公开(公告)号：US11901803B2

公开(公告)日：2024-02-13

申请号：US17560756

申请日：2021-12-23

Applicant: Texas Instruments Incorporated

Inventor： Bernhard Wolfgang Ruck ,  Ruediger Kuhn ,  Oliver Nehrig

IPC: H02M1/08 ,  H02M3/158 ,  H02M3/157 ,  G05F1/46 ,  H02M1/00

CPC classification number: H02M1/08 ,  G05F1/46 ,  H02M1/0029 ,  H02M3/157 ,  H02M3/1584

Abstract: A driver includes a low-resistance charging path between a supply voltage rail and a first output node, a high-resistance charging path between the supply voltage rail and the first output node, an inverter coupled to the first output node and configured to enable and disable the low-resistance charging path, and a high-resistance discharging path between the first output node and a second output node. The first output node is coupled to a control terminal of a pass gate transistor in some implementations. The low-resistance charging path charges a voltage on the first output node to a threshold voltage of the pass gate transistor, and the high-resistance charging path charges the voltage on the first output node greater than the threshold voltage of the pass gate transistor. The high-resistance discharging path discharges the voltage on the first output node.

公开(公告)号：US20190229743A1

公开(公告)日：2019-07-25

申请号：US16374145

申请日：2019-04-03

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Thomas Fuchs ,  Rudiger Kuhn ,  Bernhard Wolfgang Ruck

IPC: H03M1/10 ,  H03M1/46 ,  H03M5/00 ,  H03M7/16

CPC classification number: H03M1/1071 ,  H03M1/1038 ,  H03M1/466 ,  H03M1/468 ,  H03M5/00 ,  H03M7/165

Abstract: An analog-to-digital converter (ADC) includes a digital-to-analog converter (DAC) that has a configurable capacitor array. Based on measurements of differential nonlinearity (DNL) and/or integral nonlinearity (INL) error by an external test computer system, an order for use of the DAC's capacitors can be determined so as to reduce DNL error aggregation, also called INL. The DAC includes a switch matrix that can be programmed by programming data supplied by the test computer system.

公开(公告)号：US10298250B2

公开(公告)日：2019-05-21

申请号：US15483046

申请日：2017-04-10

Applicant: Texas Instruments Incorporated

Inventor： Thomas Fuchs ,  Rudiger Kuhn ,  Bernhard Wolfgang Ruck

IPC: H03M1/10 ,  H03M1/46 ,  H03M5/00 ,  H03M7/16

Abstract: An analog-to-digital converter (ADC) includes a digital-to-analog converter (DAC) that has a configurable capacitor array. Based on measurements of differential nonlinearity (DNL) and/or integral nonlinearity (INL) error by an external test computer system, an order for use of the DAC's capacitors can be determined so as to reduce DNL error aggregation, also called INL. The DAC includes a switch matrix that can be programmed by programming data supplied by the test computer system.

公开(公告)号：US12231032B2

公开(公告)日：2025-02-18

申请号：US18391809

申请日：2023-12-21

Applicant: Texas Instruments Incorporated

Inventor： Bernhard Wolfgang Ruck ,  Ruediger Kuhn ,  Oliver Nehrig

IPC: H02M1/08 ,  G05F1/46 ,  H02M1/00

Abstract: A driver includes a low-resistance charging path between a supply voltage rail and a first output node, a high-resistance charging path between the supply voltage rail and the first output node, an inverter coupled to the first output node and configured to enable and disable the low-resistance charging path, and a high-resistance discharging path between the first output node and a second output node. The first output node is coupled to a control terminal of a pass gate transistor in some implementations. The low-resistance charging path charges a voltage on the first output node to a threshold voltage of the pass gate transistor, and the high-resistance charging path charges the voltage on the first output node greater than the threshold voltage of the pass gate transistor. The high-resistance discharging path discharges the voltage on the first output node.

公开(公告)号：US12079019B2

公开(公告)日：2024-09-03

申请号：US17323924

申请日：2021-05-18

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Johannes Gerber ,  Asif Qaiyum ,  Fraj Gharib ,  Christian Josef Sichert ,  Ruediger Kuhn ,  Frank Dornseifer ,  Bernhard Wolfgang Ruck

IPC: G05F1/575

CPC classification number: G05F1/575

Abstract: A system includes a digital controller in a voltage regulator. The system also includes a passgate array including two or more passgate transistors, where the passgate array is configured to provide a load current to a load, and where the digital controller is configured to activate and deactivate each passgate transistor in the passgate array. The system also includes a feedback loop configured to provide an error signal to the digital controller, the error signal based on a difference between an output voltage of the voltage regulator and a programmed voltage for the voltage regulator. The digital controller is configured to activate or deactivate a passgate transistor based at least in part on the error signal. The digital controller is also configured to activate at least one passgate transistor and deactivate at least one passgate transistor responsive to a clock cycle.

公开(公告)号：US10560112B2

公开(公告)日：2020-02-11

申请号：US16374145

申请日：2019-04-03

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Thomas Fuchs ,  Rudiger Kuhn ,  Bernhard Wolfgang Ruck

IPC: H03M1/10 ,  H03M7/16 ,  H03M1/46 ,  H03M5/00

Abstract: An analog-to-digital converter (ADC) includes a digital-to-analog converter (DAC) that has a configurable capacitor array. Based on measurements of differential nonlinearity (DNL) and/or integral nonlinearity (INL) error by an external test computer system, an order for use of the DAC's capacitors can be determined so as to reduce DNL error aggregation, also called INL. The DAC includes a switch matrix that can be programmed by programming data supplied by the test computer system.