-
公开(公告)号:US20210005663A1
公开(公告)日:2021-01-07
申请号:US17027980
申请日:2020-09-22
Applicant: Samsung Electronics Co., Ltd.
Inventor: Myoungsu SON , Seung Pil KO , Jung Hyuk LEE , Shinhee HAN , Gwan-Hyeob KOH , Yoonjong SONG
Abstract: A semiconductor device includes a gate structure on a substrate, source and drain contacts respectively on opposite sides of the gate structure and connected to the substrate, a magnetic tunnel junction connected to the drain contact, a first conductive line connected to the source contact, and a second conductive line connected to the first conductive line through a first via contact. The second conductive line is distal to the substrate in relation to the first conductive line. The first and second conductive lines extend in parallel along a first direction. The first and second conductive lines have widths in a second direction intersecting the first direction. The widths of the first and second conductive lines are the same. The first via contact is aligned with the source contact along a third direction perpendicular to a top surface of the substrate.
-
公开(公告)号:US20190326355A1
公开(公告)日:2019-10-24
申请号:US16161370
申请日:2018-10-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Myoungsu SON , Seung Pil KO , Jung Hyuk LEE , Shinhee HAN , Gwan-Hyeob KOH , Yoonjong SONG
Abstract: A semiconductor device includes a gate structure on a substrate, source and drain contacts respectively on opposite sides of the gate structure and connected to the substrate, a magnetic tunnel junction connected to the drain contact, a first conductive line connected to the source contact, and a second conductive line connected to the first conductive line through a first via contact. The second conductive line is distal to the substrate in relation to the first conductive line. The first and second conductive lines extend in parallel along a first direction. The first and second conductive lines have widths in a second direction intersecting the first direction. The widths of the first and second conductive lines are the same. The first via contact is aligned with the source contact along a third direction perpendicular to a top surface of the substrate.
-