公开(公告)号：US20140003551A1

公开(公告)日：2014-01-02

申请号：US13537110

申请日：2012-06-29

申请人： Shu-Chun YANG ,  Wei Chih CHEN ,  Mu-Shan LIN

发明人： Shu-Chun YANG ,  Wei Chih CHEN ,  Mu-Shan LIN

IPC分类号： H03L7/06 ,  H04L27/04

CPC分类号： H04L7/0337 ,  H03L7/0814 ,  H04L7/0037

摘要： A system and method is disclosed for adjusting for timing variations between a data signal and an associated data read signal being transmitted from a first chip and received on a second chip.

摘要翻译： 公开了一种用于调整数据信号和从第一芯片发送并在第二芯片上接收的相关数据读取信号之间的定时变化的系统和方法。

公开(公告)号：US20130307525A1

公开(公告)日：2013-11-21

申请号：US13475813

申请日：2012-05-18

申请人： Wei Chih CHEN

发明人： Wei Chih CHEN

IPC分类号： G01R17/10

CPC分类号： H04L49/90 ,  G01R17/10

摘要： A circuit includes an input stage, a comparison stage, and a calibration stage. The input stage is configured to receive a first input signal, to generate a first reference signal, and to generate a second reference signal. The comparison stage is configured to generate a first comparison output signal in response to the first reference signal and a third reference signal and to generate a second comparison output signal in response to the second reference signal and a fourth reference signal. The calibration stage is configured to generate a detection signal responsive to the presence of the first comparison output signal and the second comparison output signal having a signal frequency within a predetermined frequency band.

摘要翻译： 电路包括输入级，比较级和校准级。 输入级被配置为接收第一输入信号，以产生第一参考信号，并产生第二参考信号。 比较级被配置为响应于第一参考信号和第三参考信号产生第一比较输出信号，并且响应于第二参考信号和第四参考信号产生第二比较输出信号。 校准级被配置为响应于第一比较输出信号的存在和具有预定频带内的信号频率的第二比较输出信号来产生检测信号。

公开(公告)号：US20130335135A1

公开(公告)日：2013-12-19

申请号：US13525981

申请日：2012-06-18

申请人： Wei Chih CHEN

发明人： Wei Chih CHEN

IPC分类号： G01N27/00

CPC分类号： H03K3/011 ,  H04L25/0272 ,  H04L25/0278

摘要： A calibration circuit for calibrating a device to be calibrated includes a variable current generator, a device under test and a control unit. The variable current generator is coupled to a first node of a reference voltage and configured to generate a variable current responsive to variations of the reference voltage. The device under test is a copy of at least one portion of the device to be calibrated, and coupled to the variable current generator to derive, at a second node, a voltage dependent on the variable current. The control unit is coupled to the second node to receive the derived voltage and configured to compare the derived voltage with the reference voltage and to generate, based on a comparison result, at least one calibration signal for adjusting an adjustable electrical parameter of the device under test and the device to be calibrated.

摘要翻译： 用于校准要校准的装置的校准电路包括可变电流发生器，被测器件和控制单元。 可变电流发生器耦合到参考电压的第一节点并且被配置为响应于参考电压的变化产生可变电流。 所测试的器件是要校准的器件的至少一部分的副本，并且耦合到可变电流发生器，以在第二节点处导出取决于可变电流的电压。 控制单元耦合到第二节点以接收导出的电压并且被配置为将导出的电压与参考电压进行比较，并且基于比较结果生成用于调整装置的可调电参数的至少一个校准信号 测试和要校准的设备。