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公开(公告)号:US20220189679A1
公开(公告)日:2022-06-16
申请号:US17545607
申请日:2021-12-08
Applicant: TDK CORPORATION
Inventor: Ryo FUKUOKA , Hironori KIMATA , Masataro SAITO , Masazumi ARATA , Hitoshi OHKUBO
Abstract: In the coil component, the maximum reference surface height of the entire wall of the outermost wall and the innermost wall is the same as the reference surface height of the winding part of the coil, that is, equal to or less than the reference surface height of the winding part of the coil. In addition, in both the outermost wall and the innermost wall, the reference surface height of the second side surface is lower than the reference surface height of the winding part of the coil. In this case, in the vicinity of the upper surface of the outermost wall and the innermost wall, the magnetic flux toward the main surface side of the substrate is suppressed from being blocked by the outermost wall and the innermost wall, and the magnetic flux circulation is improved. Thus, the coil characteristics of the coil component are improved.
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公开(公告)号:US20230215618A1
公开(公告)日:2023-07-06
申请号:US18119473
申请日:2023-03-09
Applicant: TDK CORPORATION
Inventor: Takahiro KAWAHARA , Manabu OHTA , Kenei ONUMA , Yuuya KANAME , Ryo FUKUOKA , Hokuto EDA , Masataro SAITO , Kohei TAKAHASHI
CPC classification number: H01F27/292 , H01F17/0013 , H01F17/04 , H01F41/041 , H05K1/181 , H01F27/2804 , H01F2017/048
Abstract: In an electronic component, a terminal electrode has a thickest portion and a part thinner than the thickest portion. Accordingly, an increase in solder fillet forming region occurs when the electronic component is solder-mounted onto a predetermined mounting substrate. In the electronic component, mounting strength is improved as a result of the increase in solder fillet forming region. In addition, in the electronic component, the thickest portion overlaps a bump electrode in a direction orthogonal to the lower surface of an element body. Accordingly, the impact that is applied to the electronic component during the mounting onto the mounting substrate is reduced and the impact resistance of the electronic component is improved.
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公开(公告)号:US20240194392A1
公开(公告)日:2024-06-13
申请号:US18528876
申请日:2023-12-05
Applicant: TDK CORPORATION
Inventor: Masataro SAITO , Hitoshi OHKUBO , Masazumi ARATA , Hokuto EDA , Kohei TAKAHASHI , Takamasa IWASAKI , Ryo FUKUOKA
IPC: H01F27/28
CPC classification number: H01F27/2804 , H01F2027/2809
Abstract: In the coil component, the thickness of the first coil portion and the thickness of the second coil portion are different from each other in the thickness direction of the substrate, thereby achieving improvement in characteristics such as self-resonance frequencies and heat dissipation.
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公开(公告)号:US20210151234A1
公开(公告)日:2021-05-20
申请号:US17093808
申请日:2020-11-10
Applicant: TDK CORPORATION
Inventor: Hitoshi OHKUBO , Manabu OHTA , Ryo FUKUOKA , Hironori KIMATA
Abstract: In a coil component, a height h1 of a pedestal portion of a resin wall corresponds to the height position of a step portion. In addition, a height of a seed portion corresponds to the plating start position at a time when a winding portion of a coil is plated and grown. The plating start position and the step portion are designed to be close to each other by the height h1 of the pedestal portion and the height h2 of the seed portion satisfying 0.3≤h1/h2≤10. Accordingly, although the coil component has a configuration in which the resin wall has the step portion, the inside of the step portion is sufficiently filled with a coil conductor, and thus deterioration of characteristics is suppressed.
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公开(公告)号:US20200303116A1
公开(公告)日:2020-09-24
申请号:US16811610
申请日:2020-03-06
Applicant: TDK CORPORATION
Inventor: Takahiro KAWAHARA , Manabu OHTA , Kenei ONUMA , Yuuya KANAME , Ryo FUKUOKA , Hokuto EDA , Masataro SAITO , Kohei TAKAHASHI
Abstract: In an electronic component, a terminal electrode has a thickest portion and a part thinner than the thickest portion. Accordingly, an increase in solder fillet forming region occurs when the electronic component is solder-mounted onto a predetermined mounting substrate. In the electronic component, mounting strength is improved as a result of the increase in solder fillet forming region. In addition, in the electronic component, the thickest portion overlaps a bump electrode in a direction orthogonal to the lower surface of an element body. Accordingly, the impact that is applied to the electronic component during the mounting onto the mounting substrate is reduced and the impact resistance of the electronic component is improved.
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公开(公告)号:US20240331926A1
公开(公告)日:2024-10-03
申请号:US18618214
申请日:2024-03-27
Applicant: TDK Corporation
Inventor: Manabu OHTA , Ryo FUKUOKA , Yuji MATSUURA , Hokuto EDA , Takahiro NEMOTO , Kenei ONUMA , Masazumi ARATA , Hitoshi OHKUBO
Abstract: In the coil component, the lower end portion of the bump electrode protruding from the lower surface of the element body includes a flange portion, and the lower surface of the lower end portion is concave-convex. Therefore, compared to the case where the bump electrode is exposed in the form of a flat surface so as to be flat with the lower surface of the element body, the contact areas between the bump electrodes and the terminal electrodes are increased, and high connection reliability between the bump electrodes and the terminal electrodes is realized.
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公开(公告)号:US20230215617A1
公开(公告)日:2023-07-06
申请号:US18119457
申请日:2023-03-09
Applicant: TDK CORPORATION
Inventor: Takahiro KAWAHARA , Manabu OHTA , Kenei ONUMA , Yuuya KANAME , Ryo FUKUOKA , Hokuto EDA , Masataro SAITO , Kohei TAKAHASHI
CPC classification number: H01F27/292 , H01F17/0013 , H01F17/04 , H01F41/041 , H05K1/181 , H01F27/2804 , H01F2017/048
Abstract: In an electronic component, a terminal electrode has a thickest portion and a part thinner than the thickest portion. Accordingly, an increase in solder fillet forming region occurs when the electronic component is solder-mounted onto a predetermined mounting substrate. In the electronic component, mounting strength is improved as a result of the increase in solder fillet forming region. In addition, in the electronic component, the thickest portion overlaps a bump electrode in a direction orthogonal to the lower surface of an element body. Accordingly, the impact that is applied to the electronic component during the mounting onto the mounting substrate is reduced and the impact resistance of the electronic component is improved.
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