公开(公告)号：US20160218735A1

公开(公告)日：2016-07-28

申请号：US14606837

申请日：2015-01-27

Applicant: OmniVision Technologies, Inc.

Inventor： Sindre Mikkelsen ,  Tore Martinussen

IPC: H03M1/46 ,  H04N9/04 ,  H04N5/3745 ,  H03M1/18 ,  H04N5/378

CPC classification number: H04N9/045 ,  H03M1/1295 ,  H03M1/468 ,  H04N5/37455 ,  H04N5/378

Abstract: A method of implementing extended range successive approximation analog-to-digital converter (ADC) starts with a readout circuitry acquiring an image data from a row in a color pixel array. ADC circuitry in the readout circuitry then generates an ADC pedestal for the row. Successive Approximation Register (SAR) included in ADC circuitry then stores ADC pedestal. SAR includes a plurality of bits and an additional bit that is a duplicate of one of the plurality of bits. ADC circuitry samples the image data from the row against ADC pedestal stored in SAR to obtain a sampled input data. ADC circuitry then converts the sampled input data from analog to digital to obtain an ADC output value. Other embodiments are described.

Abstract translation: 实现扩展范围逐次逼近模数转换器（ADC）的方法从读出电路开始，该读出电路从彩色像素阵列中的行获取图像数据。 读出电路中的ADC电路然后为该行生成ADC基座。 ADC电路中的逐次逼近寄存器（SAR）然后存储ADC基座。 SAR包括多个比特和与多个比特之一重复的附加比特。 ADC电路从存储在SAR中的ADC基座上对来自行的图像数据进行采样，以获得采样的输入数据。 ADC电路然后将采样的输入数据从模拟转换为数字，以获得ADC输出值。 描述其他实施例。

公开(公告)号：US09391632B1

公开(公告)日：2016-07-12

申请号：US14606837

申请日：2015-01-27

Applicant: OmniVision Technologies, Inc.

Inventor： Sindre Mikkelsen ,  Tore Martinussen

IPC: H04N5/378 ,  H03M1/46 ,  H03M1/18 ,  H04N5/3745 ,  H04N9/04 ,  H04N5/374

CPC classification number: H04N9/045 ,  H03M1/1295 ,  H03M1/468 ,  H04N5/37455 ,  H04N5/378

Abstract: A method of implementing extended range successive approximation analog-to-digital converter (ADC) starts with a readout circuitry acquiring an image data from a row in a color pixel array. ADC circuitry in the readout circuitry then generates an ADC pedestal for the row. Successive Approximation Register (SAR) included in ADC circuitry then stores ADC pedestal. SAR includes a plurality of bits and an additional bit that is a duplicate of one of the plurality of bits. ADC circuitry samples the image data from the row against ADC pedestal stored in SAR to obtain a sampled input data. ADC circuitry then converts the sampled input data from analog to digital to obtain an ADC output value. Other embodiments are described.

Abstract translation: 实现扩展范围逐次逼近模数转换器（ADC）的方法从读出电路开始，该读出电路从彩色像素阵列中的行获取图像数据。 读出电路中的ADC电路然后为该行生成ADC基座。 ADC电路中的逐次逼近寄存器（SAR）然后存储ADC基座。 SAR包括多个比特和与多个比特之一重复的附加比特。 ADC电路从存储在SAR中的ADC基座上对来自行的图像数据进行采样，以获得采样的输入数据。 ADC电路然后将采样的输入数据从模拟转换为数字，以获得ADC输出值。 描述其他实施例。

公开(公告)号：US11233968B2

公开(公告)日：2022-01-25

申请号：US17069330

申请日：2020-10-13

Applicant: OmniVision Technologies, Inc.

Inventor： Oyvind Janbu ,  Tore Martinussen

IPC: H04N5/357 ,  H04N5/225 ,  H03M1/46 ,  H03M1/12 ,  H04N5/378 ,  H04N5/374

Abstract: A CMOS image sensor comprises an array of pixels. A column of the pixel array is coupled to a readout column. The readout column is couple to a readout circuitry (RC) that reads out image data from the pixel array. The RC comprises a sampling switch which is coupled to a 1-column successive approximation register (SAR) analog-to-digital converter (ADC). The 1-column SAR ADC comprises a differential comparator, a local SAR control, and a digital-to-analog converter (DAC). The sampling switch is coupled between a readout column and a non-inverting input of the differential comparator. An image readout method reads one pixel with two conversions through the RC. The RC is operated by the local SAR control to set the DAC based on comparator output, and upon which a reset digital value is obtained and stored. An overall reduced algorithm calculation is achieved herein.

公开(公告)号：US08854475B2

公开(公告)日：2014-10-07

申请号：US13763562

申请日：2013-02-08

Applicant: OmniVision Technologies, Inc.

Inventor： Robert Johansson ,  Tore Martinussen

IPC: H04N17/00

CPC classification number: H04N17/002 ,  H04N5/357 ,  H04N5/367

Abstract: A novel image sensor includes a pixel array, a row control circuit, a test signal injection circuit, a sampling circuit, an image processing circuit, a comparison circuit, and a control circuit. In a particular embodiment, the test signal injection circuit injects test signals into the pixel array, the sampling circuit acquires pixel data from the pixel array, and the comparison circuit compares the pixel data with the test signals. If the pixel data does not correspond to the test signals, the comparison circuit outputs an error signal. Additional comparison circuits are provided to detect defects in the control circuitry of an image sensor.

