Systems and Methods for Measuring Surface Shape
    1.
    发明申请
    Systems and Methods for Measuring Surface Shape 有权
    测量表面形状的系统和方法

    公开(公告)号:US20120113391A1

    公开(公告)日:2012-05-10

    申请号:US13356131

    申请日:2012-01-23

    IPC分类号: A61B3/107

    摘要: A system for determining a surface shape of a test object includes a pattern having a plurality of first elements dispose about a central axis and defining an aperture containing the central axis. The first elements includes a plurality of common elements having a common form and a reference element having a reference form that is different than the common form. The system further comprises a detector array and an optical system. The optical system is adapted to provide an image of the first elements when light reflects off a surface of a test object, passes through the aperture, and is received by the detector array. The reference form may be configured to facilitate an association between the common elements and the spot images of the common elements.

    摘要翻译: 用于确定测试对象的表面形状的系统包括具有围绕中心轴布置并且限定包含中心轴线的孔的多个第一元件的图案。 第一元件包括具有共同形式的多个公共元件和具有不同于通用形式的参考形式的参考元件。 该系统还包括检测器阵列和光学系统。 当光从测试对象的表面反射出来时,该光学系统适于提供第一元件的图像,通过该孔并由检测器阵列接收。 参考表格可以被配置为便于公共元素与公共元素的斑点图像之间的关联。

    Systems and Methods for Measuring Surface Shape
    2.
    发明申请
    Systems and Methods for Measuring Surface Shape 有权
    测量表面形状的系统和方法

    公开(公告)号:US20090175525A1

    公开(公告)日:2009-07-09

    申请号:US12350895

    申请日:2009-01-08

    IPC分类号: G06K9/00

    摘要: A system for determining a surface shape of a test object includes a pattern having a plurality of first elements dispose about a central axis and defining an aperture containing the central axis. The first elements includes a plurality of common elements having a common form and a reference element having a reference form that is different than the common form. The system further comprises a detector array and an optical system. The optical system is adapted to provide an image of the first elements when light reflects off a surface of a test object, passes through the aperture, and is received by the detector array. The reference form may be configured to facilitate an association between the common elements and the spot images of the common elements.

    摘要翻译: 用于确定测试对象的表面形状的系统包括具有围绕中心轴布置并且限定包含中心轴线的孔的多个第一元件的图案。 第一元件包括具有共同形式的多个公共元件和具有不同于通用形式的参考形式的参考元件。 该系统还包括检测器阵列和光学系统。 当光从测试对象的表面反射出来时,该光学系统适于提供第一元件的图像,通过该孔并由检测器阵列接收。 参考表格可以被配置为便于公共元素与公共元素的斑点图像之间的关联。

    Systems and Methods for Measuring the Shape and Location of an object
    4.
    发明申请
    Systems and Methods for Measuring the Shape and Location of an object 有权
    用于测量物体的形状和位置的系统和方法

    公开(公告)号:US20090161090A1

    公开(公告)日:2009-06-25

    申请号:US12347909

    申请日:2008-12-31

    摘要: A system for determining the shape of an object and/or a distance of the object from the system includes a first plurality of light source, a second plurality of light sources, and a detector or detector array. The first plurality of light sources are disposed about a central axis and are separated from the central axis by radial distances defining an aperture in the first plurality of light sources. The system also includes an optical system adapted to provide light from the second plurality of light sources through the aperture to the object. The system may further include a computer configured to determine the shape of the object and/or the distance of the object from the system using light from the first and second plurality of light sources that is reflected from the object and received by the detector.

    摘要翻译: 用于确定物体的形状和/或物体与系统的距离的系统包括第一多个光源,第二多个光源以及检测器或检测器阵列。 第一多个光源围绕中心轴设置,并且通过限定第一多个光源中的孔的径向距离与中心轴分离。 该系统还包括适于将来自第二多个光源的光通过孔提供给物体的光学系统。 该系统可以进一步包括计算机,该计算机被配置为使用来自被检体的被反射并由检测器接收的来自第一和第二多个光源的光来确定物体的形状和/或物体与系统的距离。

    Systems and methods for measuring the shape and location of an object
    5.
    发明授权
    Systems and methods for measuring the shape and location of an object 有权
    用于测量物体的形状和位置的系统和方法

    公开(公告)号:US07988290B2

    公开(公告)日:2011-08-02

    申请号:US12347909

    申请日:2008-12-31

    IPC分类号: A61B3/10

    摘要: A system for determining the shape of an object and/or a distance of the object from the system includes a first plurality of light source, a second plurality of light sources, and a detector or detector array. The first plurality of light sources are disposed about a central axis and are separated from the central axis by radial distances defining an aperture in the first plurality of light sources. The system also includes an optical system adapted to provide light from the second plurality of light sources through the aperture to the object. The system may further include a computer configured to determine the shape of the object and/or the distance of the object from the system using light from the first and second plurality of light sources that is reflected from the object and received by the detector.

