ENDOSCOPE AND IMAGE PICKUP APPARATUS
    2.
    发明申请

    公开(公告)号:US20200054190A1

    公开(公告)日:2020-02-20

    申请号:US16662599

    申请日:2019-10-24

    Inventor: Kazuhiro YOSHIDA

    Abstract: An endoscope includes an image pickup apparatus, and the image pickup apparatus includes an imager includes an external electrode, a stacked device, a top electrode on a top surface, and a bottom electrode on a bottom surface, a three-dimensional wiring board having a first zone to which the external electrode is bonded, a second zone to which the top electrode or the bottom electrode is bonded, a third zone to which the top electrode or the bottom electrode is bonded, and a fifth zone arranged on a side surface of the stacked device, wherein the top surface, the bottom surface, and at least two side surfaces of the stacked device are covered with the wiring board.

    IMAGE PICKUP APPARATUS AND ENDOSCOPE
    3.
    发明申请

    公开(公告)号:US20170317130A1

    公开(公告)日:2017-11-02

    申请号:US15652833

    申请日:2017-07-18

    Inventor: Kazuhiro YOSHIDA

    Abstract: An image pickup apparatus includes a silicon layer, a wire layer that contains an insulator having a lower dielectric constant than silicon oxide, a cover glass that covers a light receiving portion on a light receiving surface of the silicon layer, and a silicon substrate that covers a back surface of the wire layer, in which a guard ring is formed along an outer edge on the wire layer, a through-hole having a bottom surface that is configured by an electrode pad configured by a conductor of the wire layer and having an outer periphery portion in contact with the silicon layer over a whole periphery is provided in a region of the silicon layer that is not covered with the cover glass, and the insulator of the wire layer is not exposed to an inner surface of the through-hole.

    IMAGE PICKUP APPARATUS, ENDOSCOPE, SEMICONDUCTOR APPARATUS, AND MANUFACTURING METHOD OF SEMICONDUCTOR APPARATUS
    5.
    发明申请
    IMAGE PICKUP APPARATUS, ENDOSCOPE, SEMICONDUCTOR APPARATUS, AND MANUFACTURING METHOD OF SEMICONDUCTOR APPARATUS 审中-公开
    图像拾取装置,内窥镜,半导体装置和半导体装置的制造方法

    公开(公告)号:US20150228678A1

    公开(公告)日:2015-08-13

    申请号:US14691920

    申请日:2015-04-21

    Abstract: An image pickup apparatus includes: an image pickup device chip that has junction terminals, which is connected with an image pickup unit, on a reverse surface; a cable having lead wires connected with the image pickup unit; and a wiring board that includes junction electrodes joined to the junction terminals, terminal electrodes connected with the lead wires, wirings that connect the junction electrodes formed at a central portion and the terminal electrodes formed at extending portions, and a heat transmission pattern formed in a region where the junction electrodes, the terminal electrodes and the wirings are not formed, the extending portions being bent and thereby the wiring board being arranged within a projected plane of the image pickup device chip.

    Abstract translation: 图像拾取装置包括:在反面上具有与图像拾取单元连接的接合端子的图像拾取器件芯片; 具有与图像拾取单元连接的引线的电缆; 以及布线板,其包括接合到接线端子的接合电极,与引线连接的端子电极,连接形成在中心部分的接合电极的布线和形成在延伸部分的端子电极的布线,以及形成在引线 没有形成接合电极,端子电极和布线的区域,延伸部分被弯曲,从而布线板被布置在图像拾取器件芯片的投影平面内。

    IMAGE PICKUP UNIT FOR ENDOSCOPE AND ENDOSCOPE

    公开(公告)号:US20190175003A1

    公开(公告)日:2019-06-13

    申请号:US16276873

    申请日:2019-02-15

    Abstract: An image pickup unit for endoscope includes: an image pickup portion having a rectangular parallelepiped shape on which a plurality of semiconductor devices including a first semiconductor device and a second semiconductor device are stacked, the image pickup portion including an image pickup device, a device stack bonded to a rear surface of the image pickup device, and a reinforcing member formed by resin covering an outer peripheral surface of the device stack; and a signal cable connected to the image pickup portion, in which: the first semiconductor device on a rear end side is smaller than the second semiconductor device on an image pickup device side; and the reinforcing member has a thickness on the rear end side that is thicker than a thickness on the image pickup device side.

    IMAGE PICKUP APPARATUS, SEMICONDUCTOR APPARATUS, AND IMAGE PICKUP UNIT
    7.
    发明申请
    IMAGE PICKUP APPARATUS, SEMICONDUCTOR APPARATUS, AND IMAGE PICKUP UNIT 审中-公开
    图像拾取装置,半导体装置和图像拾取装置

    公开(公告)号:US20150085094A1

    公开(公告)日:2015-03-26

    申请号:US14556831

    申请日:2014-12-01

    Abstract: An image pickup apparatus includes: an image pickup chip including a light receiving section and electrode pads, on a first main face, and a plurality of connection electrodes, each of which is connected to each of the electrode pads via each of a plurality of through-hole interconnections, on a second main face; a transparent cover glass having a larger plan-view dimension than the image pickup chip; a transparent adhesive layer that bonds the first main face of the image pickup chip and the cover glass; and a sealing member that covers a side face of the image pickup chip and a side face of the adhesive layer, and is made of an insulating material having a same plan-view dimension as the cover glass.

    Abstract translation: 一种图像拾取装置包括:图像拾取芯片,包括在第一主面上的光接收部分和电极焊盘以及多个连接电极,每个连接电极通过多个通孔中的每一个连接到每个电极焊盘 在第二主面上的孔互连; 具有比图像拾取芯片更大的平面视图尺寸的透明盖玻璃; 将图像拾取芯片的第一主面和盖玻璃接合的透明粘合剂层; 以及覆盖图像拾取芯片的侧面和粘合剂层的侧面的密封构件,并且由具有与盖玻璃相同的平面尺寸的绝缘材料制成。

    IMAGEING DEVICE AND ENDOSCOPE
    9.
    发明申请

    公开(公告)号:US20180296076A1

    公开(公告)日:2018-10-18

    申请号:US15960766

    申请日:2018-04-24

    Inventor: Kazuhiro YOSHIDA

    Abstract: An imaging apparatus includes: a lens unit in which a plurality of optical elements including one or more wafer-level lenses and a spacer are laminated; an imaging element configured to receive light incident from the lens unit, perform photoelectric conversion on the light, and generate an image signal; and a moisture-proof member that is bent and arranged so as to come in contact with at least a part of side surfaces of the lens unit to prevent moisture from entering a gap between the optical element and the spacer and/or a gap between the optical elements.

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