Arrangement for measuring the pulse transmission spectrum of x-ray quanta elastically scattered in a scanning area for containers
    101.
    发明授权
    Arrangement for measuring the pulse transmission spectrum of x-ray quanta elastically scattered in a scanning area for containers 有权
    用于测量在容器的扫描区域中弹性散射的x射线量子的脉冲透射光谱的布置

    公开(公告)号:US06693988B2

    公开(公告)日:2004-02-17

    申请号:US10099866

    申请日:2002-03-14

    Inventor: Geoffrey Harding

    CPC classification number: G01V5/0025 G01N23/201

    Abstract: A baggage inspection device based on coherent x-ray scatter has an x-ray source on one side of the scanning area and detectors on the other side of the scanning area. The detectors measure the energy of the scattered x-ray quanta. A primary ray collimator is arranged between scanning area and x-ray source. A secondary ray collimator for scattered rays is arranged between scanning area and detectors. The detectors are positioned on a Z axis forming an axis of symmetry for the secondary ray collimator. A point 0 on the Z axis forms the origin of a Cartesian coordinate system. The primary ray collimator allows passage only of x-ray beams impinging on the point 0. The x-ray source has an extended anode with a focus position controlled electronically about the anode length. Primary ray collimator and x-ray source extend cylindrically symmetrically about the symmetry axis or parallel to the Y axis in the X-Y plane.

    Abstract translation: 基于相干X射线散射的行李检查装置在扫描区域的一侧具有x射线源,在扫描区域的另一侧具有检测器。 检测器测量散射x射线量子的能量。 主扫描准直仪布置在扫描区域和X射线源之间。 用于散射光线的二次射线准直器布置在扫描区域和检测器之间。 检测器位于Z轴上,形成二次射线准直仪的对称轴。 Z轴上的点0形成笛卡尔坐标系的原点。 主射线准直器仅允许穿过点0的X射线束通过.X射线源具有延伸的阳极,焦点位置以电子方式围绕阳极长度进行控制。 主射线准直器和X射线源围绕对称轴圆柱对称地延伸或平行于X-Y平面中的Y轴延伸。

    Method of manufacturing a window transparent to electron rays, and window transparent to electron rays
    102.
    发明授权
    Method of manufacturing a window transparent to electron rays, and window transparent to electron rays 失效
    制造对电子射线透明的窗口的方法,以及对电子射线透明的窗口

    公开(公告)号:US06580781B2

    公开(公告)日:2003-06-17

    申请号:US09973310

    申请日:2001-10-09

    Abstract: A window transparent to electron rays is provided which includes a foil which is transparent to electron rays and an element for supporting a peripheral region of the foil in an operational state. The element is made from a material having a greater linear thermal expansion coefficient than the foil material. The window transparent includes an intermediate layer between the foil and a retaining element. The retaining element acts as a support element and consists of a material having a linear thermal expansion coefficient which is equal or similar to the linear thermal expansion coefficient of the foil material and smaller than the linear thermal expansion coefficient of the material of the retaining element over a processing temperature range. A method of manufacturing a window which is transparent to electrons and an X-ray device with a window transparent to electrons are also provided.

    Abstract translation: 提供对电子射线透明的窗口,其包括对电子线透明的箔片和用于在操作状态下支撑箔片周边区域的元件。 元件由具有比箔材料更大的线性热膨胀系数的材料制成。 透明窗包括箔和保持元件之间的中间层。 保持元件用作支撑元件,并且由具有等于或类似于箔材料的线性热膨胀系数的线性热膨胀系数并小于保持元件的材料的线性热膨胀系数的材料组成 处理温度范围。 还提供了制造对电子透明的窗口的方法和具有对电子透明的窗口的X射线装置。

    X-ray tube capable of generating and focusing beam on a target
    103.
    发明授权
    X-ray tube capable of generating and focusing beam on a target 有权
    能够在目标上产生和聚焦光束的X射线管

