WALKWAY STRUCTURE AND OVERHEAD HOIST TRANSFER SYSTEM INCLUDING THE SAME

    公开(公告)号:US20240360634A1

    公开(公告)日:2024-10-31

    申请号:US18643124

    申请日:2024-04-23

    申请人: SEMES CO., LTD.

    发明人: Hyuksoon Im

    IPC分类号: E01D19/10 B66F11/04

    CPC分类号: E01D19/106 B66F11/044

    摘要: A walkway structure includes a first frame spaced apart from the ground in a vertical direction and extending in a first horizontal direction, a footboard located on a side surface of the first frame and comprising at least one first hole, at least one bracket coupled to the footboard and the first frame, and a first coupler configured to couple the bracket to the first frame, wherein the bracket includes a first plate coupled to the footboard, a second plate coupled to the first plate, and a third plate coupled to the second plate, wherein a lower surface of the third plate is in contact with an upper surface of the first frame.

    APPARATUS AND METHOD FOR FORMING FILM
    4.
    发明公开

    公开(公告)号:US20240316923A1

    公开(公告)日:2024-09-26

    申请号:US18439488

    申请日:2024-02-12

    申请人: SEMES CO., LTD.

    IPC分类号: B41J2/07 B41J29/38

    CPC分类号: B41J2/07 B41J29/38

    摘要: The present disclosure provides a method and apparatus for forming a film, capable of for forming a film on an image in which a plurality of shapes overlap, wherein the method for forming a film includes setting a first shape within a target region; setting a second shape, at least partially overlapping the first shape; setting an edge processing profile applied to an edge portion of the first shape and an edge portion of the second shape; and forming a film on the edge portion of the first shape and the edge portion of the second shape, based on the edge processing profile.

    Substrate treating apparatus, and method of controlling the substrate treating apparatus

    公开(公告)号:US12097525B2

    公开(公告)日:2024-09-24

    申请号:US17960394

    申请日:2022-10-05

    申请人: SEMES CO., LTD.

    发明人: Cheon Su Cho

    IPC分类号: B05C11/00 B05C5/02

    CPC分类号: B05C11/00 B05C5/0208

    摘要: The inventive concept provides a substrate treating apparatus. The substrate treating apparatus includes a head unit configured to discharge an ink to a substrate; a supply unit configured to supply the ink to the head unit and including a reservoir having an inner space; and a pressure adjusting unit configured to adjust a pressure of the inner space, and wherein the pressure adjusting unit comprises: a first pressure adjusting unit; and a second pressure adjusting unit in which a size for changing a pressure of the inner space per unit time is greater than the first pressure adjusting unit.

    Substrate treating apparatus and substrate treating method

    公开(公告)号:US12094706B2

    公开(公告)日:2024-09-17

    申请号:US17901904

    申请日:2022-09-02

    申请人: SEMES CO., LTD.

    发明人: Myung Chan Cho

    IPC分类号: H01L21/02 H01L21/67

    摘要: Provided is a substrate treating method. The substrate treating method includes: a first supercritical processing operation of loading a first substrate into a supercritical chamber and supercritically processing the first substrate in the supercritical chamber; a resting operation of maintaining the supercritical chamber in an empty state for a first time until a temperature in the supercritical chamber becomes a preset temperature by opening the supercritical chamber after the first substrate is unloaded from the supercritical chamber; and a second supercritical processing operation of loading a second substrate into the supercritical chamber and supercritically processing the second substrate in the supercritical chamber.

    SYSTEM FOR ANALYZING ABNORMAL DATA AND OPERATING METHOD THEREOF

    公开(公告)号:US20240281313A1

    公开(公告)日:2024-08-22

    申请号:US18582808

    申请日:2024-02-21

    申请人: SEMES CO., LTD.

    IPC分类号: G06F11/07 G06F11/30

    CPC分类号: G06F11/0751 G06F11/3072

    摘要: An operating method of a system for analyzing abnormal data includes generating an anomaly detection model by using a training data set including a plurality of pieces of multivariate time-series data, comparing first time-series data input to the anomaly detection model with second time-series data output from the anomaly detection model through an operation on the first time-series data, determining whether or not the first time-series data includes abnormal data, on the basis of the comparison between the first time-series data and the second time-series data, comparing a first plurality of data elements included in the first time-series data with a second plurality of data elements included in the second time-series data, and detecting at least one data element on the basis of a result of comparing the first plurality of data elements with the second plurality of data elements.