WAFER TREATMENT APPARATUS AND METHOD FOR REDUCING SCATTERING OF TREATMENT LIQUID

    公开(公告)号:US20230215743A1

    公开(公告)日:2023-07-06

    申请号:US18074454

    申请日:2022-12-03

    CPC classification number: H01L21/67051 B08B3/022 B08B13/00 H01L21/68764

    Abstract: A wafer treatment apparatus includes a wafer supporter for supporting and rotating a wafer, a frontside liquid discharger for discharging a liquid toward a frontside of the wafer, a backside liquid discharger for discharging the liquid toward a backside of the wafer, a treatment chamber for accommodating the wafer supporter, and including liquid collecting inlets stacked on each other and receiving the liquid discharged from at least one of the frontside and backside liquid dischargers, and a controller for controlling a height of an upper end of a first liquid collecting inlet of the liquid collecting inlets to have one of a first height in a process of discharging the liquid to the backside of the wafer adjacent to the wafer supporter and a second height, lower than the first height, in a process of discharging the liquid to the frontside of the wafer.

    APPARATUS FOR TREATING SUBSTRATE
    5.
    发明申请

    公开(公告)号:US20220379355A1

    公开(公告)日:2022-12-01

    申请号:US17824169

    申请日:2022-05-25

    Abstract: The inventive concept provides a substrate treating apparatus. The substrate treating apparatus includes a treating container having a treating space; a support unit configured to support and rotate a substrate in the treating space; an exhaust line coupled to the treating container and configured to exhaust an airflow within the treating space; a support frame provided independently of a rotation of the support unit and positioned between the treating container and the support unit; and a guide vane protruding to an outside of the support frame and configured to guide the airflow within the treating space in a downward direction.

    SUBSTRATE TREATING APPARATUS
    6.
    发明申请

    公开(公告)号:US20210022213A1

    公开(公告)日:2021-01-21

    申请号:US16932286

    申请日:2020-07-17

    Abstract: An apparatus for treating a substrate includes a process chamber having a treatment space defined therein, a support unit for supporting the substrate in the treatment space, a liquid supply unit for supplying treating liquid to the substrate supported on the support unit, and a heating unit disposed in the support unit for heating the substrate supported on the support unit, wherein the heating unit includes a plurality of lamps to heat the substrate, and a window disposed above the lamps to transmit light emitted from the lamps, wherein the window includes a base in a form of a plate, and light adjustment means formed on the base to spread or converge light emitted from the lamps.

Patent Agency Ranking