MULTIPLE PLANE MULTI-INVERSE FAN-BEAM DETECTION SYSTEMS AND METHOD FOR USING THE SAME
    1.
    发明申请
    MULTIPLE PLANE MULTI-INVERSE FAN-BEAM DETECTION SYSTEMS AND METHOD FOR USING THE SAME 审中-公开
    多平面多反射扇形光束检测系统及其使用方法

    公开(公告)号:US20110188632A1

    公开(公告)日:2011-08-04

    申请号:US12699528

    申请日:2010-02-03

    CPC classification number: G21K1/025 G01V5/0016 G01V5/0025

    Abstract: A detection system includes a multi-focus radiation source configured to generate X-ray radiation and a primary collimator defining a first row of apertures and a second row of apertures. The first row of apertures forms first X-ray beams within a first plane from the X-ray radiation, and the second row of apertures forms second X-ray beams within a second plane from the X-ray radiation. The first plane is different than the second plane. The detection system further includes a scatter detector including a first row of scatter detector elements and a second row of scatter detector elements. The first row of scatter detector elements is configured to detect scattered radiation from the first X-ray beams, and the second row of scatter detector elements is configured to detect scattered radiation from the second X-ray beams.

    Abstract translation: 检测系统包括被配置为产生X射线辐射的多焦点辐射源和限定第一排孔和第二排孔的主准直器。 第一排孔从X射线辐射在第一平面内形成第一X射线束,并且第二排孔从X射线辐射在第二平面内形成第二X射线束。 第一个平面与第二个平面不同。 检测系统还包括散射检测器,其包括第一排散射检测器元件和第二排散射检测器元件。 第一排散射检测器元件被配置为检测来自第一X射线束的散射辐射,并且第二排散射检测器元件被配置为检测来自第二X射线束的散射辐射。

    X-RAY DIFFRACTION DEVICES AND METHOD FOR ASSEMBLING AN OBJECT IMAGING SYSTEM
    2.
    发明申请
    X-RAY DIFFRACTION DEVICES AND METHOD FOR ASSEMBLING AN OBJECT IMAGING SYSTEM 审中-公开
    X射线衍射装置和组装对象成像系统的方法

    公开(公告)号:US20110064197A1

    公开(公告)日:2011-03-17

    申请号:US12561117

    申请日:2009-09-16

    CPC classification number: G01N23/20008

    Abstract: A multiple-plane X-ray diffraction imaging (XDI) device for generating an X-ray diffraction (XRD) profile of an object is described. The XDI device includes an X-ray source configured to generate X-rays and a first primary collimator configured to generate a first primary X-ray fan-beam. The XDI device also includes a second primary collimator configured to generate a second primary X-ray fan-beam. The XDI device also includes a first scatter detector array configured to detect a first set of scattered radiation generated upon intersection of the first primary X-ray fan-beam with the object, and a second scatter detector array configured to detect a second set of scattered radiation generated upon intersection of the second primary X-ray fan-beam with the object.

    Abstract translation: 描述用于产生物体的X射线衍射(XRD)轮廓的多平面X射线衍射成像(XDI)装置。 XDI装置包括被配置为产生X射线的X射线源和被配置为产生第一主X射线扇形束的第一主准直器。 XDI设备还包括被配置为产生第二主X射线扇形束的第二主准直器。 XDI设备还包括第一散射检测器阵列,其被配置为检测在与第一主X射线扇形光束与物体交叉时产生的第一组散射辐射,以及第二散射检测器阵列,被配置为检测第二组散射 在第二主X射线扇形光束与物体相交时产生的辐射。

    Primary collimator and systems for x-ray diffraction imaging, and method for fabricating a primary collimator
    3.
    发明授权
    Primary collimator and systems for x-ray diffraction imaging, and method for fabricating a primary collimator 有权
    用于X射线衍射成像的主准直器和系统以及用于制造主准直器的方法

    公开(公告)号:US07787591B2

    公开(公告)日:2010-08-31

    申请号:US12325527

    申请日:2008-12-01

    CPC classification number: G21K1/025 G01V5/00

    Abstract: A primary collimator for a multiple inverse fan beam x-ray diffraction imaging (MIFB XDI) system. The MIFB XDI system includes a multi-focus x-ray source (MFXS) defining a plurality of focus points arranged along a length of the MFXS. Each focus point is sequentially activated to emit an x-ray fan beam including a plurality of primary beams each directed to a corresponding convergence point. The primary collimator includes a first diaphragm configured to be positioned with respect to the MFXS. The first diaphragm defines a plurality of first channels through a thickness of the first diaphragm. Each first channel is aligned with a corresponding focus point and configured to transmit the x-ray fan beam. A second diaphragm is positioned with respect to the first diaphragm and defines a plurality of second channels through a thickness of the second diaphragm. Each second channel is axially aligned with a corresponding first channel.

