Method and device for processing video

    公开(公告)号:US11223815B2

    公开(公告)日:2022-01-11

    申请号:US16652601

    申请日:2018-10-25

    Abstract: The method of the present invention for processing a video comprises: acquiring a first and a second omnidirectional videos having a stereoscopic parallax in a first direction which is a corresponding column direction when the first and the second omnidirectional videos are unfolded by longitude and latitude; and, determining one or two third omnidirectional videos according to the first and the second omnidirectional videos, the second and the third omnidirectional videos having a stereoscopic parallax in a second direction, wherein, if one third omnidirectional video is determined, the second and the third omnidirectional videos have a stereoscopic parallax in the second direction; if two third omnidirectional videos are determined, the two third omnidirectional videos have a stereoscopic parallax in the second direction; and, the second direction is a corresponding row direction when the first and the second omnidirectional videos are unfolded by longitude and latitude.

    Method to avoid cache access conflict between load and fill

    公开(公告)号:US10649900B2

    公开(公告)日:2020-05-12

    申请号:US15900789

    申请日:2018-02-20

    Abstract: According to one general aspect, an apparatus may include a first cache configured to store data. The apparatus may include a second cache configured to, in response to a fill request, supply the first cache with data, and an incoming fill signal. The apparatus may also include an execution circuit configured to, via a load request, retrieve data from the first cache. The first cache may be configured to: derive, from the incoming fill signal, address and timing information associated with the fill request, and based, at least partially, upon the address and timing information, schedule the load request to attempt to avoid a load-fill conflict.

    SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD

    公开(公告)号:US20240219315A1

    公开(公告)日:2024-07-04

    申请号:US18493226

    申请日:2023-10-24

    CPC classification number: G01N21/9501 G01N21/8806 G01N21/956

    Abstract: A substrate inspection apparatus includes a light irradiator including an objective lens and a plurality of optical fibers. The objective lens is configured to irradiate light to an illumination area on a semiconductor substrate having a plurality of circuit pattern layers, the plurality of optical fibers are adjacent a periphery of the objective lens and are configured to irradiate the light to a peripheral area adjacent the illumination area. A light generator is configured to generate the light. The light generator is configured to change an irradiation angle of the light to selectively irradiate the light to one or more of the objective lens and the plurality of optical fibers. A light analyzer is configured to obtain images of the circuit pattern layers from the light reflected from the illumination area and the peripheral area. The light analyzer is configured to model each of the circuit pattern layers of the semiconductor substrate to obtain image models and to measure an overlay between the circuit pattern layers through the images and the image models.

Patent Agency Ranking