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公开(公告)号:US20110053326A1
公开(公告)日:2011-03-03
申请号:US12549190
申请日:2009-08-27
申请人: Yang Gao , Kyle Terrill , Deva Pattanayak , Kuo-In Chen , The-Tu Chau , Sharon Shi , Qufei Chen
发明人: Yang Gao , Kyle Terrill , Deva Pattanayak , Kuo-In Chen , The-Tu Chau , Sharon Shi , Qufei Chen
IPC分类号: H01L21/336
CPC分类号: H01L29/7813 , H01L29/0634 , H01L29/0653 , H01L29/0661 , H01L29/407 , H01L29/41766 , H01L29/42368 , H01L29/66727 , H01L29/66734 , H01L29/7811
摘要: Methods of fabricating a super junction trench power MOSFET (metal oxide semiconductor field effect transistor) device are described. A column of p-type dopant in the super junction is separated from a first column of n-type dopant by a first column of oxide and from a second column of n-type dopant by a second column of oxide. In an n-channel device, a gate element for the FET is advantageously situated over the column of p-type dopant; and in a p-channel device, a gate element for the FET is advantageously situated over the column of n-type dopant.
摘要翻译: 描述了制造超结沟槽功率MOSFET(金属氧化物半导体场效应晶体管)器件的方法。 超级结中的p型掺杂剂的列通过第一列氧化物与第一列n型掺杂剂与第二列氧化物与第二列n型掺杂剂分离。 在n沟道器件中,用于FET的栅极元件有利地位于p型掺杂剂的列上; 并且在p沟道器件中,用于FET的栅极元件有利地位于n型掺杂剂的列之上。
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公开(公告)号:US09443974B2
公开(公告)日:2016-09-13
申请号:US12549190
申请日:2009-08-27
申请人: Yang Gao , Kyle Terrill , Deva Pattanayak , Kuo-In Chen , The-Tu Chau , Sharon Shi , Qufei Chen
发明人: Yang Gao , Kyle Terrill , Deva Pattanayak , Kuo-In Chen , The-Tu Chau , Sharon Shi , Qufei Chen
IPC分类号: H01L21/336 , H01L29/78 , H01L29/06 , H01L29/66 , H01L29/40 , H01L29/417 , H01L29/423
CPC分类号: H01L29/7813 , H01L29/0634 , H01L29/0653 , H01L29/0661 , H01L29/407 , H01L29/41766 , H01L29/42368 , H01L29/66727 , H01L29/66734 , H01L29/7811
摘要: Methods of fabricating a super junction trench power MOSFET (metal oxide semiconductor field effect transistor) device are described. A column of p-type dopant in the super junction is separated from a first column of n-type dopant by a first column of oxide and from a second column of n-type dopant by a second column of oxide. In an n-channel device, a gate element for the FET is advantageously situated over the column of p-type dopant; and in a p-channel device, a gate element for the FET is advantageously situated over the column of n-type dopant.
摘要翻译: 描述了制造超结沟槽功率MOSFET(金属氧化物半导体场效应晶体管)器件的方法。 超级结中的p型掺杂剂的列通过第一列氧化物与第一列n型掺杂剂与第二列氧化物与第二列n型掺杂剂分离。 在n沟道器件中,用于FET的栅极元件有利地位于p型掺杂剂的列上; 并且在p沟道器件中,用于FET的栅极元件有利地位于n型掺杂剂的列之上。
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公开(公告)号:US09425306B2
公开(公告)日:2016-08-23
申请号:US12548841
申请日:2009-08-27
申请人: Yang Gao , Kyle Terrill , Deva Pattanayak , Kuo-In Chen , The-Tu Chau , Sharon Shi , Qufei Chen
发明人: Yang Gao , Kyle Terrill , Deva Pattanayak , Kuo-In Chen , The-Tu Chau , Sharon Shi , Qufei Chen
IPC分类号: H01L29/78 , H01L29/06 , H01L29/66 , H01L29/40 , H01L29/417 , H01L29/423
CPC分类号: H01L29/7813 , H01L29/0634 , H01L29/0653 , H01L29/0661 , H01L29/407 , H01L29/41766 , H01L29/42368 , H01L29/66727 , H01L29/66734 , H01L29/7811
摘要: In a super junction trench power MOSFET (metal oxide semiconductor field effect transistor) device, a column of p-type dopant in the super junction is separated from a first column of n-type dopant by a first column of oxide and from a second column of n-type dopant by a second column of oxide. In an n-channel device, a gate element for the FET is advantageously situated over the column of p-type dopant; and in a p-channel device, a gate element for the FET is advantageously situated over the column of n-type dopant.
