WAFER TREATMENT APPARATUS AND METHOD FOR REDUCING SCATTERING OF TREATMENT LIQUID

    公开(公告)号:US20230215743A1

    公开(公告)日:2023-07-06

    申请号:US18074454

    申请日:2022-12-03

    CPC classification number: H01L21/67051 B08B3/022 B08B13/00 H01L21/68764

    Abstract: A wafer treatment apparatus includes a wafer supporter for supporting and rotating a wafer, a frontside liquid discharger for discharging a liquid toward a frontside of the wafer, a backside liquid discharger for discharging the liquid toward a backside of the wafer, a treatment chamber for accommodating the wafer supporter, and including liquid collecting inlets stacked on each other and receiving the liquid discharged from at least one of the frontside and backside liquid dischargers, and a controller for controlling a height of an upper end of a first liquid collecting inlet of the liquid collecting inlets to have one of a first height in a process of discharging the liquid to the backside of the wafer adjacent to the wafer supporter and a second height, lower than the first height, in a process of discharging the liquid to the frontside of the wafer.

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