    公开(公告)号:US06359968B1

    公开(公告)日:2002-03-19

    申请号:US09501895

    申请日:2000-02-10

    Inventor: Geoffrey Harding

    CPC classification number: H01J35/14 H01J35/08 H01J2235/082

    Abstract: The invention relates to an X-ray tube which includes a device for generating and focusing an electron beam on a target material. In order to avoid the problems of inadmissible heating of the anode while attempting to increase the electron beam density, according to the invention a gaseous target material contained in a chamber is used to generate the X-rays; this target material can be heated to a substantially higher temperature without the anode being damaged.

    Abstract translation: 本发明涉及一种X射线管,其包括用于在目标材料上产生和聚焦电子束的装置。 为了避免在试图增加电子束密度的同时加热阳极的问题,根据本发明,使用包含在腔室中的气态靶材料来产生X射线; 该目标材料可以被加热到相当高的温度,而不会损坏阳极。

    Device for forming an X-ray or gamma beam of small cross-section and
variable direction
    104.
    发明授权
    Device for forming an X-ray or gamma beam of small cross-section and variable direction 失效
    用于形成小横截面和可变方向的X射线或γ射线的装置

    公开(公告)号:US4995066A

    公开(公告)日:1991-02-19

    申请号:US400188

    申请日:1989-08-29

    CPC classification number: A61B6/06 G21K1/04 G21K1/043

    Abstract: A device for forming an X-ray beam or gamma beam (11) having a small cross-section and a variable direction, includes an X-ray source or gamma source (1) which supplies an X-ray beam and a diaphragm device which forms the X-ray beam from the radiation beam. The diaphragm device has a stationary diaphragm section (7) provided with a rectilinear slit (8) and a cylindrical first diaphragm body (3) which rotates about an axis of rotation (5) and which is provided with a helical slit (9) on its outer surface. In order to reduce the expenditure for manufacturing a device which is also suitable for different distances between the radiation source and the axis of rotation, the diaphragm body (3) has an at least approximately semi-circular cross-section over at least a part of its length.

    Abstract translation: 用于形成具有小横截面和可变方向的X射线束或伽马射线束(11)的装置包括:X射线源或伽马源(1),其供应X射线束和隔膜装置, 从辐射束形成X射线束。 隔膜装置具有设置有直线狭缝(8)和围绕旋转轴线(5)旋转的圆柱形第一隔膜体(3)的固定隔膜部分(7),并且在其上设置有螺旋狭缝(9) 其外表面。 为了减少用于制造也适用于辐射源与旋转轴线之间的不同距离的装置的支出,隔膜体(3)在至少一部分的至少一部分上具有至少大致半圆形的横截面 它的长度。

    X-ray apparatus
    105.
    发明授权
    X-ray apparatus 失效
    X光装置

    公开(公告)号:US4896342A

    公开(公告)日:1990-01-23

    申请号:US173693

    申请日:1988-03-25

    Inventor: Geoffrey Harding

    CPC classification number: A61B6/483 G01N23/20083 A61B6/037 A61B6/4258

    Abstract: The invention relates to an X-ray apparatus, comprising an essentially monochromatic radiation source which irradiates an examination zone in different positions by means of a primary beam having a small cross-section, a first position-sensitive detector device which measures, on the other side of the examination zone, the radiation elastically scattered in the primary beam, and means for reconstructing an image of the irradiated cross-section. Assignment of an X-ray quantum is realized in that the first detector device is constructed so that it measures essentially the energy loss of the X-ray quanta incurred therein due to Compton scattering, there also being provided a second position-sensitive detector device, and a coincidence device which determines the coincidence of the signals of the two detector devices, the reconstruction means being constructed so that, in the case of coincidence of the detector output signals, the path of the X-ray quantum causing these signals is determined and therefrom, and from the energy loss measured in the first detector device, the position of the scatter point on the primary beam is determined.