    摘要翻译: 用于确定物体的形状和/或物体与系统的距离的系统包括第一多个光源,第二多个光源以及检测器或检测器阵列。 第一多个光源围绕中心轴设置,并且通过限定第一多个光源中的孔的径向距离与中心轴分离。 该系统还包括适于将来自第二多个光源的光通过孔提供给物体的光学系统。 该系统可以进一步包括计算机,该计算机被配置为使用来自被检体的被反射并由检测器接收的来自第一和第二多个光源的光来确定物体的形状和/或物体与系统的距离。

    System and method for characterizing corneal surfaces
    6.
    发明授权
    System and method for characterizing corneal surfaces 有权
    用于表征角膜表面的系统和方法

    公开(公告)号:US07967440B1

    公开(公告)日:2011-06-28

    申请号:US12693106

    申请日:2010-01-25

    IPC分类号: A61B3/10

    CPC分类号: A61B3/107 A61B3/1005

    摘要: A system includes a light pattern generator having light spots for illuminating front and back surfaces of a cornea with polarized light; one or more detectors for receiving one or more of first spot images from light reflected off the front surface, and second spot images from light reflected off the back surface, the light reflected off the front surface having a first polarization and the light reflected off the back surface having a second polarization; a polarization element in an optical path between the back surface and the one or more detectors, the polarization element being configured to attenuate an intensity of the light reflected off the front surface by an amount greater than an amount by which it attenuates the light reflected off the back surface; and a processor for determining a geometric characteristic of the cornea using at least the second plurality of spot images.

    摘要翻译: 一种系统包括具有用于照射具有偏振光的角膜的前后表面的光斑的光图案发生器; 一个或多个检测器,用于从从前表面反射的光接收一个或多个第一斑点图像,以及从背面反射的光的第二斑点图像,从前表面反射的光具有第一偏振和从该表面反射的光 具有第二偏振的背面; 在所述背表面和所述一个或多个检测器之间的光路中的偏振元件,所述偏振元件被配置为衰减从所述前表面反射的光的强度大于其衰减反射的光的量 背面; 以及处理器,用于使用至少第二多个斑点图像确定角膜的几何特征。

    Method of locating valid light spots for optical measurement and optical measurement instrument employing method of locating valid light spots
    7.
    发明授权
    Method of locating valid light spots for optical measurement and optical measurement instrument employing method of locating valid light spots 有权
    使用定位有效光斑的方法来定位光学测量的有效光斑和光学测量仪器的方法

    公开(公告)号:US08622546B2

    公开(公告)日:2014-01-07

    申请号:US13156013

    申请日:2011-06-08

    IPC分类号: A61B3/00 A61B3/10

    CPC分类号: G01J1/4228 A61B3/1015

    摘要: An algorithm locates valid light spots produced on an image detector by a wavefront of interest. The algorithm includes sequentially examining pixels of the image detector to determine for each of the pixels whether the light intensity detected by the pixel is greater than a threshold, When the pixel's detected light intensity is determined to be greater than the threshold, the algorithm includes: determining whether the pixel belongs to a valid light spot; and when the pixel is determined to belong to a valid light spot; saving data indicating a location for the valid light spot; and masking out a group of pixels of the image detector at the determined location such that the masked pixels are considered to have a light intensity less than the threshold for a remainder of the sequential examination.

    摘要翻译: 算法通过感兴趣的波阵面定位在图像检测器上产生的有效光点。 该算法包括顺序地检查图像检测器的像素,以确定每个像素是否由像素检测的光强度是否大于阈值。当像素的检测光强被确定为大于阈值时,该算法包括: 确定像素是否属于有效光点; 并且当确定像素属于有效光点时; 保存指示有效光点位置的数据; 并且在所确定的位置处掩蔽图像检测器的一组像素,使得被掩盖的像素被认为具有小于连续检验的剩余部分的阈值的光强度。

    Method of qualifying light spots for optical measurements and measurement instrument employing method of qualifying light spots
    8.
    发明授权
    Method of qualifying light spots for optical measurements and measurement instrument employing method of qualifying light spots 有权
    光学测量光斑鉴定方法和采用光斑鉴定方法的测量仪器

