-
公开(公告)号:US20220238684A1
公开(公告)日:2022-07-28
申请号:US17158918
申请日:2021-01-26
Applicant: Micron Technology, Inc.
Inventor: Michael A. Lindemann , Collin Howder , Yoshiaki Fukuzumi , Richard J. Hill
IPC: H01L29/45 , H01L27/1157 , H01L27/11582 , H01L29/792 , H01L21/28 , H01L29/417
Abstract: Electronic devices comprising a doped dielectric material adjacent to a source contact, tiers of alternating conductive materials and dielectric materials adjacent to the doped dielectric material, and pillars extending through the tiers, the doped dielectric material, and the source contact and into the source stack. Related methods and electronic systems are also disclosed.
-
2.
公开(公告)号:US20240162325A1
公开(公告)日:2024-05-16
申请号:US18421820
申请日:2024-01-24
Applicant: Micron Technology, Inc.
Inventor: Michael A. Lindemann , Collin Howder , Yoshiaki Fukuzumi , Richard J. Hill
IPC: H01L29/45 , H01L21/28 , H01L29/417 , H01L29/792 , H10B43/27 , H10B43/35
CPC classification number: H01L29/458 , H01L29/40117 , H01L29/41725 , H01L29/792 , H10B43/27 , H10B43/35
Abstract: Electronic devices comprising a doped dielectric material adjacent to a source contact, tiers of alternating conductive materials and dielectric materials adjacent to the doped dielectric material, and pillars extending through the tiers, the doped dielectric material, and the source contact and into the source stack. Related methods and electronic systems are also disclosed.
-
公开(公告)号:US11948992B2
公开(公告)日:2024-04-02
申请号:US17158918
申请日:2021-01-26
Applicant: Micron Technology, Inc.
Inventor: Michael A. Lindemann , Collin Howder , Yoshiaki Fukuzumi , Richard J. Hill
IPC: H01L29/45 , H01L29/417 , H01L29/792 , H01L21/28 , H10B43/27 , H10B43/35
CPC classification number: H01L29/458 , H01L29/40117 , H01L29/41725 , H01L29/792 , H10B43/27 , H10B43/35
Abstract: Electronic devices comprising a doped dielectric material adjacent to a source contact, tiers of alternating conductive materials and dielectric materials adjacent to the doped dielectric material, and pillars extending through the tiers, the doped dielectric material, and the source contact and into the source stack. Related methods and electronic systems are also disclosed.
-
-