    Abstract translation: 本发明涉及一种X射线设备,其包括基本上单色的辐射源,其通过具有小横截面的主光束在不同位置照射检查区域,第一位置敏感检测器装置在另一方面测量 检查区的侧面,主光束中弹性散射的辐射,以及用于重建照射的横截面的图像的装置。 实现X射线量子的分配是因为第一检测器装置被构造成使得其基本上测量由于康普顿散射而在其中引起的X射线量子的能量损失,还提供了第二位置敏感检测器装置, 以及确定两个检测器装置的信号一致的符合装置,重建装置被构造成使得在检测器输出信号一致的情况下确定导致这些信号的X射线量子的路径, 并且根据在第一检测器装置中测量的能量损失,确定主光束上的散射点的位置。

    Device for examining a body by means of penetrating radiation
    106.
    发明授权
    Device for examining a body by means of penetrating radiation 失效
    通过穿透辐射检查身体的装置

    公开(公告)号:US4258256A

    公开(公告)日:1981-03-24

    申请号:US971769

    申请日:1978-12-21

    Inventor: Geoffrey Harding

    CPC classification number: A61B6/483 A61B6/06 G21K1/025 A61B6/4291

    Abstract: A body is irradiated by a primary radiation beam; the scattered radiation produced thereby is incident on a detector device consisting of a plurality of detectors and is a measure for the density distribution of materials in the primary beam. However, this gives rise to multiple scattered radiation which disturbs the measurement. The present invention provides a device in which disturbance by multiple scattered radiation is greatly reduced, without any significant effect on the scattered radiation originating from the primary beam. A device in accordance with the invention is provided with flat laminations which are arranged between the primary beam and the detector device and which are aligned with the primary beam in a fan of flat planes.

    Abstract translation: 身体被一次辐射束照射; 由此产生的散射辐射入射在由多个检测器组成的检测器装置上,并且是一次束中的材料的密度分布的度量。 然而,这引起了干扰测量的多个散射辐射。 本发明提供了一种能够大幅降低由多个散射辐射引起的干扰的装置,而对源自一次波束的散射辐射没有任何显着影响。 根据本发明的装置设置有扁平叠片,其布置在主光束和检测器装置之间,并且与平面的扇形中的主光束对准。

    Method and system for deriving molecular interference functions from XRD profiles
    107.
    发明授权
    Method and system for deriving molecular interference functions from XRD profiles 有权
    从XRD剖面得出分子干涉函数的方法和系统

    公开(公告)号:US08582718B2

    公开(公告)日:2013-11-12

    申请号:US12956715

    申请日:2010-11-30

    Inventor: Geoffrey Harding

    Abstract: A method for identifying a substance includes determining a first molecular interference function (MIF) for a first substance. The method also includes determining a second MIF for a second substance. The method further includes generating a residual MIF at least partially based on a comparison of the second MIF to the first MIF. The method also includes identifying the type of substance based on the residual MIF.

    Abstract translation: 用于鉴定物质的方法包括确定第一物质的第一分子干涉功能(MIF)。 该方法还包括确定第二物质的第二MIF。 该方法还包括至少部分地基于第二MIF与第一MIF的比较来产生残余MIF。 该方法还包括基于剩余的MIF来识别物质的类型。

    SYSTEM AND METHOD FOR CORRECTING X-RAY DIFFRACTION PROFILES
    108.
    发明申请
    SYSTEM AND METHOD FOR CORRECTING X-RAY DIFFRACTION PROFILES 有权
    用于校正X射线衍射轮廓的系统和方法

    公开(公告)号:US20120263275A1

    公开(公告)日:2012-10-18

    申请号:US13087191

    申请日:2011-04-14

    CPC classification number: G01N23/20

    Abstract: A method for correcting an X-ray diffraction (XRD) profile measured by an X-ray diffraction imaging (XDi) system is provided. The XDi system includes an anode, a detector, and a control system. The method includes obtaining an emission spectrum of the anode using the control system. The emission spectrum includes spectral structures. The method further includes calculating a piecewise spectral-correction function using the spectral structures in the emission spectrum, obtaining a measured spectrum of an object, and applying the spectral-correction function to the measured spectrum to generate a spectrally-corrected measured spectrum.

