SEMICONDUCTOR DEVICE
    2.
    发明申请

    公开(公告)号:US20220231681A1

    公开(公告)日:2022-07-21

    申请号:US17577701

    申请日:2022-01-18

    申请人: Socionext Inc.

    IPC分类号: H03K17/16

    摘要: A semiconductor device includes a first area including a logic circuit, a second area including a functional circuit, a first power line, a second power line that supplies a power to the logic circuit and the functional circuit, and a first power switch circuit connected to the first power line and the second power line, wherein the first power switch circuit includes a first transistor larger than a transistor provided in the logic circuit and being connected to the first power line and the second power line, an end cap provided in an area next to the functional circuit, and a second transistor provided between the end cap and an area including the first transistor, the second transistor being of a same size as the transistor provided in the logic circuit and being connected to the first power line and the second power line.

    SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
    3.
    发明申请

    公开(公告)号:US20200350439A1

    公开(公告)日:2020-11-05

    申请号:US16931693

    申请日:2020-07-17

    申请人: SOCIONEXT INC.

    发明人: Junji IWAHORI

    IPC分类号: H01L29/786 H01L27/088

    摘要: A semiconductor integrated circuit device provided with vertical nanowire (VNW) FETs includes a tap cell. The tap cell includes a power supply interconnect extending in a first direction and a bottom region of a first conductivity type formed in a top portion of a well or substrate of the first conductivity type. The bottom region overlaps the power supply interconnect as viewed from top and is connected with the power supply interconnect.

    SEMICONDUCTOR DEVICE
    4.
    发明申请

    公开(公告)号:US20230120959A1

    公开(公告)日:2023-04-20

    申请号:US18069084

    申请日:2022-12-20

    申请人: Socionext Inc.

    IPC分类号: H03K17/16 H03K17/687

    摘要: A semiconductor device includes a first area including a logic circuit, a second area including a functional circuit, a first power line, a second power line that supplies a power to the logic circuit and the functional circuit, and a first power switch circuit connected to the first power line and the second power line, wherein the first power switch circuit includes a first transistor larger than a transistor provided in the logic circuit and being connected to the first power line and the second power line, an end cap provided in an area next to the functional circuit, and a second transistor provided between the end cap and an area including the first transistor, the second transistor being of a same size as the transistor provided in the logic circuit and being connected to the first power line and the second power line.

    SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
    7.
    发明公开

    公开(公告)号:US20240332304A1

    公开(公告)日:2024-10-03

    申请号:US18738947

    申请日:2024-06-10

    申请人: Socionext Inc.

    IPC分类号: H01L27/118

    摘要: First and second semiconductor chips are stacked one upon the other with the back face of the first semiconductor chip opposed to the principal face of the second semiconductor chip. The first semiconductor chip includes: first and second power lines formed in a buried interconnect layer, extending in the X direction, and adjoining each other in the Y direction; first and second contacts provided between the first and second power lines and the chip back face; and a third contact provided between a signal line and the chip back face. The third contact is located between the first and second power lines in the Y direction, and at a position different from the positions of the first and second contacts in the X direction, in planar view.

    SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

    公开(公告)号:US20220392999A1

    公开(公告)日:2022-12-08

    申请号:US17889106

    申请日:2022-08-16

    申请人: Socionext Inc.

    发明人: Junji IWAHORI

    摘要: A layout structure of a capacitive cell using forksheet FETs is provided. In transistors P3 and N3, VDD is supplied to a pair of pads and a gate interconnect, and VSS is supplied to a pair of pads and a gate interconnect. Capacitances are produced between nanosheets and the gate interconnect and between nanosheets and the gate interconnect. The faces of the nanosheets closer to the nanosheets are exposed from the gate interconnect, and the faces of the nanosheets closer to the nanosheets are exposed from the gate interconnect.