摘要翻译: 在超结沟槽功率MOSFET(金属氧化物半导体场效应晶体管)器件中,超结中的p型掺杂剂列由第一列氧化物和第二列与第一列n型掺杂剂分离, 的n型掺杂剂通过第二列氧化物。 在n沟道器件中,用于FET的栅极元件有利地位于p型掺杂剂的列上; 并且在p沟道器件中,用于FET的栅极元件有利地位于n型掺杂剂的列之上。
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公开(公告)号:US20110049614A1
公开(公告)日:2011-03-03
申请号:US12548841
申请日:2009-08-27
申请人: Yang Gao , Kyle Terrill , Deva Pattanayak , Kuo-In Chen , The-Tu Chau , Sharon Shi , Qufei Chen
发明人: Yang Gao , Kyle Terrill , Deva Pattanayak , Kuo-In Chen , The-Tu Chau , Sharon Shi , Qufei Chen
IPC分类号: H01L29/78
CPC分类号: H01L29/7813 , H01L29/0634 , H01L29/0653 , H01L29/0661 , H01L29/407 , H01L29/41766 , H01L29/42368 , H01L29/66727 , H01L29/66734 , H01L29/7811
摘要: In a super junction trench power MOSFET (metal oxide semiconductor field effect transistor) device, a column of p-type dopant in the super junction is separated from a first column of n-type dopant by a first column of oxide and from a second column of n-type dopant by a second column of oxide. In an n-channel device, a gate element for the FET is advantageously situated over the column of p-type dopant; and in a p-channel device, a gate element for the FET is advantageously situated over the column of n-type dopant.
摘要翻译: 在超结沟槽功率MOSFET(金属氧化物半导体场效应晶体管)器件中,超结中的p型掺杂剂列由第一列氧化物和第二列与第一列n型掺杂剂分离, 的n型掺杂剂通过第二列氧化物。 在n沟道器件中,用于FET的栅极元件有利地位于p型掺杂剂的列上; 并且在p沟道器件中,用于FET的栅极元件有利地位于n型掺杂剂的列之上。
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5.
公开(公告)号:US20110089485A1
公开(公告)日:2011-04-21
申请号:US12603028
申请日:2009-10-21
申请人: Yang Gao , Kuo-In Chen , Kyle Terrill , Sharon Shi
发明人: Yang Gao , Kuo-In Chen , Kyle Terrill , Sharon Shi
IPC分类号: H01L29/78 , H01L21/336
CPC分类号: H01L29/66621 , H01L29/0615 , H01L29/0623 , H01L29/0696 , H01L29/407 , H01L29/66727 , H01L29/66734 , H01L29/7811 , H01L29/7813
摘要: A split gate semiconductor device includes a trench gate having a first electrode region and a second electrode region that are separated from each other by a gate oxide layer and an adjacent dielectric layer. The boundary of the gate oxide layer and the dielectric layer is curved to avoid a sharp corner where the gate oxide layer meets the sidewalls of the trench.
摘要翻译: 分离栅极半导体器件包括具有通过栅极氧化物层和相邻电介质层彼此分离的第一电极区域和第二电极区域的沟槽栅极。 栅极氧化物层和电介质层的边界是弯曲的,以避免栅极氧化物层与沟槽的侧壁相遇的尖角。
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6.
公开(公告)号:US09419129B2
公开(公告)日:2016-08-16
申请号:US12603028
申请日:2009-10-21
申请人: Yang Gao , Kuo-In Chen , Kyle Terrill , Sharon Shi
发明人: Yang Gao , Kuo-In Chen , Kyle Terrill , Sharon Shi
CPC分类号: H01L29/66621 , H01L29/0615 , H01L29/0623 , H01L29/0696 , H01L29/407 , H01L29/66727 , H01L29/66734 , H01L29/7811 , H01L29/7813
摘要: A split gate semiconductor device includes a trench gate having a first electrode region and a second electrode region that are separated from each other by a gate oxide layer and an adjacent dielectric layer. The boundary of the gate oxide layer and the dielectric layer is curved to avoid a sharp corner where the gate oxide layer meets the sidewalls of the trench.