    Abstract translation: 用于多反向风扇束x射线衍射成像(MIFB XDI)系统的主准直器。 MIFB XDI系统包括定义沿着MFXS的长度布置的多个聚焦点的多焦点X射线源(MFXS)。 顺序地激活每个对焦点以发射包括多个主光束的x射线扇形束,每个主光束指向相应的会聚点。 主准直器包括构造成相对于MFXS定位的第一隔膜。 第一隔膜通过第一隔膜的厚度限定多个第一通道。 每个第一通道与对应的焦点对准,并且被配置成透射x射线扇形束。 第二隔膜相对于第一隔膜定位,并且通过第二隔膜的厚度限定多个第二通道。 每个第二通道与对应的第一通道轴向对准。

    Compact multi-focus x-ray source, x-ray diffraction imaging system, and method for fabricating compact multi-focus x-ray source
    4.
    发明授权
    Compact multi-focus x-ray source, x-ray diffraction imaging system, and method for fabricating compact multi-focus x-ray source 有权
    紧凑型多焦点x射线源,x射线衍射成像系统和制造紧凑型多焦点x射线源的方法

    公开(公告)号:US07756249B1

    公开(公告)日:2010-07-13

    申请号:US12388907

    申请日:2009-02-19

    Inventor: Geoffrey Harding

    CPC classification number: H01J35/02

    Abstract: A multi-focus x-ray source (MFXS) for a multiple inverse fan beam x-ray diffraction imaging (MIFB XDI) system. The MFXS includes a plurality of focus points (N) defined along a length of the MFXS collinear with the y-axis. The MFXS is configured to generate the plurality of primary beams, and at least M coherent x-ray scatter detectors are configured to detect coherent scatter rays from the primary beams as the primary beams propagate through a section of the object positioned within the examination area when a spacing P between adjacent coherent x-ray scatter detectors satisfies the equation: P = W s · V M · U , where Ws is a lateral extent of the plurality of focus points, U is a distance from the y-axis to a top surface of the examination area, and V is a distance from the top surface to the line at the coordinate X=L.

    Abstract translation: 用于多重反向风扇束x射线衍射成像(MIFB XDI)系统的多焦点x射线源(MFXS)。 MFXS包括沿着与y轴共线的MFXS的长度限定的多个聚焦点(N)。 MFXS被配置为产生多个主光束,并且至少M个相干X射线散射检测器被配置为当主光束传播通过位于检查区域内的物体的一部分时检测来自主光束的相干散射光线,当 相邻相干X射线散射探测器之间的间距P满足下式:P = W s·VM·U,其中Ws是多个聚焦点的横向范围,U是从y轴到顶面的距离 并且V是在坐标X = L处从顶面到线的距离。

    Systems and methods for developing a secondary collimator
    5.
    发明授权
    Systems and methods for developing a secondary collimator 失效
    用于开发二次准直仪的系统和方法

    公开(公告)号:US07702073B2

    公开(公告)日:2010-04-20

    申请号:US11531019

    申请日:2006-09-12

    Inventor: Geoffrey Harding

    CPC classification number: G21K1/025

    Abstract: A method for developing a secondary collimator is described. The method includes orienting a plurality of collimator elements in a plane such that a gap is defined between a first collimator element and a second collimator element. The first collimator element has a first curved end, and the first curved end faces the second collimator element across the gap.

    Abstract translation: 描述了用于形成二次准直仪的方法。 该方法包括将多个准直器元件定向在平面中,使得在第一准直器元件和第二准直器元件之间限定间隙。 第一准直器元件具有第一弯曲端,并且第一弯曲端跨越间隙面向第二准直器元件。

    XRD-BASED FALSE ALARM RESOLUTION IN MEGAVOLTAGE COMPUTED TOMOGRAPHY SYSTEMS
    6.
    发明申请
    XRD-BASED FALSE ALARM RESOLUTION IN MEGAVOLTAGE COMPUTED TOMOGRAPHY SYSTEMS 失效
    巨噬细胞计算机图像系统中基于XRD的错误报警分辨率

    公开(公告)号:US20090323889A1

    公开(公告)日:2009-12-31

    申请号:US12366844

    申请日:2009-02-06

    CPC classification number: G01V5/00 G21K1/02 G21K2207/00

    Abstract: System and method for XRD-based false alarm resolution in computed tomography (“CT”) threat detection systems. Following a scan of an object with a megavoltage CT-based threat detection system, a suspicious area in the object is identified. The three dimensional position of the suspicious area is used to determine a ray path for the XRD-based threat detection system that provides minimal X-ray attenuation. The object is then positioned for XRD scanning of the suspicious area along this determined ray path. The XRD-based threat detection system is configured to detect high density metals (“HDMs) as well as shielded Special Nuclear Materials (“SNMs”) based on cubic or non-cubic diffraction profiles.

