver circuit are fabricated such that they are susceptible, under certain conditions, to gate-induced diode leakage (GIDL). One terminal of the transistors are coupled to a local supply node, which during standby conditions when the word line driver circuit is not driving a word line, is maintained at a voltage less than that of a global power supply node. In one embodiment, the local power supply node is coupled to the global power supply node by means of at least one decoupling transistor receiving a control signal at its gate and by a vt-connected transistor, such that the voltage on the local power supply node is maintained at a level not exceeding one transistor threshold voltage less than the global power supply node voltage when the decoupling transistor is off. When the decoupling transistor(s) is/are switched on prior to word line driving operation, the voltage on the local power supply node rises to the voltage of the global power supply node. Preferably, the control signal(s) controlling the decoupling transistor(s) are, or are derived from, control signals generated for purposes other than controlling the decoupling transistor.
Abstract:
A word line driver circuit for a semiconductor memory device. One or more transistors in the driver circuit are fabricated such that they are susceptible, under certain conditions, to gate-induced diode leakage (GIDL). One terminal of the transistors are coupled to a local supply node, which during standby conditions when the word line driver circuit is not driving a word line, is maintained at a voltage less than that of a global power supply node. In one embodiment, the local power supply node is coupled to the global power supply node by means of at least one decoupling transistor receiving a control signal at its gate and by a vt-connected transistor, such that the voltage on the local power supply node is maintained at a level not exceeding one transistor threshold voltage less than the global power supply node voltage when the decoupling transistor is off. When the decoupling transistor(s) is/are switched on prior to word line driving operation, the voltage on the local power supply node rises to the voltage of the global power supply node. Preferably, the control signal(s) controlling the decoupling transistor(s) are, or are derived from, control signals generated for purposes other than controlling the decoupling transistor.
Abstract:
A gas accumulator for the storage of biogas, comprising three gas-impermeable membranes, the first of which at least partially defines a gas accumulation chamber and the third of which is attached to the second by means of a gas-impermeable seal, such that the second and third membranes together define a gas-impermeable pressurisation chamber, as well as comprising means for pressurising said pressurisation chamber and means for anchoring the gas accumulator to a support surface, characterised in that the anchoring means is configured to anchor only the second membrane to the support surface.
Abstract:
A word line driver circuit for a semiconductor memory device. One or more transistors in the driver circuit are fabricated such that they are susceptible, under certain conditions, to gate-induced diode leakage (GIDL). One terminal of the transistors are coupled to a local supply node, which during standby conditions when the word line driver circuit is not driving a word line, is maintained at a voltage less than that of a global power supply node. In one embodiment, the local power supply node is coupled to the global power supply node by means of at least one decoupling transistor receiving a control signal at its gate and by a vt-connected transistor, such that the voltage on the local power supply node is maintained at a level not exceeding one transistor threshold voltage less than the global power supply node voltage when the decoupling transistor is off. When the decoupling transistor(s) is/are switched on prior to word line driving operation, the voltage on the local power supply node rises to the voltage of the global power supply node. Preferably, the control signal(s) controlling the decoupling transistor(s) are, or are derived from, control signals generated for purposes other than controlling the decoupling transistor.
Abstract:
A word line driver circuit for a semiconductor memory device. One or more transistors in the driver circuit are fabricated such that they are susceptible, under certain conditions, to gate-induced diode leakage (GIDL). One terminal of the transistors are coupled to a local supply node, which during standby conditions when the word line driver circuit is not driving a word line, is maintained at a voltage less than that of a global power supply node. In one embodiment, the local power supply node is coupled to the global power supply node by means of at least one decoupling transistor receiving a control signal at its gate and by a vt-connected transistor, such that the voltage on the local power supply node is maintained at a level not exceeding one transistor threshold voltage less than the global power supply node voltage when the decoupling transistor is off. When the decoupling transistor(s) is/are switched on prior to word line driving operation, the voltage on the local power supply node rises to the voltage of the global power supply node. Preferably, the control signal(s) controlling the decoupling transistor(s) are, or are derived from, control signals generated for purposes other than controlling the decoupling transistor.