公开(公告)号：US10606723B2

公开(公告)日：2020-03-31

申请号：US14975193

申请日：2015-12-18

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Pankaj Bongale ,  Partha Ghosh ,  Rubin Ajit Parekhji

IPC: G06F11/00 ,  G06F11/263 ,  G06F11/24 ,  G01R31/28 ,  G06F11/22 ,  G06F11/273

Abstract: A test circuit that includes a circuit to be calibrated, an error generation circuit, and a simplex circuit coupled to one another. The circuit to be calibrated is configured to implement a first plurality of trim codes as calibration parameters for a corresponding plurality of components of the circuit to be calibrated and generate a first actual output. The error generation circuit is configured to generate a first error signal based on a difference between the first actual output and an expected output of the circuit to be calibrated. The simplex circuit is configured to receive the first error signal from the error generation circuit, generate a second plurality of trim codes utilizing a simplex algorithm based on the first error signal, and transmit the second plurality of trim codes to the circuit to be calibrated.