Trickle charge control
    1.
    发明授权

    公开(公告)号:US10469066B1

    公开(公告)日:2019-11-05

    申请号:US16047788

    申请日:2018-07-27

    Abstract: A system includes a trickle charge control circuit coupled to a charge pump and a motor driver circuit. The trickle charge control circuit is configured to sense a voltage at a bootstrap capacitor voltage node (VBST) of the motor driver circuit; as a result of the voltage at VBST being greater than a voltage at an input voltage node (VIN), couple a charge pump voltage node (VCP) to VBST of the motor driver circuit, where a voltage at VCP is greater than the voltage at VIN; and as a result of the voltage at VBST being less than the voltage at VIN, decouple VCP from the charge pump from VBST of the motor driver circuit.

    Gate driver circuit for reducing deadtime inefficiencies

    公开(公告)号:US11144082B2

    公开(公告)日:2021-10-12

    申请号:US16834362

    申请日:2020-03-30

    Abstract: A driver circuit comprises a first buffer receiving a control signal, and a first transistor coupled to first buffer and an output. A second transistor is coupled to a first current mirror and the output. A third transistor is coupled to the output and an inverter. A fourth transistor receives the inverter's output at its control input and is coupled to the output. A fifth transistor is coupled to third transistor. The second, third, and fifth transistors receive supply voltage at their respective control inputs. A sixth transistor receives the control signal's inverse at its control input and is coupled to fifth transistor and a second current mirror. A current source is coupled to second current mirror and a second buffer. A seventh transistor receives the second buffer's output at its control input and is coupled to first buffer. An eighth transistor is coupled to first buffer and seventh transistor.

    Gate driver circuit for reducing deadtime inefficiencies

    公开(公告)号:US11543846B2

    公开(公告)日:2023-01-03

    申请号:US17469444

    申请日:2021-09-08

    Abstract: A driver circuit includes three sub-circuits. A first sub-circuit is configured to generate a drive current output by the driver circuit through an output node during first and second regions of operation and includes: a diode coupled to the output node and a first transistor, and a second transistor coupled to the first transistor and a current mirror. A second sub-circuit is configured to generate the drive current during the first and second and a third region of operation and includes: a third transistor coupled to the output node; and a fourth transistor. A third sub-circuit is configured to generate the drive current during the third region of operation and includes: a current source coupled to the current mirror and a buffer; and a fifth transistor coupled to the third transistor and the fourth transistor and configured to receive an output of the buffer.

    Trickle charge control
    4.
    发明授权

    公开(公告)号:US10763843B2

    公开(公告)日:2020-09-01

    申请号:US16587082

    申请日:2019-09-30

    Abstract: A system includes a trickle charge control circuit coupled to a charge pump and a motor driver circuit. The trickle charge control circuit is configured to sense a voltage at a bootstrap capacitor voltage node (VBST) of the motor driver circuit; as a result of the voltage at VBST being greater than a voltage at an input voltage node (VIN), couple a charge pump voltage node (VCP) to VBST of the motor driver circuit, where a voltage at VCP is greater than the voltage at VIN; and as a result of the voltage at VBST being less than the voltage at VIN, decouple VCP from the charge pump from VBST of the motor driver circuit.

    Internal device sequencer for testing mode

    公开(公告)号:US11614479B2

    公开(公告)日:2023-03-28

    申请号:US17409633

    申请日:2021-08-23

    Abstract: A device includes FETs with control terminals. A gate driver circuit causes the FETs to turn on and to enter a high-impedance state in response to an OCP signal. A current sense circuit senses an FET current through the FETs and sends the OCP signal to the gate driver circuit when the FET current exceeds an OCP current for longer than an OCP deglitch period. A test sequencer, in response to receiving an external test mode signal, sets the OCP current to a preset OCP test current, sets the OCP deglitch period to a preset OCP deglitch test period, and causes the gate driver circuit to turn on the plurality of FETs.

    Gate driver circuit with a closed loop overdrive generator

    公开(公告)号:US10819351B1

    公开(公告)日:2020-10-27

    申请号:US16423266

    申请日:2019-05-28

    Abstract: A driver circuit comprises a first transistor coupled to a second transistor, and a third transistor coupled to the first and second transistor and to a first current mirror. An output of the first current mirror is provided to a control input of the second transistor. A second current mirror is coupled to the output of the first current mirror. A first current source, a second current source, and a fourth transistor are coupled to the second current mirror. The second current source is further coupled to a fifth transistor. A sixth transistor is coupled to the fifth transistor and to a third current mirror. In some implementations, the driver circuit is coupled to a low side transistor in an H bridge driver and the second transistor is matched to the low side transistor.

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