ELECTRONIC CIRCUIT AND CORRESPONDING METHOD OF TESTING ELECTRONIC CIRCUITS

    公开(公告)号:US20210232174A1

    公开(公告)日:2021-07-29

    申请号:US17159511

    申请日:2021-01-27

    Abstract: A combinational circuit block has input pins configured to receive input digital signals and output pins configured to provide output digital signals as a function of the input digital signals received. A test input pin receives a test input signal. A test output pin provides a test output signal as a function of the test input signal received. A set of scan registers are selectively coupled to either the combinational circuit block or to one another so as to form a scan chain of scan registers serially coupled between the test input pin and the test output pin. The scan registers in the set of scan registers are clocked by a clock signal. At least one input register is coupled between the test input pin and a first scan register of the scan chain. The at least one input register is clocked by an inverted replica of the clock signal.

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