Abstract:
A baggage inspection device based on coherent x-ray scatter has an x-ray source on one side of the scanning area and detectors on the other side of the scanning area. The detectors measure the energy of the scattered x-ray quanta. A primary ray collimator is arranged between scanning area and x-ray source. A secondary ray collimator for scattered rays is arranged between scanning area and detectors. The detectors are positioned on a Z axis forming an axis of symmetry for the secondary ray collimator. A point 0 on the Z axis forms the origin of a Cartesian coordinate system. The primary ray collimator allows passage only of x-ray beams impinging on the point 0. The x-ray source has an extended anode with a focus position controlled electronically about the anode length. Primary ray collimator and x-ray source extend cylindrically symmetrically about the symmetry axis or parallel to the Y axis in the X-Y plane.
Abstract:
A window transparent to electron rays is provided which includes a foil which is transparent to electron rays and an element for supporting a peripheral region of the foil in an operational state. The element is made from a material having a greater linear thermal expansion coefficient than the foil material. The window transparent includes an intermediate layer between the foil and a retaining element. The retaining element acts as a support element and consists of a material having a linear thermal expansion coefficient which is equal or similar to the linear thermal expansion coefficient of the foil material and smaller than the linear thermal expansion coefficient of the material of the retaining element over a processing temperature range. A method of manufacturing a window which is transparent to electrons and an X-ray device with a window transparent to electrons are also provided.
Abstract:
The invention relates to an X-ray tube which includes a device for generating and focusing an electron beam on a target material. In order to avoid the problems of inadmissible heating of the anode while attempting to increase the electron beam density, according to the invention a gaseous target material contained in a chamber is used to generate the X-rays; this target material can be heated to a substantially higher temperature without the anode being damaged.
Abstract:
A device for forming an X-ray beam or gamma beam (11) having a small cross-section and a variable direction, includes an X-ray source or gamma source (1) which supplies an X-ray beam and a diaphragm device which forms the X-ray beam from the radiation beam. The diaphragm device has a stationary diaphragm section (7) provided with a rectilinear slit (8) and a cylindrical first diaphragm body (3) which rotates about an axis of rotation (5) and which is provided with a helical slit (9) on its outer surface. In order to reduce the expenditure for manufacturing a device which is also suitable for different distances between the radiation source and the axis of rotation, the diaphragm body (3) has an at least approximately semi-circular cross-section over at least a part of its length.
Abstract:
The invention relates to an X-ray apparatus, comprising an essentially monochromatic radiation source which irradiates an examination zone in different positions by means of a primary beam having a small cross-section, a first position-sensitive detector device which measures, on the other side of the examination zone, the radiation elastically scattered in the primary beam, and means for reconstructing an image of the irradiated cross-section. Assignment of an X-ray quantum is realized in that the first detector device is constructed so that it measures essentially the energy loss of the X-ray quanta incurred therein due to Compton scattering, there also being provided a second position-sensitive detector device, and a coincidence device which determines the coincidence of the signals of the two detector devices, the reconstruction means being constructed so that, in the case of coincidence of the detector output signals, the path of the X-ray quantum causing these signals is determined and therefrom, and from the energy loss measured in the first detector device, the position of the scatter point on the primary beam is determined.
Abstract:
A body is irradiated by a primary radiation beam; the scattered radiation produced thereby is incident on a detector device consisting of a plurality of detectors and is a measure for the density distribution of materials in the primary beam. However, this gives rise to multiple scattered radiation which disturbs the measurement. The present invention provides a device in which disturbance by multiple scattered radiation is greatly reduced, without any significant effect on the scattered radiation originating from the primary beam. A device in accordance with the invention is provided with flat laminations which are arranged between the primary beam and the detector device and which are aligned with the primary beam in a fan of flat planes.
Abstract:
A method for identifying a substance includes determining a first molecular interference function (MIF) for a first substance. The method also includes determining a second MIF for a second substance. The method further includes generating a residual MIF at least partially based on a comparison of the second MIF to the first MIF. The method also includes identifying the type of substance based on the residual MIF.
Abstract:
A method for correcting an X-ray diffraction (XRD) profile measured by an X-ray diffraction imaging (XDi) system is provided. The XDi system includes an anode, a detector, and a control system. The method includes obtaining an emission spectrum of the anode using the control system. The emission spectrum includes spectral structures. The method further includes calculating a piecewise spectral-correction function using the spectral structures in the emission spectrum, obtaining a measured spectrum of an object, and applying the spectral-correction function to the measured spectrum to generate a spectrally-corrected measured spectrum.
Abstract:
An x-ray diffraction imaging (XDI) device includes at least one x-ray source configured to emit an x-ray fan-beam. The XDI device also includes a primary collimator positioned downstream of the at least one x-ray source. The primary collimator defines a plurality of rows of slits. Each slit and each row of slits is separated by an x-ray absorbing material. Each of the rows of slits oriented to transmit at least one x-ray slit-beam in a plane substantially orthogonal to the primary collimator.
Abstract:
A method for performing materials analysis of an object using an X-ray system includes generating an X-ray beam using an X-ray source having an anode and acquiring a scatter spectrum from Compton scatter produced when the X-ray beam interacts with the object. The scatter spectrum is acquired using an energy resolving detector. A Compton profile is extracted from the scatter spectrum by processing the scatter spectrum using a control system of the X-ray system. The Compton profile includes peaks at characteristic lines of the anode. The method further includes identifying a characteristic of a material of the object using the Compton profile, and outputting an indication of the characteristic of the material.