公开(公告)号：US20240128463A1

公开(公告)日：2024-04-18

申请号：US18277430

申请日：2021-02-18

Applicant: TDK CORPORATION

Inventor： Makoto ENDO ,  Mingyu CHEN ,  Yoshihiro KANBAYASHI ,  Takasi SATOU ,  Natsumi KOZAI ,  Yoshihiko TANABE ,  Syuji TSUKAMOTO ,  Miyuki YANAGIDA

IPC: H01M4/66

CPC classification number: H01M4/667 ,  H01M4/661

Abstract: A laminated resin film includes: a resin layer; and a Cu film provided on one surface or both surfaces of the resin layer, in which in the Cu film, a peak intensity y of a (200) plane is 2 to 30 when a peak intensity of a (111) plane in X-ray diffraction measurement is set to 100, and Expression (1) is satisfied.


y≥2.5×−7.5  Expression (1)



(in Expression (1), y is the peak intensity of the (200) plane when the peak intensity of the (111) plane in the X-ray diffraction measurement is set to 100, and x is a peak intensity of a (220) plane when the peak intensity of the (111) plane in the X-ray diffraction measurement is set to 100.)

公开(公告)号：US20180197649A1

公开(公告)日：2018-07-12

申请号：US15577161

申请日：2016-12-08

Applicant: TDK CORPORATION

Inventor： Hiroshi SHINGAI ,  Yoshihisa TAMAGAWA ,  Yoshihiko TANABE ,  Motohiro SAKURAI ,  Yoshinori SATO

IPC: H01B1/02 ,  H01B5/14 ,  H01B3/10 ,  C23C14/08

Abstract: The transparent conductor includes a transparent resin substrate, a first metal oxide layer, a metal layer containing a silver alloy, and a second metal oxide layer in the order presented. The first metal oxide layer contains zinc oxide, indium oxide, and titanium oxide, and the content of SnO2 in the first metal oxide layer is 40 mol % or less with respect to the total of four components of zinc oxide, indium oxide, titanium oxide, and tin oxide in terms of ZnO, In2O3, TiO2, and SnO2, respectively. The second metal oxide layer contains the four components, and the content of SnO2 in the second metal oxide layer is 12 to 40 mol % with respect to the total of the four components in terms of ZnO, In2O3, TiO2, and SnO2, respectively.

公开(公告)号：US20240379969A1

公开(公告)日：2024-11-14

申请号：US18696750

申请日：2021-09-30

Applicant: TDK Corporation

Inventor： Ryo SASAKI ,  Makoto ENDO ,  Mignyu CHEN ,  Yoshihiro KANBAYASHI ,  Takasi SATOU ,  Natsumi KOZAI ,  Yoshihiko TANABE ,  Syuji TSUKAMOTO ,  Miyuki YANAGIDA ,  Kosuke TANAKA ,  Shun IKENARI

IPC: H01M4/66 ,  H01M4/13 ,  H01M10/0525 ,  H01M10/42

Abstract: A current collector includes a resin layer, a conductive layer, a first intermediate layer that is positioned between the resin layer and the conductive layer and a second intermediate layer that is positioned between the first intermediate layer and the resin layer, the first intermediate layer includes a metal as a main component, and the second intermediate layer includes a metal oxide as a main component.

公开(公告)号：US20250096280A1

公开(公告)日：2025-03-20

申请号：US18729348

申请日：2022-01-17

Applicant: TDK Corporation

Inventor： Mingyu CHEN ,  Makoto ENDO ,  Yoshihiro KANBAYASHI ,  Takasi SATOU ,  Natsumi KOZAI ,  Yoshihiko TANABE ,  Syuji TSUKAMOTO ,  Miyuki YANAGIDA

IPC: H01M4/66 ,  H01M4/04 ,  H01M10/0525

Abstract: A current collector including: a resin layer having first and second surfaces on opposites sides; and a metal layer including copper. The metal layer includes a first metal layer located on a side of the first surface of the resin layer. A yield stress σY1 of the current collector is smaller than a tensile fracture stress σB2 of the resin layer. The yield stress σY1 [MPa] is obtained by expressions (1) and (2) from a resin layer yield stress σY2 [MPa], a resin layer thickness D2 [μm], a yield stress σY3 [MPa] of the metal layer, and a thickness D3 [μm] of the metal layer: σ ⁢ Y ⁢ 1 = A × σ ⁢ Y ⁢ 3 + ( 1 - A ) × σ ⁢ Y ⁢ 2 ( 1 ) A = D ⁢ 3 / ( D ⁢ 2 + D ⁢ 3 ) . ( 2 ) The yield stress σY3 [MPa] is obtained by the following expression (3) from a half-value width β [°] of an X-ray diffraction peak having the highest intensity in an X-ray diffraction pattern of the metal layer σ ⁢ Y ⁢ 3 = ( - 103 + 1 ⁢ 6 ⁢ 44 × √ β ) . ( 3 )

公开(公告)号：US20240047696A1

公开(公告)日：2024-02-08

申请号：US18277471

申请日：2021-02-18

Applicant: TDK CORPORATION

Inventor： Makoto ENDO ,  Mingyu CHEN ,  Yoshihiro KANBAYASHI ,  Takasi SATOU ,  Natsumi KOZAI ,  Yoshihiko TANABE ,  Syuji TSUKAMOTO ,  Miyuki YANAGIDA

IPC: H01M4/66 ,  C23C14/20 ,  C25D3/38 ,  C25D5/56

CPC classification number: H01M4/667 ,  H01M4/661 ,  H01M4/668 ,  C23C14/205 ,  C25D3/38 ,  C25D5/56

Abstract: A laminated resin film includes: a resin layer; and a Cu film having on one surface or both surfaces of the resin layer, in which in the Cu film, an orientation index of a plane is 0.15 or more according to a Lotgering method, a half-width of an X-ray diffraction peak obtained by X-ray diffraction measurement of the plane is 0.3° or less, and Expression (1) is satisfied.


y>3.75x−0.675   Expression (1)

(in Expression (1), Y is the orientation index of the plane in the Cu film according to the Lotgering method, and x is the half-width of the X-ray diffraction peak obtained by the X-ray diffraction measurement of the plane in the Cu film.)

公开(公告)号：US20190160783A1

公开(公告)日：2019-05-30

申请号：US16309295

申请日：2017-06-09

Applicant: TDK CORPORATION

Inventor： Hiroshi SHINGAI ,  Yoshihisa TAMAGAWA ,  Yoshihiko TANABE ,  Yoshinori SATO

IPC: B32B9/04 ,  B32B15/08 ,  C01G19/02 ,  C01G33/00 ,  H01B5/14 ,  H01L51/50 ,  H05B33/04 ,  H05B33/28

Abstract: A transparent conductor includes: a transparent resin base material; a first metal oxide layer; a metal layer including a silver alloy; and a second metal oxide layer, in this order. The first metal oxide layer contains at least one of tin oxide and niobium oxide. When the tin oxide and the niobium oxide are respectively set in terms of SnO2 and Nb2O5, a molar basis content of the total of SnO2 and Nb2O5 with respect to the total of metal oxides contained in the first metal oxide layer is greater than a molar basis content of the total of SnO2 and Nb2O5 with respect to the total of metal oxides contained in the second metal oxide layer, and the content in the first metal oxide layer is greater than or equal to 45 mol %.