公开(公告)号：US20160351524A1

公开(公告)日：2016-12-01

申请号：US14727842

申请日：2015-06-01

Applicant: Novatek Microelectronics Corp.

Inventor： Yu-Chang Pai ,  Chien-Hsi Lee

IPC: H01L23/00

CPC classification number: H01L24/48 ,  H01L24/05 ,  H01L24/06 ,  H01L2224/05553 ,  H01L2224/0612 ,  H01L2924/00014 ,  H01L2924/14 ,  H01L2224/45099 ,  H01L2224/05599 ,  H01L2224/85399

Abstract: An integrated circuit is provided. The integrated circuit includes first pads and second pads. The first pads are used to receive a first type signal, and the second pads are used to receive a second type signal which is different from the first type signal. The first and second pads are alternately disposed on the integrated circuit, and form pad rows. Each of the pad rows has a part of the first pads and a part of the second pads. Each of the first pads directly neighbors with a plurality of neighboring pads of the second pads.

Abstract translation: 提供集成电路。 集成电路包括第一焊盘和第二焊盘。 第一焊盘用于接收第一类型信号，并且第二焊盘用于接收与第一类型信号不同的第二类型信号。 第一和第二焊盘交替地设置在集成电路上，并形成焊盘行。 每个垫排具有第一垫的一部分和第二垫的一部分。 每个第一焊盘与第二焊盘的多个相邻焊盘直接相邻。

公开(公告)号：US20170077927A1

公开(公告)日：2017-03-16

申请号：US14854032

申请日：2015-09-14

Applicant: NOVATEK Microelectronics Corp.

Inventor： Chien-Hsi Lee ,  Yao-Cheng Chuang

IPC: H03K19/00

CPC classification number: H03K19/0005

Abstract: A resistance calibration method for a first resistor of a first module includes performing resistance calibration on a calibration unit of a second module, wherein the first module is connected to the second module via a pad coupled to the first resistor and the calibration unit is coupled to the pad; obtaining a resistance value of the calibration unit after the resistance calibration; and calibrating a resistance value of the first resistor according to the resistance value of the calibration unit.

Abstract translation: 用于第一模块的第一电阻器的电阻校准方法包括在第二模块的校准单元上执行电阻校准，其中第一模块经由耦合到第一电阻器的焊盘连接到第二模块，并且校准单元耦合到 垫子 在电阻校准之后获得校准单元的电阻值; 以及根据校准单元的电阻值校准第一电阻器的电阻值。

公开(公告)号：US09608632B1

公开(公告)日：2017-03-28

申请号：US14854032

申请日：2015-09-14

Applicant: NOVATEK Microelectronics Corp.

Inventor： Chien-Hsi Lee ,  Yao-Cheng Chuang

IPC: H03K19/003 ,  H03K19/00 ,  G11C7/10

CPC classification number: H03K19/0005

Abstract: A resistance calibration method for a first resistor of a first module includes performing resistance calibration on a calibration unit of a second module, wherein the first module is connected to the second module via a pad coupled to the first resistor and the calibration unit is coupled to the pad; obtaining a resistance value of the calibration unit after the resistance calibration; and calibrating a resistance value of the first resistor according to the resistance value of the calibration unit.