SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

    公开(公告)号:US20220336499A1

    公开(公告)日:2022-10-20

    申请号:US17719052

    申请日:2022-04-12

    Applicant: Socionext Inc.

    Abstract: In a power line structure for supplying power to standard cells, buried power lines extending in the X direction are placed at a given spacing in the Y direction. A local power line extending in the Y direction is connected with the buried power lines. Metal power lines extending in the X direction are formed in an upper-layer metal interconnect layer and connected with the local power line. The spacing of placement of the metal power lines in the Y direction is greater than the spacing of placement of the buried power lines.

    SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
    2.
    发明公开

    公开(公告)号:US20240332304A1

    公开(公告)日:2024-10-03

    申请号:US18738947

    申请日:2024-06-10

    Applicant: Socionext Inc.

    CPC classification number: H01L27/11807 H01L2027/11881

    Abstract: First and second semiconductor chips are stacked one upon the other with the back face of the first semiconductor chip opposed to the principal face of the second semiconductor chip. The first semiconductor chip includes: first and second power lines formed in a buried interconnect layer, extending in the X direction, and adjoining each other in the Y direction; first and second contacts provided between the first and second power lines and the chip back face; and a third contact provided between a signal line and the chip back face. The third contact is located between the first and second power lines in the Y direction, and at a position different from the positions of the first and second contacts in the X direction, in planar view.

    SEMICONDUCTOR DEVICE
    3.
    发明公开

    公开(公告)号:US20240213300A1

    公开(公告)日:2024-06-27

    申请号:US18598870

    申请日:2024-03-07

    Applicant: Socionext Inc.

    Abstract: A semiconductor device includes a substrate; a first semiconductor region formed over the substrate; a second semiconductor region formed over the substrate, and electrically connected to the first semiconductor region; a third semiconductor region formed over the substrate, and positioned between the first semiconductor region and the second semiconductor region; a fourth semiconductor region formed over the first semiconductor region; a fifth semiconductor region formed over the second semiconductor region, and electrically connected to the fourth semiconductor region; a sixth semiconductor region formed over the third semiconductor region, and positioned between the fourth semiconductor region and the fifth semiconductor region; and wires formed between the first semiconductor region and the second semiconductor region, and between the fourth semiconductor region and the fifth semiconductor region, to cover the third semiconductor region and the sixth semiconductor region, the wires including conductors.

    SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

    公开(公告)号:US20250113594A1

    公开(公告)日:2025-04-03

    申请号:US18972119

    申请日:2024-12-06

    Applicant: Socionext Inc.

    Inventor: Hideyuki KOMURO

    Abstract: A semiconductor integrated circuit device includes a plurality of standard cells each having a nanosheet field effect transistor (FET). A first standard cell includes a first buried power rail extending in the X direction and a nanosheet FET having a first nanosheet extending in the X direction. A second standard cell includes a second buried power rail greater in size in the Y direction than the first buried power rail and a nanosheet FET having a second nanosheet greater in size in the Y direction than the first nanosheet.

    SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
    5.
    发明公开

    公开(公告)号:US20230411379A1

    公开(公告)日:2023-12-21

    申请号:US18458672

    申请日:2023-08-30

    Applicant: Socionext Inc.

    Inventor: Hideyuki KOMURO

    CPC classification number: H01L27/0207 H01L27/0924 H01L27/0925 H01L23/5221

    Abstract: In a semiconductor integrated circuit device using buried power lines, a first standard cell includes a buried power line extending in the X direction to supply VDD1, and a transistor is supplied with VDD1 from the buried power line. A second standard cell includes a buried power line extending in the X direction to supply VDD1 and an upper-layer power line formed in a layer above the buried power line to supply VDD. A transistor of the second standard cell is supplied with VDD from the upper-layer power line. The upper-layer power line overlaps the buried power line in planar view.

    SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
    6.
    发明公开

    公开(公告)号:US20240145390A1

    公开(公告)日:2024-05-02

    申请号:US18410874

    申请日:2024-01-11

    Applicant: SOCIONEXT INC.

    CPC classification number: H01L23/5286 H01L23/535 H01L27/092

    Abstract: A layout structure of a capacitance cell using a complementary FET (CFET) is provided. A capacitance part includes a first three-dimensional transistor of a first conductivity type and a second three-dimensional transistor of a second conductivity type formed above the first transistor in the depth direction. The source and drain of the first transistor are both connected to VDD or VSS, and the source and drain of the second transistor are both connected to VDD or VSS. The gates of the first and second transistors are both connected to the gate of a transistor included in a fixed-value output part, and are supplied with VDD or VSS.

    SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

    公开(公告)号:US20210272904A1

    公开(公告)日:2021-09-02

    申请号:US17322570

    申请日:2021-05-17

    Applicant: SOCIONEXT INC.

    Abstract: A layout structure of a capacitance cell using a complementary FET (CFET) is provided. A capacitance part includes a first three-dimensional transistor of a first conductivity type and a second three-dimensional transistor of a second conductivity type formed above the first transistor in the depth direction. The source and drain of the first transistor are both connected to VDD or VSS, and the source and drain of the second transistor are both connected to VDD or VSS. The gates of the first and second transistors are both connected to the gate of a transistor included in a fixed-value output part, and are supplied with VDD or VSS.

    SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
    10.
    发明公开

    公开(公告)号:US20240363521A1

    公开(公告)日:2024-10-31

    申请号:US18763697

    申请日:2024-07-03

    Applicant: Socionext Inc.

    Inventor: Hideyuki KOMURO

    CPC classification number: H01L23/50 H01L27/0207 H01L27/088

    Abstract: In a semiconductor integrated circuit device using buried power lines, a standard cell includes: a first buried power line extending in the X direction and supplying a first power supply voltage; a second buried power line extending in the X direction and supplying a second power supply voltage; and a first transistor connected to the first power line. The first buried power line is spaced from the first transistor in planar view and located closer to the center of the standard cell than the first transistor in the Y direction.

Patent Agency Ranking