Method for reducing frequency of taking background/reference spectra in FTIR or FTIR-ATR spectroscopy and handheld measurement device embodying same
    1.
    发明授权
    Method for reducing frequency of taking background/reference spectra in FTIR or FTIR-ATR spectroscopy and handheld measurement device embodying same 有权
    在FTIR或FTIR-ATR光谱仪中降低拍摄背景/参考光谱的频率的方法以及体现其的手持式测量装置

    公开(公告)号:US09182280B1

    公开(公告)日:2015-11-10

    申请号:US14455212

    申请日:2014-08-08

    Abstract: Featured is a method for reducing frequency of taking background spectra in FTIR or FTIR-ATR spectroscopy. Such a method includes determining if there is a pre-existing reference spectrum available and if such a reference spectrum is available, acquiring a present reference scan before acquiring a sample scan. The method also includes comparing the present reference scan with the pre-existing reference spectrum to determine if there is one or more non-conformities therebetween and if there is/are one or more nonconformities, determining if the one or more non-conformities are resolvable or not. If the one or more non-conformities are resolvable; resolve each non-conformity in a determined manner and thereafter acquiring a scan of the sample, and if the non-conformities are not resolvable, then acquiring a new reference sample and thereafter acquiring a scan of the sample.

    Abstract translation: 特色是在FTIR或FTIR-ATR光谱学中降低拍摄背景光谱频率的方法。 这种方法包括确定是否存在可用的预先存在的参考频谱,并且如果这样的参考频谱可用,则在获取样本扫描之前获取当前的参考扫描。 该方法还包括将本参考扫描与预先存在的参考光谱进行比较,以确定其间是否存在一个或多个不一致性,并且如果存在/是一个或多个不一致性,则确定一个或多个不一致性是否可解析 或不。 如果一个或多个不合格是可解决的; 以确定的方式解决每个不合格,然后获取样本的扫描,并且如果不合格不能解析,则获取新的参考样本,然后获取样本的扫描。

    Method and apparatus for temperature control during sample analysis
    2.
    发明授权
    Method and apparatus for temperature control during sample analysis 有权
    样品分析过程中温度控制的方法和装置

    公开(公告)号:US09400271B2

    公开(公告)日:2016-07-26

    申请号:US14132671

    申请日:2013-12-18

    Abstract: A method of detecting an explosive material, and an analyzer and computer program products that may perform such methods. A method may include illuminating at least a portion of the material with light, and monitoring the temperature of the illuminated portion. T power or location of the illuminating light may be altered in response to the monitored temperature. Raman spectral data are produced in response to Raman radiation emitted from the portion in response to the light. The composition of the material may be analyzed based on the Raman spectral data or generating an indication to an operator that the material cannot be safely analyzed.

    Abstract translation: 检测炸药的方法,以及可以执行这种方法的分析仪和计算机程序产品。 一种方法可以包括用光照射材料的至少一部分,并监测被照射部分的温度。 照亮光的功率或位置可以响应于所监视的温度而改变。 响应于从该部分响应于光发射的拉曼辐射而产生拉曼光谱数据。 可以基于拉曼光谱数据来分析材料的组成,或者向操作者产生不能安全地分析材料的指示。

    Moving laser focus in a spectrometer
    3.
    发明授权
    Moving laser focus in a spectrometer 有权
    将激光焦点移动到光谱仪中

    公开(公告)号:US09329084B2

    公开(公告)日:2016-05-03

    申请号:US14080234

    申请日:2013-11-14

    CPC classification number: G01J3/0208 G01N21/65 G01N2201/1056

    Abstract: In an embodiment, an apparatus may include a light source, a beam manipulator, an optical component, an analyzer, and a detector. The light source may generate an incident light at a first frequency. The beam manipulator may include one or more polyhedron-shaped prisms that may deflect the incident light for focus at a plurality of points on a sample. The optical component may collect the deflected incident light, focus the collected deflected incident light at the plurality of points on the sample, and collect scattered light from the sample. The scattered light may include elastic scattered light and/or inelastic scattered light. The inelastic scattered light may have a second frequency that is shifted up or down from the first frequency. The detector may detect the inelastic scattered light and the analyzer may identify a substance contained in the sample based on the detected inelastic scattered light.

    Abstract translation: 在一个实施例中,装置可以包括光源,光束操纵器,光学部件,分析器和检测器。 光源可以以第一频率产生入射光。 光束操纵器可以包括一个或多个多面体形状的棱镜,其可以将样品上的多个点的入射光偏转成焦点。 光学部件可以收集偏转的入射光,将收集的偏转的入射光聚焦在样品上的多个点上,并收集来自样品的散射光。 散射光可以包括弹性散射光和/或非弹性散射光。 非弹性散射光可以具有从第一频率向上或向下偏移的第二频率。 检测器可以检测非弹性散射光,并且分析器可以基于检测到的非弹性散射光来识别样品中包含的物质。

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