    Abstract translation: 提供了通过X射线衍射成像(XDi)系统测量的用于校正X射线衍射(XRD)轮廓的方法。 XDi系统包括阳极,检测器和控制系统。 该方法包括使用控制系统获得阳极的发射光谱。 发射光谱包括光谱结构。 该方法还包括使用发射光谱中的光谱结构计算分段光谱校正函数,获得物体的测量光谱,以及将光谱校正函数应用于所测量的光谱以产生光谱校正的测量光谱。

    OBJECT IMAGING SYSTEM AND X-RAY DIFFRACTION IMAGING DEVICE FOR A SECURITY SYSTEM
    109.
    发明申请
    OBJECT IMAGING SYSTEM AND X-RAY DIFFRACTION IMAGING DEVICE FOR A SECURITY SYSTEM 审中-公开
    对象成像系统和用于安全系统的X射线衍射成像装置

    公开(公告)号:US20120177182A1

    公开(公告)日:2012-07-12

    申请号:US13004982

    申请日:2011-01-12

    CPC classification number: G01N23/04 G01V5/0025

    Abstract: An x-ray diffraction imaging (XDI) device includes at least one x-ray source configured to emit an x-ray fan-beam. The XDI device also includes a primary collimator positioned downstream of the at least one x-ray source. The primary collimator defines a plurality of rows of slits. Each slit and each row of slits is separated by an x-ray absorbing material. Each of the rows of slits oriented to transmit at least one x-ray slit-beam in a plane substantially orthogonal to the primary collimator.

    Abstract translation: x射线衍射成像(XDI)装置包括被配置为发射x射线扇形束的至少一个x射线源。 XDI设备还包括位于至少一个x射线源下游的主准直器。 主准直器限定多排狭缝。 每个狭缝和每排狭缝被X射线吸收材料分开。 每排行狭缝被定向成在与主准直仪基本正交的平面中透射至少一个X射线狭缝光束。

    METHOD AND SYSTEM FOR PERFORMING MATERIALS ANALYSIS WITH REFLECTED INELASTIC SCATTER
    110.
    发明申请
    METHOD AND SYSTEM FOR PERFORMING MATERIALS ANALYSIS WITH REFLECTED INELASTIC SCATTER 失效
    用反射式激光散射器进行材料分析的方法和系统

    公开(公告)号:US20110081003A1

    公开(公告)日:2011-04-07

    申请号:US12572934

    申请日:2009-10-02

    Inventor: Geoffrey Harding

    CPC classification number: G01N23/20066

    Abstract: A method for performing materials analysis of an object using an X-ray system includes generating an X-ray beam using an X-ray source having an anode and acquiring a scatter spectrum from Compton scatter produced when the X-ray beam interacts with the object. The scatter spectrum is acquired using an energy resolving detector. A Compton profile is extracted from the scatter spectrum by processing the scatter spectrum using a control system of the X-ray system. The Compton profile includes peaks at characteristic lines of the anode. The method further includes identifying a characteristic of a material of the object using the Compton profile, and outputting an indication of the characteristic of the material.

    Abstract translation: 使用X射线系统对物体进行材料分析的方法包括使用具有阳极的X射线源生成X射线束,并且当X射线束与物体相互作用时获得由康普顿散射产生的散射光谱 。 使用能量分辨检测器获取散射光谱。 通过使用X射线系统的控制系统处理散射光谱从散射光谱中提取康普顿谱。 康普顿曲线包括阳极特征线上的峰。 该方法还包括使用康普顿曲线识别对象的材料的特征,并输出材料的特征的指示。

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