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公开(公告)号：US11921133B2
公开(公告)日：2024-03-05
申请号：US18329475
申请日：2023-06-05
Applicant: TECHNOPROBE S.P.A.
Inventor： Flavio Maggioni
CPC classification number: G01R1/07378 , G01R1/06772 , G01R1/07328 , G01R1/07357 , G01R1/07371
Abstract: A testing head apt to verify the operation of a device under test integrated on a semiconductor wafer includes a plurality of contact elements, each including a body that extends between a first end portion and a second end portion, and a guide provided with a plurality of guide holes apt to house the contact elements. The guide includes a conductive portion that includes and electrically connects the holes of a group of guide holes to each other and is apt to contact a corresponding group of contact elements apt to carry a same type of signal.
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公开(公告)号：US11668732B2
公开(公告)日：2023-06-06
申请号：US17325783
申请日：2021-05-20
Applicant: TECHNOPROBE S.P.A.
Inventor： Flavio Maggioni
CPC classification number: G01R1/07378 , G01R1/06772 , G01R1/07328 , G01R1/07357 , G01R1/07371
Abstract: A testing head apt to verify the operation of a device under test integrated on a semiconductor wafer includes a plurality of contact elements, each including a body that extends between a first end portion and a second end portion, and a guide provided with a plurality of guide holes apt to house the contact elements. The guide includes a conductive portion that includes and electrically connects the holes of a group of guide holes to each other and is apt to contact a corresponding group of contact elements apt to carry a same type of signal.
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3.发明授权公开(公告)号：US11971449B2
公开(公告)日：2024-04-30
申请号：US17502600
申请日：2021-10-15
Applicant: TECHNOPROBE S.P.A.
Inventor： Flavio Maggioni
IPC: G01R31/319 , G01R1/073 , G01R1/18 , G01R3/00 , G01R1/067
CPC classification number: G01R31/31905 , G01R1/07357 , G01R1/07364 , G01R1/07371 , G01R1/07392 , G01R3/00 , G01R1/06772 , G01R1/18
Abstract: A probe head comprises a plate-shaped support including respective pluralities of guide holes, a plurality of contact probes being slidingly housed in the respective pluralities of guide holes and including at least a first group of contact probes being apt to carry only one type of signal chosen between ground and power supply signals, a conductive portion realized on the support and including a plurality of the guide holes housing the contact probes of the first group, and at least one filtering capacitor having at least one capacitor plate being electrically connected to the conductive portion, the conductive portion electrically connecting the contact probes of the first group.
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4.发明授权公开(公告)号：US10761113B2
公开(公告)日：2020-09-01
申请号：US15718561
申请日：2017-09-28
Applicant: TECHNOPROBE S.p.A.
Inventor： Flavio Maggioni
Abstract: A probe card for a testing apparatus of electronic devices comprises at least one testing head housing a plurality of contact probes, each contact probe having at least one contact tip abutting onto contact pads of a device under test, as well as at least one space transformer realizing a spatial transformation of the distances between contact pads made on its opposite sides and connected by means of suitable conductive tracks or planes, as well as a plurality of filtering capacitors provided between the space transformer and a PCB, which comprises direct conductive tracks or planes contacting conductive portions of the filtering capacitors.
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公开(公告)号：US20230324438A1
公开(公告)日：2023-10-12
申请号：US18334283
申请日：2023-06-13
Applicant: TECHNOPROBE S.p.A.
Inventor： Roberto Crippa , Flavio Maggioni
CPC classification number: G01R1/07371 , G01R1/06761
Abstract: A testing head comprises a plurality of contact probes, and a guide having a plurality of guide holes for housing the contact probes and including a conductive portion. Each contact probe includes a first end region and a second end region, and a body which extends between the first and second end regions. Suitably, the conductive portion includes a group of the guide holes and electrically connects contact probes of a first group of the contact probes. The contact probes of the first group slide in the guide holes in the conductive portion and are adapted to carry a same signal, and each contact probe of a second group of the plurality of contact probes is surrounded by an insulating coating layer that extends along the body of each contact probe of the second group, thereby insulating the contact probes of the second group from the conductive portion.
