公开(公告)号：US20150052770A1

公开(公告)日：2015-02-26

申请号：US14464224

申请日：2014-08-20

Applicant: MITUTOYO CORPORATION

Inventor： Takashi NODA ,  Hiroshi KAMITANI ,  Tomohiro USUI

IPC: G01B5/012

CPC classification number: G01B5/012 ,  G01B5/008 ,  G01B21/042 ,  G01C25/00

Abstract: A form measuring apparatus includes a probe for measuring a measured object; a rotary table on which the measured object is placed; and a coordinate system calculator calculating coordinate axes configuring a coordinate system for the rotary table. The coordinate system calculator calculates, based on a position of a master ball fixated to the rotary table, a center of a circle traced by the master ball when the rotary table is rotated; calculates a rotary table coordinate system having the center of the circle as an origin point; and corrects coordinates of the origin point based on a calibrated diameter value of a gauge fixated to the rotary table, a first diameter value of the gauge measured by a first measurement in which the probe approaches the gauge in a first direction, and a second diameter value of the gauge measured by a second measurement.

Abstract translation: 一种形状测量装置，包括用于测量被测物体的探针; 放置测量对象的旋转台; 以及坐标系计算器，计算构成旋转台的坐标系的坐标轴。 坐标系计算器基于旋转台上固定的主球的位置，计算旋转台旋转时由主球跟踪的圆的中心; 计算以圆的中心为起点的旋转台坐标系; 并且基于固定到所述旋转台的所述校准直径值来校正所述原点的坐标，所述量规的第一直径值是通过所述探针在第一测量中测量的，其中所述探针在第一方向上接近所述量规，并且所述第二直径 通过第二次测量测量的量规的值。

公开(公告)号：US20130310962A1

公开(公告)日：2013-11-21

申请号：US13893864

申请日：2013-05-14

Applicant: MITUTOYO CORPORATION

Inventor： Takashi NODA ,  Hiromi DEGUCHI

IPC: G05B19/04

CPC classification number: G05B19/041 ,  G01B21/04 ,  G05B19/401 ,  G05B2219/37043 ,  G05B2219/37374 ,  G05B2219/37411 ,  Y02P90/265

Abstract: A shape measuring apparatus includes: a probe having a stylus tip; a movable mechanism configured to move the stylus tip; an information acquiring unit configured to acquire design information of a workpiece; a path setting unit configured to set a path of the stylus tip; a path component calculating section configured to calculate a path velocity vector; a push direction component calculating section configured to detect a deflection, and calculate a push correction vector; a locus correction component calculating section configured to detect an amount and a direction of locus deviation of the probe from the path, and calculate a locus correction vector; a velocity synthesizing section configured to calculate a velocity synthesis vector by combining the path velocity vector, the push correction vector, and the locus correction vector; and a drive control unit configured to move the probe according to the velocity synthesis vector.

Abstract translation: 一种形状测量装置，包括：具有触针尖的探针; 移动机构，其构造成移动所述触针尖; 信息获取单元，被配置为获取工件的设计信息; 路径设置单元，被配置为设置触控笔尖的路径; 路径分量计算部，被配置为计算路径速度矢量; 推动方向分量计算部，被配置为检测偏转，并计算推压校正矢量; 轨迹校正分量计算部，被配置为从所述路径检测所述探测器的轨迹偏离的量和方向，并计算轨迹校正矢量; 速度合成部，被配置为通过组合路径速度矢量，推压校正矢量和轨迹校正矢量来计算速度合成矢量; 以及驱动控制单元，被配置为根据速度合成向量移动探针。

公开(公告)号：US20160341533A1

公开(公告)日：2016-11-24

申请号：US15141145

申请日：2016-04-28

Applicant: MITUTOYO CORPORATION

Inventor： Takashi NODA

IPC: G01B5/008

CPC classification number: G01B5/008 ,  G05B19/401 ,  G05B2219/35066 ,  G05B2219/37193 ,  G05B2219/37205 ,  G05B2219/37206 ,  G05B2219/37443 ,  G05B2219/37449 ,  G05B2219/50063 ,  Y02P90/265

Abstract: There is provided a method for controlling a shape measuring apparatus which continues to perform nominal scanning measurement to a workpiece having a slightly large deviation from a design data. A scanning path to move a stylus tip is calculated based on design data of a workpiece. The stylus tip is moved along the scanning path. It is monitored whether a distance between the scanning path and an actual workpiece is excessive. When the distance between the scanning path and the actual workpiece is excessive, a trajectory difference error is generated. When the trajectory difference error is generated, geometric correction is performed to the design data so that the design data approaches to the actual workpiece. Scanning measurement is performed based on the design data after the geometric correction.