摘要翻译: 分离栅极半导体器件包括具有通过栅极氧化物层和相邻电介质层彼此分离的第一电极区域和第二电极区域的沟槽栅极。 栅极氧化物层和电介质层的边界是弯曲的,以避免栅极氧化物层与沟槽的侧壁相遇的尖角。
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公开(公告)号:US20120220092A1
公开(公告)日:2012-08-30
申请号:US13460600
申请日:2012-04-30
申请人: Madhur Bobde , Qufei Chen , Misbah Ul Azam , Kyle Terrill , Yang Gao , Sharon Shi
发明人: Madhur Bobde , Qufei Chen , Misbah Ul Azam , Kyle Terrill , Yang Gao , Sharon Shi
IPC分类号: H01L21/336 , H01L21/28
CPC分类号: H01L29/7813 , H01L29/407 , H01L29/66727 , H01L29/66734
摘要: Method of forming a Hybrid Split Gate Semiconductor. In accordance with a method embodiment of the present invention, a plurality of first trenches is formed in a semiconductor substrate to a first depth. A plurality of second trenches is formed in the semiconductor substrate to a second depth. The first plurality of trenches are parallel with the second plurality of trenches. The trenches of the plurality of first trenches alternate with and are adjacent to trenches of the plurality of second trenches.
摘要翻译: 形成混合分离栅极半导体的方法。 根据本发明的方法实施例,在半导体衬底中形成多个第一沟槽至第一深度。 多个第二沟槽在半导体衬底中形成第二深度。 第一多个沟槽与第二多个沟槽平行。 多个第一沟槽的沟槽与多个第二沟槽的沟槽交替并与之相邻。
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公开(公告)号:US20120211828A1
公开(公告)日:2012-08-23
申请号:US13460567
申请日:2012-04-30
申请人: Madhur Bobde , Qufei Chen , Misbah Ul Azam , Kyle Terrill , Yang Gao , Sharon Shi
发明人: Madhur Bobde , Qufei Chen , Misbah Ul Azam , Kyle Terrill , Yang Gao , Sharon Shi
IPC分类号: H01L29/78
CPC分类号: H01L29/7813 , H01L29/407 , H01L29/66727 , H01L29/66734
摘要: In an embodiment in accordance with the present invention, a semiconductor device includes a vertical channel region, a gate at a first depth on a first side of the vertical channel region, a shield electrode at a second depth on the first side of the vertical channel region, and a hybrid gate at the first depth on a second side of the vertical channel region. The region below the hybrid gate on the second side of the vertical channel region is free of any electrodes.
摘要翻译: 在根据本发明的实施例中,半导体器件包括垂直沟道区,垂直沟道区的第一侧的第一深度处的栅极,垂直沟道第一侧上的第二深度处的屏蔽电极 区域,以及在垂直沟道区域的第二侧上的第一深度处的混合栅极。 在垂直沟道区的第二侧上的混合栅极下面的区域没有任何电极。
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公开(公告)号:US09425305B2
公开(公告)日:2016-08-23
申请号:US12869554
申请日:2010-08-26
申请人: Kyle Terrill , Yang Gao , Chanho Park
发明人: Kyle Terrill , Yang Gao , Chanho Park
IPC分类号: H01L29/78 , H01L29/40 , H01L29/66 , H01L29/423
CPC分类号: H01L29/7813 , H01L29/407 , H01L29/42368 , H01L29/4238 , H01L29/66734 , H01L29/7811
摘要: A split gate field effect transistor device. The device includes a split gate structure having a trench, a gate electrode and a source electrode. A first poly layer is disposed within the trench and is connected to the gate electrode. A second poly layer connected to the source electrode, wherein the first poly layer and the second poly layer are independent.
摘要翻译: 分路栅场效应晶体管器件。 该器件包括具有沟槽,栅电极和源电极的分离栅结构。 第一多晶硅层设置在沟槽内并连接到栅电极。 连接到源电极的第二多晶硅层,其中第一多晶硅层和第二多晶硅层是独立的。
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公开(公告)号:US20110210406A1
公开(公告)日:2011-09-01
申请号:US12869554
申请日:2010-08-26
申请人: Kyle Terrill , Yang Gao , Chanho Park
发明人: Kyle Terrill , Yang Gao , Chanho Park
IPC分类号: H01L29/772
CPC分类号: H01L29/7813 , H01L29/407 , H01L29/42368 , H01L29/4238 , H01L29/66734 , H01L29/7811
摘要: A split gate field effect transistor device. The device includes a split gate structure having a trench, a gate electrode and a source electrode. A first poly layer is disposed within the trench and is connected to the gate electrode. A second poly layer connected to the source electrode, wherein the first poly layer and the second poly layer are independent.
摘要翻译: 分路栅场效应晶体管器件。 该器件包括具有沟槽,栅电极和源电极的分离栅结构。 第一多晶硅层设置在沟槽内并连接到栅电极。 连接到源电极的第二多晶硅层,其中第一多晶硅层和第二多晶硅层是独立的。
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