    Abstract translation: 计算机断层扫描(“CT”)威胁检测系统中基于XRD的误报警解决方法的系统和方法。 在使用基于兆伏级CT的威胁检测系统扫描物体后,识别对象中的可疑区域。 可疑区域的三维位置用于确定提供最小X射线衰减的基于XRD的威胁检测系统的射线路径。 然后将物体定位成沿着该确定的射线路径对可疑区域进行XRD扫描。 基于XRD的威胁检测系统被配置为基于立方或非立方衍射轮廓检测高密度金属(“HDM”)以及屏蔽特殊核材料(“SNM”)。

    AUTOMATIC MATERIAL DISCRIMINATION BY USING COMPUTER TOMOGRAPHY
    7.
    发明申请
    AUTOMATIC MATERIAL DISCRIMINATION BY USING COMPUTER TOMOGRAPHY 审中-公开
    通过使用计算机测量自动材料辨别

    公开(公告)号:US20090245463A1

    公开(公告)日:2009-10-01

    申请号:US12410498

    申请日:2009-03-25

    CPC classification number: G01V5/0025 G01V5/005

    Abstract: Method and apparatus are provided for combining information obtained from CT and Coherent Scatter Computed Tomography to better determine whether there are dangerous materials in the baggage or not. Hence, the attenuation coefficient and the diffraction pattern of the item of baggage are used to determine whether the baggage should be cleared.

    Abstract translation: 提供了用于组合从CT和相干散射计算机断层摄影获得的信息以更好地确定行李中是否存在危险物质的方法和装置。 因此,行李物品的衰减系数和衍射图案用于确定行李是否应该被清除。

    Method, a processor, and a system for identifying a substance
    8.
    发明申请
    Method, a processor, and a system for identifying a substance 有权
    方法,处理器和用于识别物质的系统

    公开(公告)号:US20090168963A1

    公开(公告)日:2009-07-02

    申请号:US12005794

    申请日:2007-12-28

    Inventor: Geoffrey Harding

    CPC classification number: G01N23/207 G01N23/20083

    Abstract: A method, a processor, and a system for identifying a substance are described. The method includes identifying a substance based on a plurality of integrated intensities of a plurality of X-ray diffraction profiles.

    Abstract translation: 描述了用于识别物质的方法,处理器和系统。 该方法包括基于多个X射线衍射谱的多个积分强度来识别物质。

    METHOD, A PROCESSOR, AND A SYSTEM FOR TRACKING A FOCUS OF A BEAM
    9.
    发明申请
    METHOD, A PROCESSOR, AND A SYSTEM FOR TRACKING A FOCUS OF A BEAM 失效
    方法,处理器和用于跟踪光束聚焦的系统

    公开(公告)号:US20090168957A1

    公开(公告)日:2009-07-02

    申请号:US12006140

    申请日:2007-12-31

    Inventor: Geoffrey Harding

    CPC classification number: H05G1/52

    Abstract: A system, a processor, and a method for tracking a focus of a beam are described. The method includes determining a plurality of intensities corresponding to a plurality of voltages, and applying a first voltage of the plurality of voltages corresponding to a maximum intensity of the plurality of intensities during a scan.

    Abstract translation: 描述了用于跟踪光束的焦点的系统,处理器和方法。 该方法包括确定对应于多个电压的多个强度,以及在扫描期间施加与多个强度的最大强度相对应的多个电压的第一电压。

    Systems and methods for identifying a substance
    10.
    发明授权
    Systems and methods for identifying a substance 失效
    识别物质的系统和方法

    公开(公告)号:US07529340B2

    公开(公告)日:2009-05-05

    申请号:US11434291

    申请日:2006-05-15

    Inventor: Geoffrey Harding

    CPC classification number: G01N23/207

    Abstract: A method for iteratively identifying a substance is described. The method includes determining whether a function of a difference between an updated diffraction profile and an original diffraction profile of the substance exceeds a parameter.

    Abstract translation: 描述了用于迭代识别物质的方法。 该方法包括确定更新的衍射轮廓和物质的原始衍射轮廓之间的差异的函数是否超过参数。

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