公开(公告)号：US20240421920A1

公开(公告)日：2024-12-19

申请号：US18741251

申请日：2024-06-12

Applicant: NXP B.V.

Inventor： Zahran Hajji ,  Ayoub Rifai ,  Thierry Mesnard ,  Florent Jérémy Alexis Cilici

IPC: H04B17/19 ,  H04B17/10

Abstract: A method includes techniques for identifying the phase step of one transmitter while conducting phase difference measurements between two transmitters in a multi-transmitter radar device. The method includes setting a first phase of a first transmitter in the multi-transmitter device to a fixed phase value and setting a second phase of a second transmitter in the multi-transmitter device to an initial phase value, varying the second phase of the second transmitter from the initial phase value to a final phase value and performing a sample measurement at each variation to obtain a plurality of intermediate frequency (IF) samples; and transforming the plurality of IF samples into complex samples. The method then includes determining one or more phase steps of the second transmitter based on the complex samples.

公开(公告)号：US12174253B2

公开(公告)日：2024-12-24

申请号：US18124406

申请日：2023-03-21

Applicant: NXP B.V.

Inventor： Cristian Pavao Moreira ,  Thierry Mesnard ,  Michiel Alexander Hallie

IPC: G01R31/3183 ,  G01R31/319

Abstract: An electronic device includes a bias generator to generate a plurality of bias currents and a testing module to test the bias generator by successively testing each subset of bias currents of a plurality of subsets of bias currents grouped from the plurality of bias currents as a corresponding single test current. The testing module can include a variable resistor, wherein the testing module is to test the bias generator by, for each subset of bias currents, configuring the variable resistor to have a corresponding resistance based on the number of bias currents represented in the subset, conducting a corresponding test current through the variable resistor configured to the corresponding resistance, the test current representing a combination of all bias currents of the corresponding subset, and determining a test status for the subset of bias currents based on a voltage across the variable resistor resulting from the corresponding test current.

公开(公告)号：US20240077578A1

公开(公告)日：2024-03-07

申请号：US18461673

申请日：2023-09-06

Applicant: NXP B.V.

Inventor： Cristian Pavao Moreira ,  Thierry Mesnard ,  Andres Barrilado Gonzalez ,  Mohamed Boulkheir ,  Didier Salle

IPC: G01S7/03 ,  G01S7/282 ,  G01S13/02 ,  G01S13/536

CPC classification number: G01S7/032 ,  G01S7/282 ,  G01S13/0209 ,  G01S13/536

Abstract: A system and method for a radar system are provided. The radar system includes a leader radar device that includes a first clock generation circuit configured to generate a first clock signal, and a first transmitter and receiver configured to transmit and receive radar signals using a first local oscillator signal. The system includes a follower radar device. The follower radar device is configured to receive the first clock signal and the first local oscillator signal from the leader radar device. The follower radar device includes a second clock generation circuit configured to generate a second clock signal, wherein, in a default operational mode of the radar system at least a portion of the second clock generation circuit is disabled, and a second transmitter and receiver configured to transmit and receive first radar signals.

公开(公告)号：US20240125897A1

公开(公告)日：2024-04-18

申请号：US18483770

申请日：2023-10-10

Applicant: NXP B.V.

Inventor： Cristian Pavao Moreira ,  Matthias Rose ,  Thierry Mesnard

IPC: G01S7/40 ,  G01S7/03

CPC classification number: G01S7/40 ,  G01S7/032

Abstract: An integrated circuit (IC) includes circuitry in a plurality of power domains for transmitting and/or receiving radar chirp frames and first and second monitoring systems for monitoring supply voltages of a first and a second subset of the plurality of power domains, respectively. The first subset is monitored outside of a time window during which a chirp frame is transmitted and/or received utilizing circuitry of the IC, and the second subset is monitored during the time window. The first monitoring system includes an output for an error signal indicating a supply voltage in the first subset does not comply with a first voltage parameter. The second monitoring system includes a unique monitoring circuit for each power domain in the second subset, and each unique monitoring circuit includes an output for an error signal indicating a supply voltage in the second subset does not comply with a second voltage parameter.

公开(公告)号：US20230333161A1

公开(公告)日：2023-10-19

申请号：US18124406

申请日：2023-03-21

Applicant: NXP B.V.

Inventor： Cristian Pavao Moreira ,  Thierry Mesnard ,  Michiel Alexander Hallie

IPC: G01R31/3183 ,  G01R31/319

CPC classification number: G01R31/3183 ,  G01R31/31924

Abstract: An electronic device includes a bias generator to generate a plurality of bias currents and a testing module to test the bias generator by successively testing each subset of bias currents of a plurality of subsets of bias currents grouped from the plurality of bias currents as a corresponding single test current. The testing module can include a variable resistor, wherein the testing module is to test the bias generator by, for each subset of bias currents, configuring the variable resistor to have a corresponding resistance based on the number of bias currents represented in the subset, conducting a corresponding test current through the variable resistor configured to the corresponding resistance, the test current representing a combination of all bias currents of the corresponding subset, and determining a test status for the subset of bias currents based on a voltage across the variable resistor resulting from the corresponding test current.