Abstract translation: 提供了一种用于控制形状测量装置的方法，该形状测量装置继续对具有与设计数据稍微偏离的工件进行标称扫描测量。 基于工件的设计数据计算移动触笔尖的扫描路径。 触针尖端沿着扫描路径移动。 监视扫描路径和实际工件之间的距离是否过大。 当扫描路径和实际工件之间的距离过大时，产生轨迹差异误差。 当产生轨迹差异误差时，对设计数据进行几何校正，使得设计数据接近实际工件。 基于几何校正后的设计数据执行扫描测量。

公开(公告)号：US20160356591A1

公开(公告)日：2016-12-08

申请号：US15158800

申请日：2016-05-19

Applicant: MITUTOYO CORPORATION

Inventor： Takashi NODA ,  Hiromi DEGUCHI ,  Naoya KIKUCHI

IPC: G01B3/00 ,  G06F3/0484 ,  G06F3/0481 ,  G01B5/20

CPC classification number: G01B3/002 ,  G01B5/008 ,  G01B5/20 ,  G05B2219/37193 ,  G05B2219/37449 ,  G05B2219/37452 ,  G06F3/04817 ,  G06F3/04842

Abstract: A method for nominal scanning measurement includes allowing a user to select a shape of an object to be measured from a geometric shape menu prepared in advance, allowing the user to input, according to the selected geometric shape, a parameter to specify the geometric shape, allowing the user to select a measurement path from a measurement path menu prepared in advance, allowing the user to input, according to the selected measurement path, a parameter to specify the measurement path, calculating, based on the selected geometric shape, the input parameter of the geometric shape, the selected measurement path, and the input parameter of the measurement path, measurement points on a workpiece and a normal line direction at each of measurement points using a calculation formula prepared in advance, and calculating a path for scanning measurement to move while scanning a sequence of the measurement points.

Abstract translation: 用于标称扫描测量的方法包括允许用户从预先准备的几何形状菜单中选择要测量对象的形状，允许用户根据所选择的几何形状输入指定几何形状的参数， 允许用户从预先准备的测量路径菜单中选择测量路径，允许用户根据所选择的测量路径输入参数以指定测量路径，基于所选择的几何形状来计算输入参数 使用预先准备的计算公式计算测量轨迹的几何形状，所选择的测量路径以及测量路径的输入参数，工件上的测量点和每个测量点的法线方向，并且计算用于扫描测量的路径 扫描测量点序列时移动。

公开(公告)号：US20140025336A1

公开(公告)日：2014-01-23

申请号：US13941880

申请日：2013-07-15

Applicant: Mitutoyo Corporation

Inventor： Takashi NODA ,  Hiromi DEGUCHI

IPC: G01B5/008

CPC classification number: G01B5/008 ,  G01B5/20 ,  G01B21/042 ,  G01B21/20 ,  G05B11/01 ,  G06F17/40 ,  G06F19/00

Abstract: A control method of a shape measuring apparatus divides a curve indicating a movement path of a probe into a plurality of sections. A measurement target section is selected from the plurality of sections sequentially from a starting point side of the curve indicating the movement path of the probe. A first curvature radius is calculated from a curvature of the measurement target section. A second curvature radius is calculated according to an angle between a first straight line connecting a starting point to an ending point of the measurement target section and a second straight line connecting a starting point to an ending point of a section next to the measurement target section. A smaller value from among the first curvature radius and the second curvature radius is set as an effective radius. A maximum speed of probe movement increasing according to an increase in the effective radius is calculated for the measurement target section.

Abstract translation: 形状测量装置的控制方法将指示探针的移动路径的曲线分成多个部分。 从指示探针的移动路径的曲线的起始点依次从多个部分中选择测量对象部分。 从测量对象部分的曲率计算第一曲率半径。 根据连接起始点到测量对象部分的终点的第一直线与将测量目标部分的下一个部分的起点连接到终点的第二直线来计算第二曲率半径 。 将第一曲率半径和第二曲率半径之间的较小值设定为有效半径。 针对测量目标部分计算探头移动的最大速度根据有效半径的增加而增加。

公开(公告)号：US20180149458A1

公开(公告)日：2018-05-31

申请号：US15819274

申请日：2017-11-21

Applicant: MITUTOYO CORPORATION

Inventor： Takashi NODA ,  Hiromi DEGUCHI

IPC: G01B5/008

Abstract: A scanning path is divided after every predetermined number of segments and a set of measurement commands is defined for each of the predetermined number of segments. While executing the measurement command, a speed pattern plan is created for the following measurement command. At this time, planning is conducted such that a final speed of a speed pattern plan of the measurement command is the same as an initial speed of the speed pattern plan of the following measurement command. While executing the measurement command, a gap time (from a current time to an estimated end time of the measurement command) is calculated continuously. When the gap time is longer than a planning calculation time, the initial speed of the speed pattern plan of the following measurement command is kept the same as the final speed of the speed pattern plan of the measurement command.