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Patent Agency Ranking
公开(公告)号：US11035885B2
公开(公告)日：2021-06-15
申请号：US16442385
申请日：2019-06-14
Applicant: TECHNOPROBE S.P.A.
Inventor： Flavio Maggioni
Abstract: A testing head apt to verify the operation of a device under test integrated on a semiconductor wafer comprises a plurality of contact elements, each comprising a body that extends between a first end portion and a second end portion, and a guide provided with a plurality of guide holes apt to house the contact elements, the guide comprising a conductive portion that includes and electrically connects the holes of a group of guide holes to each other and is apt to contact a corresponding group of contact elements apt to carry a same type of signal.
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公开(公告)号：US11828774B2
公开(公告)日：2023-11-28
申请号：US16550071
申请日：2019-08-23
Applicant: TECHNOPROBE S.p.A.
Inventor： Roberto Crippa , Flavio Maggioni
CPC classification number: G01R1/07371 , G01R1/06761
Abstract: A testing head comprises a plurality of contact probes, and a guide having a plurality of guide holes for housing the contact probes and including a conductive portion. Each contact probe includes a first end region and a second end region, and a body which extends between the first and second end regions. Suitably, the conductive portion includes a group of the guide holes and electrically connects contact probes of a first group of the contact probes. The contact probes of the first group slide in the guide holes in the conductive portion and are adapted to carry a same signal, and each contact probe of a second group of the plurality of contact probes is surrounded by an insulating coating layer that extends along the body of each contact probe of the second group, thereby insulating the contact probes of the second group from the conductive portion.
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公开(公告)号：US11340262B2
公开(公告)日：2022-05-24
申请号：US16870794
申请日：2020-05-08
Applicant: Technoprobe S.p.A.
Inventor： Roberto Crippa , Flavio Maggioni , Andrea Calaon
IPC: G01R1/073
Abstract: A contact probe for a testing head of an apparatus for testing electronic devices comprises a body extending along a longitudinal axis between a first end portion and a second end portion, the second end portion being adapted to contact pads of a device under test. Suitably, the contact probe comprises a first section, which extends along the longitudinal axis from the first end portion and is made of an electrically non-conductive material, and a second section, which extends along the longitudinal axis from the second end portion up to the first section, the second section being electrically conductive and extending over a distance less than 1000 μm.
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9.发明授权公开(公告)号：US11163004B2
公开(公告)日：2021-11-02
申请号：US16442394
申请日：2019-06-14
Applicant: TECHNOPROBE S.P.A.
Inventor： Flavio Maggioni
IPC: G01R31/319 , G01R3/00 , G01R1/18 , G01R1/073 , G01R1/067
Abstract: A probe head comprises a plate-shaped support including respective pluralities of guide holes, a plurality of contact probes being slidingly housed in the respective pluralities of guide holes and including at least a first group of contact probes being apt to carry only one type of signal chosen between ground and power supply signals, a conductive portion realized on the support and including a plurality of the guide holes housing the contact probes of the first group, and at least one filtering capacitor having at least one capacitor plate being electrically connected to the conductive portion, the conductive portion electrically connecting the contact probes of the first group.
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公开(公告)号：US12292457B2
公开(公告)日：2025-05-06
申请号：US18254044
申请日：2021-11-18
Applicant: TECHNOPROBE S.P.A.
Inventor： Flavio Maggioni
Abstract: A flexible membrane adapted to carry high-frequency power signals is described having a plurality of contact pads in a central portion of the flexible membrane connected to a plurality of micro contact probes and a plurality of contact structures connected to a support plate in a peripheral portion of the flexible membrane, as well as a plurality of conductive tracks connecting the contact pads with the contact structures. The flexible membrane further includes an intermediate portion between the central and peripheral portions. The elastic membrane is divided into a first area having a first total thickness and into a second area having a second total thickness. The first area is contiguous and adjacent to the second area. The first total thickness is less than or equal to 75 μm and the second total thickness is greater than the first total thickness.
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