    公开(公告)号:US07988293B2

    公开(公告)日:2011-08-02

    申请号:US12607368

    申请日:2009-10-28

    IPC分类号: A61B3/10

    摘要: A method of determining a wavefront of a received light beam includes: (a) receiving a light beam; (b) producing a group of light spots from the light beam; (c) qualifying a set of the light spots for use in determining a wavefront of the received light beam; and (d) determining the wavefront of the received light beam using the qualified set of light spots. Qualifying the set of light spots includes, for each light spot: calculating a first calculated location of the light spot using a first calculation algorithm; calculating a second calculated location of the light spot using a second calculation algorithm; and when a difference between the first and second calculated locations for the light spot is greater than an agreement threshold, excluding the light spot from the set of light spots and/or from being employed in determining the wavefront of the received light beam.

    摘要翻译: 确定接收光束的波前的方法包括:(a)接收光束; (b)从光束产生一组光斑; (c)限定用于确定所接收的光束的波前的一组光点; 和(d)使用合格的一组光斑确定接收光束的波前。 对于每个光点,对该组光点进行合格包括:使用第一计算算法计算光点的第一计算位置; 使用第二计算算法计算所述光点的第二计算位置; 并且当光点的第一和第二计算位置之间的差值大于协议阈值时,排除来自该组光点的光斑和/或不用于确定接收光束的波前。

    Systems and methods of phase diversity wavefront sensing
    9.
    发明授权
    Systems and methods of phase diversity wavefront sensing 有权
    相位分集波前感测的系统和方法

    公开(公告)号:US08118429B2

    公开(公告)日:2012-02-21

    申请号:US12259381

    申请日:2008-10-28

    IPC分类号: A61B3/10 G02B5/18

    摘要: A phase diversity wavefront sensor includes an optical system including at least one optical element for receiving a light beam; a diffractive optical element having a diffractive pattern defining a filter function, the diffractive optical element being arranged to produce, in conjunction with the optical system, images from the light beam associated with at least two diffraction orders; and a detector for detecting the images and outputting image data corresponding to the detected images. In one embodiment, the optical system, diffractive optical element, and detector are arranged to provide telecentric, pupil plane images of the light beam. A processor receives the image data from the detector, and executes a Gerchberg-Saxton phase retrieval algorithm to measure the wavefront of the light beam.

    摘要翻译: 相位分集波前传感器包括光学系统,该光学系统包括用于接收光束的至少一个光学元件; 具有限定滤光器功能的衍射图案的衍射光学元件,所述衍射光学元件布置成与所述光学系统结合产生与至少两个衍射级相关联的光束的图像; 以及用于检测图像并输出与检测到的图像相对应的图像数据的检测器。 在一个实施例中,光学系统,衍射光学元件和检测器被布置成提供光束的远心光瞳平面图像。 处理器从检测器接收图像数据,并且执行Gerchberg-Saxton相位检索算法来测量光束的波前。

    SYSTEM AND METHOD FOR MEASURING CORNEAL TOPOGRAPHY
    10.
    发明申请
    SYSTEM AND METHOD FOR MEASURING CORNEAL TOPOGRAPHY 有权
    用于测量角膜地层的系统和方法

    公开(公告)号:US20090002631A1

    公开(公告)日:2009-01-01

    申请号:US11769054

    申请日:2007-06-27

    IPC分类号: A61B3/107 G01B11/25

    CPC分类号: A61B3/107 A61B3/145 G01B11/25

    摘要: A system measures a corneal topography of an eye. The system includes a group of first light sources arranged around a central axis, the group being separated from the axis by a radial distance defining an aperture in the group; a plurality of second light sources; a detector array; and an optical system adapted to provide light from the second light sources through the aperture to a cornea of an eye, and to provide images of the first light sources and images of the second light sources from the cornea, through the aperture, to the detector array. The optical system includes an optical element having a focal length, f. The second light sources are disposed to be in an optical path approximately one focal length, f, away from the optical element.

    摘要翻译: 系统测量眼睛的角膜地形。 该系统包括围绕中心轴布置的一组第一光源,该组与该轴线分开限定该组中的孔的径向距离; 多个第二光源; 检测器阵列; 以及光学系统,其适于将来自所述第二光源的光通过所述孔提供给眼睛的角膜,并且提供所述第一光源和所述第二光源的图像从所述角膜通过所述孔到所述检测器的图像 数组。 光学系统包括具有焦距f的光学元件。 第二光源设置成离光学元件大约一个焦距f的光路。