公开(公告)号：US20180017954A1

公开(公告)日：2018-01-18

申请号：US15638932

申请日：2017-06-30

Applicant: MITUTOYO CORPORATION

Inventor： Takashi NODA ,  Hiromi DEGUCHI ,  Norihiko MURATA

IPC: G05B19/401 ,  G01B21/20 ,  G01B5/008 ,  G05B19/04 ,  G01B21/04

CPC classification number: G05B19/401 ,  G01B5/008 ,  G01B21/04 ,  G01B21/042 ,  G01B21/20 ,  G05B19/041 ,  G05B2219/37043 ,  G05B2219/37374 ,  G05B2219/37411 ,  Y02P90/265

Abstract: A probe displacement command in a scanning measurement is generated according to a composite speed vector V: V=Gf·Vf+Ge·Ve+sp(p)·Gc·Vc2 wherein Vf is a vector along which a probe is displaced along a scanning path, Ve is a vector maintaining a deflection amount of the probe toward a work piece at a standard deflection amount. Vc2 is represented by (Vc1·q)q, Vc1 is a vector in a direction correcting a probe position such that a stylus tip is oriented along a scanning course, q is a vector given by a vector product of the normal line of a surface of the work piece and Vf, The normal direction of a measured surface is designated as Nw, p is a scalar product of Vc2 and Nw, and sg(p) is a function returning +1 or −1 in accordance with a value of p.

公开(公告)号：US20150052769A1

公开(公告)日：2015-02-26

申请号：US14464184

申请日：2014-08-20

Applicant: MITUTOYO CORPORATION

Inventor： Takashi NODA ,  Hiroshi KAMITANI ,  Kazumi MIZUKAMI

IPC: G01B5/008

CPC classification number: G01B5/008 ,  G01B5/204 ,  G01B21/047

Abstract: Controller executes a first scanning control, causing a driver to move a probe such that a tip scans along an inclined surface of a V groove to approach a center of the V groove, and a second scanning control, causing the driver to move the probe such that the tip scans along the inclined surface of the V groove to approach the center of the V groove from a side opposite that of the first scanning control. Angle calculator calculates an angle created between a direction of a deflection vector of the probe and a predetermined direction. Threshold value-correspondent coordinate obtainer obtains coordinates of the tip where the angle has changed to exceed a first threshold value during execution of the first scanning control and obtains coordinates of the tip where the angle has changed to exceed a second threshold value during execution of the second scanning control.

Abstract translation: 控制器执行第一扫描控制，使得驾驶员移动探头，使得尖端沿着V槽的倾斜表面扫描以接近V槽的中心;以及第二扫描控制，使得驾驶员将探针移动到 尖端沿着V槽的倾斜表面扫描以从与第一扫描控制的相反侧接近V槽的中心。 角度计算器计算在探针的偏转矢量的方向和预定方向之间产生的角度。 阈值对应坐标获取器在执行第一扫描控制期间获得角度已经改变的尖端的坐标超过第一阈值，并且在执行第一扫描控制期间获得角度已经改变的尖端的坐标超过第二阈值 第二扫描控制。

公开(公告)号：US20180216924A1

公开(公告)日：2018-08-02

申请号：US15873178

申请日：2018-01-17

Applicant: MITUTOYO CORPORATION

Inventor： Takashi NODA

IPC: G01B5/016 ,  G01B21/04 ,  G01B5/20

CPC classification number: G01B5/016 ,  G01B5/008 ,  G01B5/012 ,  G01B5/20 ,  G01B21/045 ,  G01B21/047

Abstract: A shape measuring apparatus includes a probe head that changes its posture by rotational motion of a first drive axis and a second drive axis, and a coordinate measuring machine that three-dimensionally displaces a location of the probe head by three translation axes (a third drive axis, a fourth drive axis, and a fifth drive axis). The location of a measurement tip is given by coordinate values of the third to fifth drive axes, and the posture of a probe head is given by a first rotating angle α and a second rotating angle β. An intersection point between a first rotation axis and a second rotation axis is set as a rotation center Q. An interpolation point in each control period is calculated for each of the first to fifth drive axes.

公开(公告)号：US20170115109A1

公开(公告)日：2017-04-27

申请号：US15275985

申请日：2016-09-26

Applicant: MITUTOYO CORPORATION

Inventor： Takashi NODA ,  Hiromi DEGUCHI

IPC: G01B5/012 ,  G01B5/20

CPC classification number: G01B5/012 ,  G01B5/20 ,  G01B21/04

Abstract: During a retraction where a stylus tip separates from a work piece from a state where the stylus tip and the work piece are in contact, whether there is contact between the stylus tip and the work piece is monitored. When the contact between the stylus tip and the work piece is detected during the retraction, a probe is displaced to a position where the stylus tip does not come in contact with the work piece and a recovery process is executed. When a distance between a point on a surface of the work piece at a retraction start point and a contact point between the stylus tip and the work piece is Lm, and a value defined by (Lm−d) multiplied by a coefficient k (0