Abstract translation: 一种新颖的图像传感器包括像素阵列，行控制电路，测试信号注入电路，采样电路，图像处理电路，比较电路和控制电路。 在特定实施例中，测试信号注入电路将测试信号注入到像素阵列中，采样电路从像素阵列获取像素数据，并且比较电路将像素数据与测试信号进行比较。 如果像素数据不对应于测试信号，则比较电路输出误差信号。 提供附加的比较电路来检测图像传感器的控制电路中的缺陷。

公开(公告)号：US20210029320A1

公开(公告)日：2021-01-28

申请号：US17069330

申请日：2020-10-13

Applicant: OmniVision Technologies, Inc.

Inventor： Oyvind Janbu ,  Tore Martinussen

IPC: H04N5/378 ,  H03M1/46 ,  H04N5/374 ,  H03M1/12

Abstract: A CMOS image sensor comprises an array of pixels. A column of the pixel array is coupled to a readout column. The readout column is couple to a readout circuitry (RC) that reads out image data from the pixel array. The RC comprises a sampling switch which is coupled to a 1-column successive approximation register (SAR) analog-to-digital converter (ADC). The 1-column SAR ADC comprises a differential comparator, a local SAR control, and a digital-to-analog converter (DAC). The sampling switch is coupled between a readout column and a non-inverting input of the differential comparator. An image readout method reads one pixel with two conversions through the RC. The RC is operated by the local SAR control to set the DAC based on comparator output, and upon which a reset digital value is obtained and stored. An overall reduced algorithm calculation is achieved herein.

公开(公告)号：US20190313042A1

公开(公告)日：2019-10-10

申请号：US16296338

申请日：2019-03-08

Applicant: OmniVision Technologies, Inc.

Inventor： Oyvind Janbu ,  Tore Martinussen

IPC: H04N5/378 ,  H03M1/46 ,  H03M1/12 ,  H04N5/374

Abstract: A CMOS image sensor is made of an array of pixels. A column of the pixel array is coupled to a readout column. The readout column is couple to a readout circuitry (RC) that reads out an image data from the pixel array. The RC is made of at least one sampling switch which is coupled to a successive approximation register (SAR) analog-to-digital converter (ADC). The SAR ADC is made of a differential comparator, a local SAR control, and at least one digital-to-analog converter (DAC). One sampling switch is coupled between a readout column and a non-inverting input of the differential comparator. An image readout method reads two pixels with three conversions by using the RC. The RC is operated by SAR control circuitry to set its two DACs based on comparator output, and upon which a reset digital value is obtained and stored. The image data is achieved with a reduced algorithm calculation by using the stored reset digital value alongside other operations of the RC.

公开(公告)号：US20140226027A1

公开(公告)日：2014-08-14

申请号：US13763562

申请日：2013-02-08

Applicant: OMNIVISION TECHNOLOGIES, INC.

Inventor： Robert Johansson ,  Tore Martinussen

IPC: H04N17/00

CPC classification number: H04N17/002 ,  H04N5/357 ,  H04N5/367

Abstract: A novel image sensor includes a pixel array, a row control circuit, a test signal injection circuit, a sampling circuit, an image processing circuit, a comparison circuit, and a control circuit. In a particular embodiment, the test signal injection circuit injects test signals into the pixel array, the sampling circuit acquires pixel data from the pixel array, and the comparison circuit compares the pixel data with the test signals. If the pixel data does not correspond to the test signals, the comparison circuit outputs an error signal. Additional comparison circuits are provided to detect defects in the control circuitry of an image sensor.

Abstract translation: 一种新颖的图像传感器包括像素阵列，行控制电路，测试信号注入电路，采样电路，图像处理电路，比较电路和控制电路。 在特定实施例中，测试信号注入电路将测试信号注入到像素阵列中，采样电路从像素阵列获取像素数据，并且比较电路将像素数据与测试信号进行比较。 如果像素数据不对应于测试信号，则比较电路输出误差信号。 提供附加的比较电路来检测图像传感器的控制电路中的缺陷。

公开(公告)号：US08736684B1

公开(公告)日：2014-05-27

申请号：US13763498

申请日：2013-02-08

Applicant: OmniVision Technologies, Inc.

Inventor： Robert Johansson ,  Tore Martinussen

IPC: H04N17/00 ,  H04N5/367

CPC classification number: H04N17/002 ,  H04N5/357 ,  H04N5/367

Abstract: A novel image sensor includes a pixel array, a row control circuit, a test signal injection circuit, a sampling circuit, an image processing circuit, a comparison circuit, and a control circuit. In a particular embodiment, the test signal injection circuit injects test signals into the pixel array, the sampling circuit acquires pixel data from the pixel array, and the comparison circuit compares the pixel data with the test signals. If the pixel data does not correspond to the test signals, the comparison circuit outputs an error signal. Additional comparison circuits are provided to detect defects in the control circuitry of an image sensor.