MAGNETIC MATERIAL FOR HIGH FREQUENCY USE, AND METHOD FOR PRODUCING SAME

    公开(公告)号:US20240186037A1

    公开(公告)日:2024-06-06

    申请号:US18277339

    申请日:2022-03-22

    CPC classification number: H01F1/059

    Abstract: The present invention addresses the problem of providing: a novel magnetic material for high frequency use, the magnetic material solving problems such as eddy current loss since the magnetic material has higher electrical resistivity than metal magnetic materials, while having higher magnetic permeability than ferrite magnetic materials; and a method for producing this magnetic material for high frequency use.
    The present invention uses a rare earth-iron-M-nitrogen magnetic material (wherein M represents at least one element that is selected from among Ti, V, Mo, Nb, W, Si, Al, Mn and Cr) which is a nitride magnetic material that has a controlled crystal structure and a controlled composition.

    ORIENTATION DEGREE DISTRIBUTION CALCULATION METHOD, ORIENTATION DEGREE DISTRIBUTION ANALYZER, AND ORIENTATION DEGREE DISTRIBUTION ANALYSIS PROGRAM

    公开(公告)号:US20220291153A1

    公开(公告)日:2022-09-15

    申请号:US17638434

    申请日:2020-08-11

    Abstract: An orientation degree distribution analysis method of the present invention includes steps of: inputting crystal structure information of an object to be measured, information on an intensity ratio of each diffraction peak and a crystal plane corresponding to each diffraction peak by X-ray diffraction measurement, information on a diffraction range and diffraction sensitivity, and an intensity ratio of each diffraction peak of a randomly oriented sample to a main storage device; calculating an angle formed by an orientation plane and a crystal plane corresponding to the diffraction peak of interest from the information stored in the main storage device in the step; calculating an existence ratio and storing the existence ratio in the main storage device; setting an orientation degree distribution function; and calculating an orientation degree distribution from the information of the input step and the calculation step. As a result, there are provided a method of easily calculating an orientation degree distribution from an X-ray diffraction profile by using an information processing apparatus and a calculation program without requiring complicated pretreatment of a sample as in an EBSD method, and a method of obtaining a spatial map of the orientation degree distribution from a plurality of diffraction intensity maps obtained by using a micro-focal X-ray.

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